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    SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING A SEMICONDUCTOR STRUCTURE
    3.
    发明申请
    SEMICONDUCTOR STRUCTURE AND METHOD FOR MANUFACTURING A SEMICONDUCTOR STRUCTURE 有权
    用于制造半导体结构的半导体结构和方法

    公开(公告)号：US20150364648A1

    公开(公告)日：2015-12-17

    申请号：US14762660

    申请日：2014-01-21

    申请人： COMMISSARIAT A L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVES

    发明人： David VAUFREY

    IPC分类号： H01L33/24 ,  H01L33/00 ,  H01L33/08 ,  H01L33/14 ,  H01L33/06

    CPC分类号： H01L33/24 ,  H01L33/0025 ,  H01L33/0075 ,  H01L33/06 ,  H01L33/08 ,  H01L33/14 ,  H01L33/145 ,  H01L2924/0002 ,  H01L2924/00

    摘要： A semiconducting structure configured to emit electromagnetic radiation. The structure includes a first zone and a second zone with first and second types of conductivities respectively opposite to each other, the first and second zones being connected to each other to form a semiconducting junction. The first zone includes at least a first and a second part, the first and the second parts being separated from each other by an intermediate layer, as a spreading layer, extending approximately parallel to a junction plane along a major part of the junction. The spreading layer can cause spreading of carriers in the plane of the spreading layer.

    摘要翻译： 构造成发射电磁辐射的半导体结构。 该结构包括第一区和第二区，第一区和第二区具有彼此相对的第一和第二类电导率，第一和第二区彼此连接以形成半导体结。 第一区域至少包括第一部分和第二部分，第一部分和第二部分通过中间层彼此分开，作为扩展层，其大致平行于沿连接部分的主要部分的接合面延伸。 扩展层可能导致载体在扩展层的平面中的扩展。

    Method and system for determining microorganism growth
    6.
    发明授权
    Method and system for determining microorganism growth 有权

    公开(公告)号：US10407708B2

    公开(公告)日：2019-09-10

    申请号：US15529114

    申请日：2015-11-26

    申请人： bioMérieux ,  Commissariat a L'Énergie Atomique et aux Énergies Alternatives (CEA)

    发明人： Marthe Lagarrigue-Charbonnier ,  Lorène Allano ,  Marine Depecker

    IPC分类号： C12Q1/04 ,  G06K9/00 ,  G06T7/20 ,  G06T7/30 ,  G06T7/33

    摘要： Method for determining microorganism growth in a biological sample likely to contain microorganisms, said biological sample being contained in an analysis container, said analysis container being subjected to an incubation of a determined duration, said method comprising: acquiring a first plurality of initial images of the analysis container at a first acquisition time T1, before or during the incubation; acquiring a second plurality of final images of the analysis container at a second acquisition time T2, during or after the incubation; realigning each initial image of the first plurality of initial images acquired, with each corresponding final image of the second plurality of final images acquired; locating at least one potential microorganism growth zone in at least one image of the second plurality of images acquired; evaluating the content of the potential microorganism growth zone identified in order to determine the presence of microorganisms.

    Multidimensional resonant force sensor
    8.
    发明授权
    Multidimensional resonant force sensor 有权

    公开(公告)号：US10126189B2

    公开(公告)日：2018-11-13

    申请号：US15532079

    申请日：2015-11-25

    申请人： COMMISSARIAT A L'ÉNERGIE ATOMIQUE ET AUX ÉNERGIES ALTERNATIVES

    发明人： Davinson Castano Cano ,  Mathieu Grossard ,  Arnaud Hubert

    IPC分类号： G01L1/00 ,  G01L5/16 ,  G01L1/16 ,  G01L1/18

    摘要： A resonant sensor includes a proof body having a first and a second interface that can each come into contact with an external mechanical structure; two sensitive zones arranged between these two interfaces; a sensitive zone formed by a plate embedded in a frame secured mechanically to the interfaces, the plate able to resonate under the effect of local mechanical excitations produced at particular points by excitation transducers bearing the plate at several resonant frequencies, sensors picking up the resonant signals produced at the particular points, measurement means measuring the resonant frequency shifts of signals which are linear combinations of the resonant signals picked up, the shifts being a function of mechanical stresses induced by the forces and transmitted to the plate by the frame, the components of the torque of forces being determined from the resonant frequency shifts measured on the plates of the sensitive zones.