Methods and Apparatus for Package On Package Devices with Reduced Strain
    2.
    发明申请
    Methods and Apparatus for Package On Package Devices with Reduced Strain 有权
    具有减少应变的封装器件封装的方法和装置

    公开(公告)号:US20130168855A1

    公开(公告)日:2013-07-04

    申请号:US13342751

    申请日:2012-01-03

    摘要: Methods and apparatus for package on package structures. A structure includes a first integrated circuit package including at least one integrated circuit device mounted on a first substrate, a plurality of package on package connectors extending from a bottom surface and arranged in a pattern of one or more rows proximal to an outer periphery of the first substrate; and a second integrated circuit package including at least another integrated circuit device mounted on a second substrate and a plurality of lands on an upper surface coupled to the plurality of package on package connectors, and a plurality of external connectors extending from a bottom surface of the second substrate; wherein the pattern of the external connectors is staggered from the pattern of the package on package connectors so that the package on package connectors are not in vertical alignment with the external connectors. Methods for forming structures are disclosed.

    摘要翻译: 封装结构封装的方法和装置。 一种结构包括第一集成电路封装,其包括安装在第一基板上的至少一个集成电路器件,从封装连接器上的多个封装,其从底表面延伸并且以一个或多个行的图案布置, 第一底物; 以及第二集成电路封装,其包括安装在第二基板上的至少另一个集成电路器件和耦合到封装连接器上的多个封装的上表面上的多个焊盘,以及从所述第二基板的底表面延伸的多个外部连接器 第二基板; 其中外部连接器的图案与包装连接器上的包装图案交错,使得包装连接器上的包装件不与外部连接器垂直对准。 公开了形成结构的方法。

    Wafer Level Chip Scale Package with Reduced Stress on Solder Balls
    4.
    发明申请
    Wafer Level Chip Scale Package with Reduced Stress on Solder Balls 有权
    晶圆级芯片级封装,减少了焊球的应力

    公开(公告)号:US20120319270A1

    公开(公告)日:2012-12-20

    申请号:US13162394

    申请日:2011-06-16

    IPC分类号: H01L23/48

    摘要: A structure includes a metal pad over a semiconductor substrate, a passivation layer having a portion over the metal pad, and a first polyimide layer over the passivation layer, wherein the first polyimide layer has a first thickness and a first Young's modulus. A post-passivation interconnect (PPI) includes a first portion over the first polyimide layer, and a second portion extending into the passivation layer and the first polyimide layer. The PPI is electrically coupled to the metal pad. A second polyimide layer is over the PPI. The second polyimide layer has a second thickness and a second Young's modulus. At least one of a thickness ratio and a Young's modulus ratio is greater than 1.0, wherein the thickness ratio is the ratio of the first thickness to the second thickness, and the Young's modulus ratio is the ratio of the second Young's modulus to the first Young's modulus.

    摘要翻译: 一种结构包括半导体衬底上的金属焊盘,具有金属焊盘上方的一部分的钝化层以及钝化层上的第一聚酰亚胺层,其中第一聚酰亚胺层具有第一厚度和第一杨氏模量。 后钝化互连(PPI)包括在第一聚酰亚胺层之上的第一部分,以及延伸到钝化层和第一聚酰亚胺层中的第二部分。 PPI电耦合到金属垫。 第二个聚酰亚胺层位于PPI之上。 第二聚酰亚胺层具有第二厚度和第二杨氏模量。 厚度比和杨氏模量比中的至少一个大于1.0,其中厚度比是第一厚度与第二厚度的比率,杨氏模量比是第二杨氏模量与第一杨氏模量之比 模数。

    METHOD AND SYSTEM OF TESTING A SEMICONDUCTOR DEVICE
    6.
    发明申请
    METHOD AND SYSTEM OF TESTING A SEMICONDUCTOR DEVICE 有权
    测试半导体器件的方法和系统

    公开(公告)号:US20100278211A1

    公开(公告)日:2010-11-04

    申请号:US12431927

    申请日:2009-04-29

    IPC分类号: G01N3/60 H01L23/58

    摘要: The present disclosure provides a semiconductor device, the device includes a substrate, a front-end structure formed in the substrate, a back-end structure formed on the front-end structure, a heater embedded in the back-end structure and operable to generate heat, and a sensor embedded in the back-end structure and operable to sense a temperature of the semiconductor device.

    摘要翻译: 本公开提供一种半导体器件,该器件包括衬底,形成在衬底中的前端结构,形成在前端结构上的后端结构,嵌入在后端结构中的加热器,可操作以产生 热和嵌入在后端结构中的传感器,并且可操作以感测半导体器件的温度。