Plasma processing apparatus and plasma processing system with reduced feeding loss, and method for stabilizing the apparatus and system
    81.
    发明授权
    Plasma processing apparatus and plasma processing system with reduced feeding loss, and method for stabilizing the apparatus and system 有权
    等离子体处理装置和等离子体处理系统,减少进料损耗,以及稳定装置和系统的方法

    公开(公告)号:US06899787B2

    公开(公告)日:2005-05-31

    申请号:US10173340

    申请日:2002-06-14

    CPC分类号: H01J37/32082 H01J37/32183

    摘要: A plasma processing unit has two electrodes for exciting a plasma, a plasma processing chamber, an RF generator, a matching circuit for performing impedance matching between the plasma processing chamber and the RF generator, a feeder that connects an output terminal of the matching circuit to one of the electrode, and a supplier that connects the RF generator to an input terminal of the matching circuit. The feeder is arranged to decrease the average density per unit volume of the RF power supplied from the RF generator as the RF power flows from the output terminal of the matching circuit to the electrode. The section of the plasma processing unit that is DC-grounded has a surface provided with a low-resistance portion. The supplier or the feeder is fixed on a floor using RF impedance adjustors so as to prevent the RF impedance therein from changing.

    摘要翻译: 等离子体处理单元具有用于激发等离子体的两个电极,等离子体处理室,RF发生器,用于在等离子体处理室和RF发生器之间执行阻抗匹配的匹配电路,将匹配电路的输出端连接到 电极之一和将RF发生器连接到匹配电路的输入端的供应商。 馈送器布置成当RF功率从匹配电路的输出端流向电极时,降低从RF发生器提供的RF功率的每单位体积的平均密度。 直流接地的等离子体处理单元的部分具有设置有低电阻部分的表面。 供应商或馈线使用RF阻抗调节器固定在地板上,以防止其中的RF阻抗发生变化。

    Substrate processing method and substrate processing apparatus
    84.
    发明申请
    Substrate processing method and substrate processing apparatus 失效
    基板处理方法和基板处理装置

    公开(公告)号:US20050042869A1

    公开(公告)日:2005-02-24

    申请号:US10467820

    申请日:2002-12-10

    摘要: In a substrate processing apparatus, a control electrode (131) separates a process space (11C) including a substrate to be processed and a plasma formation space (11B) not including the substrate. The control electrode includes a conductive member formed in a processing vessel and having a plurality of apertures (131a) for passing plasma. A surface of the control electrode is covered by an aluminum oxide or a conductive nitride. In the substrate processing apparatus, a gas containing He and N2 is supplied into the processing vessel. In the plasma formation space, there is formed plasma under a condition in which atomic state nitrogen N* are excited. The atomic state nitrogen N* are used to nitride a surface of the substrate.

    摘要翻译: 在衬底处理设备中,控制电极(131)分离包括待处理衬底和不包括衬底的等离子体形成空间(11B)的工艺空间(11C)。 控制电极包括形成在处理容器中并具有用于通过等离子体的多个孔(131a)的导电构件。 控制电极的表面被氧化铝或导电氮化物覆盖。 在基板处理装置中,将含有He和N2的气体供给到处理容器中。 在等离子体形成空间中,在原子态氮N *被激发的条件下形成等离子体。 原子态氮N *用于氮化衬底的表面。

    Plasma processing apparatus including a plurality of plasma processing units having reduced variation
    85.
    发明申请
    Plasma processing apparatus including a plurality of plasma processing units having reduced variation 有权
    等离子体处理装置包括具有减小的变化的多个等离子体处理单元

    公开(公告)号:US20050000440A1

    公开(公告)日:2005-01-06

    申请号:US10811034

    申请日:2004-08-27

    摘要: A plasma processing apparatus comprising a plurality of plasma processing units is provided. Each of the plasma processing units has a matching circuit connected between a radiofrequency generator and a plasma excitation electrode. Among these plasma processing units, a variation between the maximum and minimum values of input-terminal-side AC resistances RA of the matching circuits defined by =(RAmax−RAmin)/(RAmax+RAmin) is adjusted to be less than 0.5. A variation between the maximum and minimum values of output-terminal-side AC resistances RB of the matching circuits defined by =(RBmax−RBmin)./(RBmax+RBmin) is also adjusted to be less than 0.5. The plasma processing units can be adjusted to achieve substantially uniform plasma results in a shorter period of time.

    摘要翻译: 提供包括多个等离子体处理单元的等离子体处理装置。 每个等离子体处理单元具有连接在射频发生器和等离子体激励电极之间的匹配电路。 在这些等离子体处理单元中,由RA> =(RAmax-RAmin)/(RAmax + RAmin)定义的匹配电路的输入端侧AC电阻RA的最大值和最小值之间的变化值RA被调整为 小于0.5。 由 =(RBmax-RBmin)./(RBmax + RBmin)定义的匹配电路的输出端侧AC电阻RB的最大值和最小值之间的变化也被调整为小于0.5。 可以调节等离子体处理单元以在更短的时间内实现基本均匀的等离子体结果。

    Process for producing optical article
    88.
    发明授权
    Process for producing optical article 有权
    光学制品生产工艺

    公开(公告)号:US06726814B2

    公开(公告)日:2004-04-27

    申请号:US10056092

    申请日:2002-01-28

    IPC分类号: C23C1434

    摘要: A process for producing an optical article includes laminating a first optically transparent thin layer and a second optically transparent thin layer having a higher refractive index than that of the first optically transparent thin layer on a surface of a substrate. At least one of the first and second optically transparent thin layers is deposited by sputtering using a sputtering gas comprising atoms of at least one selected from the group consisting of krypton, xenon and radon.

    摘要翻译: 一种光学制品的制造方法,包括在基板的表面上层叠第一光学透明薄膜和具有比第一光学透明薄层的折射率高的折射率的第二光学透明薄层。 使用包含选自氪,氙和氡中的至少一种的原子的溅射气体通过溅射沉积第一和第二光学透明薄层中的至少一个。

    Performance evaluation method for plasma processing apparatus
    89.
    发明授权
    Performance evaluation method for plasma processing apparatus 有权
    等离子体仪器的性能评估方法

    公开(公告)号:US06701202B2

    公开(公告)日:2004-03-02

    申请号:US10033443

    申请日:2001-11-02

    IPC分类号: G06F1900

    摘要: A plasma processing apparatus has a plasma processing chamber having a plasma excitation electrode, a radiofrequency generator connected to the plasma excitation electrode, and a matching circuit for matching the impedance between the plasma processing chamber and the radiofrequency generator. The loss capacitance CX1 at a later time t1 after delivery is measured between the plasma excitation electrode and ground potential positions which are grounded. The performance is evaluated by whether or not the loss capacitance CX1 is less than 26 times the plasma electrode capacitance Ce1 at the later time t1 between the plasma excitation electrode and a counter electrode which cooperate with each other.

    摘要翻译: 等离子体处理装置具有等离子体处理室,其具有等离子体激励电极,与等离子体激励电极连接的射频发生器,以及用于匹配等离子体处理室与射频发生器之间的阻抗的匹配电路。 在等离子体激发电极和接地的地电势位置之间测量输送之后的t1时刻的损耗电容CX1。 通过在等离子体激励电极和相互配合的对置电极之间的稍后时间t1,损耗电容CX1是否小于等离子体电极电容Ce1的26倍来评估性能。

    Excimer laser oscillation apparatus and method, excimer laser exposure apparatus, and laser tube
    90.
    发明授权
    Excimer laser oscillation apparatus and method, excimer laser exposure apparatus, and laser tube 有权
    准分子激光振荡装置和方法,准分子激光曝光装置和激光管

    公开(公告)号:US06690702B1

    公开(公告)日:2004-02-10

    申请号:US09528183

    申请日:2000-03-17

    IPC分类号: H01S304

    摘要: In an excimer laser oscillation apparatus including a laser chamber (20) constituted by a laser tube (2) for storing a laser gas containing a gas mixture of at least one inert gas selected from the group consisting of Kr, Ar, and Ne, He and F2 gas, and an optical resonator consisting of a pair of reflection mirrors (5, 6) arranged to sandwich the laser chamber (20) therebetween, the inner surface of the laser chamber (20) for storing the laser gas has a reflection-free surface with respect to light of a desired wavelength of 248 nm, 193 nm, or 157 nm, and the uppermost surface of the inner surface consists of a fluoride, and a means (waveguide 1) for introducing a microwave for exciting the laser gas in the laser chamber (20) is prepared. With this arrangement, an excimer laser oscillation apparatus, an oscillation method, and an exposure apparatus can be provided, which can reduce the load on the lens material and its surface, can simplify the mirror or laser scanning control system, and are satisfactorily used in mass production since the service life of an excimer laser can be sufficiently prolonged.

    摘要翻译: 在包括由激光管(2)构成的激光室(20)的准分子激光振荡装置中,所述激光管(2)用于存储含有选自Kr,Ar和Ne的至少一种惰性气体的气体混合物的激光气体,He 和F2气体,以及由设置成将激光室(20)夹在其间的一对反射镜(5,6)构成的光谐振器,用于存储激光气体的激光室(20)的内表面具有反射 - 相对于248nm,193nm或157nm的所需波长的光的自由表面,并且内表面的最上表面由氟化物组成,并且用于引入微波激励激光气体的装置(波导1) 在激光室(20)中。 通过这种布置,可以提供准分子激光振荡装置,振荡方法和曝光装置,其可以减少透镜材料及其表面上的负载,可以简化镜子或激光扫描控制系统,并且令人满意地使用 由于准分子激光器的使用寿命可以充分延长,因此大量生产。