Apparatus and method for inspecting defects of a circuit pattern formed on a substrate using a laser and a non-contact capacitor sensor
    1.
    发明授权
    Apparatus and method for inspecting defects of a circuit pattern formed on a substrate using a laser and a non-contact capacitor sensor 失效
    使用激光和非接触式电容传感器来检查形成在基板上的电路图案的缺陷的装置和方法

    公开(公告)号:US08410465B2

    公开(公告)日:2013-04-02

    申请号:US12716948

    申请日:2010-03-03

    CPC classification number: G01R31/309

    Abstract: An apparatus for inspecting defects in a circuit pattern is described. The apparatus includes at least one laser unit for radiating a laser beam onto a first end of a circuit pattern formed on a substrate. The apparatus also includes a capacitor sensor disposed opposite a second end of the circuit pattern, which is connected to the first end of the circuit pattern through a via hole, in a non-contact manner. The apparatus also includes a voltage source connected to the capacitor sensor and configured to apply a voltage. The apparatus also includes a measurement unit connected to the capacitor sensor and configured to detect variation in impedance generated in the capacitor sensor.

    Abstract translation: 描述了用于检查电路图案中的缺陷的装置。 该装置包括用于将激光束照射到形成在基板上的电路图案的第一端上的至少一个激光单元。 该装置还包括电容传感器,该电容器传感器与电路图案的第二端相对设置,其以非接触方式通过通孔连接到电路图案的第一端。 该装置还包括连接到电容器传感器并被配置为施加电压的电压源。 该装置还包括连接到电容器传感器并被配置为检测在电容器传感器中产生的阻抗变化的测量单元。

    SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE
    6.
    发明申请
    SEMICONDUCTOR PACKAGE AND METHOD OF MANUFACTURING THE SEMICONDUCTOR PACKAGE 审中-公开
    半导体封装和制造半导体封装的方法

    公开(公告)号:US20110298103A1

    公开(公告)日:2011-12-08

    申请号:US12892411

    申请日:2010-09-28

    Abstract: A semiconductor package and a method of manufacturing the semiconductor package are disclosed. A semiconductor package in accordance with an embodiment of the present invention includes a substrate, which has a ground circuit formed thereon, a semiconductor chip, which is mounted on the substrate, a conductive first shield, which is formed on an upper surface of the semiconductor chip and connected with the ground circuit, and a conductive second shield, which covers the substrate and the semiconductor chip and is connected with the first shield. With a semiconductor package in accordance with an embodiment of the present invention, grounding is possible between semiconductor chips because a shield is also formed on an upper surface of the semiconductor chip, and the shielding property can be improved by a double shielding structure.

    Abstract translation: 公开了一种半导体封装和半导体封装的制造方法。 根据本发明的实施例的半导体封装包括其上形成有接地电路的基板,安装在基板上的半导体芯片,形成在半导体的上表面上的导电第一屏蔽 并且与接地电路连接,以及覆盖基板和半导体芯片并与第一屏蔽件连接的导电第二屏蔽件。 利用根据本发明的实施例的半导体封装,由于在半导体芯片的上表面上也形成屏蔽,所以可以在半导体芯片之间进行接地,并且可以通过双重屏蔽结构来提高屏蔽性能。

    Tape substrate having reinforcement layer for tape packages
    7.
    发明申请
    Tape substrate having reinforcement layer for tape packages 审中-公开
    胶带基材,具有用于胶带包装的加强层

    公开(公告)号:US20080063789A1

    公开(公告)日:2008-03-13

    申请号:US11980430

    申请日:2007-10-31

    Abstract: The following invention is directed to a tape substrate having a reinforcement layer for tape packages and a method of fabricating the same. In an example embodiment, a tape substrate for tape packages may include a base film, a circuit pattern formed on the base film, and at least one reinforcement layer formed over a surface of the base film. The base film may have sprocket holes formed at regular intervals in the surface of the base film along at least one outer edge of the base film. The at least one reinforcement layer may have guide holes corresponding to the sprocket holes of the base film that are larger than the sprocket holes. The example embodiment may also include at least one reinforcement being set back from the outer edge of the base film.

    Abstract translation: 以下发明涉及具有带包装用增强层的带基材及其制造方法。 在一个示例性实施例中,用于带包装的带基底可以包括基膜,形成在基膜上的电路图案,以及形成在基膜表面上的至少一个加强层。 基膜可以具有沿着基膜的至少一个外边缘在基膜的表面中以规则间隔形成的链轮孔。 所述至少一个加强层可以具有与所述基膜的链轮孔相对应的导引孔,所述引导孔大于所述链轮孔。 示例实施例还可以包括从基膜的外边缘回退的至少一个加强件。

    Tape substrate having reinforcement layer for tape packages
    8.
    发明申请
    Tape substrate having reinforcement layer for tape packages 审中-公开
    胶带基材,具有用于胶带包装的加强层

    公开(公告)号:US20070042166A1

    公开(公告)日:2007-02-22

    申请号:US11372115

    申请日:2006-03-10

    Abstract: The following invention is directed to a tape substrate having a reinforcement layer for tape packages and a method of fabricating the same. In an example embodiment, a tape substrate for tape packages may include a base film, a circuit pattern formed on the base film, and at least one reinforcement layer formed over a surface of the base film. The base film may have sprocket holes formed at regular intervals in the surface of the base film along at least one outer edge of the base film. The at least one reinforcement layer may have guide holes corresponding to the sprocket holes of the base film that are larger than the sprocket holes. The example embodiment may also include at least one reinforcement being set back from the outer edge of the base film.

    Abstract translation: 以下发明涉及具有带包装用增强层的带基材及其制造方法。 在一个示例性实施例中,用于带包装的带基底可以包括基膜,形成在基膜上的电路图案,以及形成在基膜表面上的至少一个加强层。 基膜可以具有沿着基膜的至少一个外边缘在基膜的表面中以规则间隔形成的链轮孔。 所述至少一个加强层可以具有与所述基膜的链轮孔相对应的导引孔,所述引导孔大于所述链轮孔。 示例实施例还可以包括从基膜的外边缘回退的至少一个加强件。

    3D POWER MODULE PACKAGE
    9.
    发明申请
    3D POWER MODULE PACKAGE 有权
    3D电源模块封装

    公开(公告)号:US20120162931A1

    公开(公告)日:2012-06-28

    申请号:US13177270

    申请日:2011-07-06

    Abstract: Disclosed herein is a 3D power module package, including: a power converting unit packaged to include a heat radiating substrate, a power device connected to the heat radiating substrate, and a lead frame; a controlling unit packaged to include a controlling unit substrate and IC and controlling devices mounted on an upper portion of the controlling unit substrate; and an electrical connecting unit electrically connecting the packaged power converting unit and the packaged controlling unit.

    Abstract translation: 本文公开了一种3D功率模块封装,包括:封装成包括散热基板的功率转换单元,连接到散热基板的功率器件和引线框架; 控制单元,其被封装成包括控制单元基板和IC以及安装在所述控制单元基板的上部的控制装置; 以及电连接单元,电连接所述封装的电力转换单元和所述封装的控制单元。

    APPARATUS AND METHOD FOR INSPECTING DEFECTS IN CIRCUIT PATTERN
    10.
    发明申请
    APPARATUS AND METHOD FOR INSPECTING DEFECTS IN CIRCUIT PATTERN 失效
    用于检查电路图中缺陷的装置和方法

    公开(公告)号:US20110128011A1

    公开(公告)日:2011-06-02

    申请号:US12716948

    申请日:2010-03-03

    CPC classification number: G01R31/309

    Abstract: Disclosed herein is an apparatus and method for inspecting defects in a circuit pattern. In the inspection apparatus and method, a laser beam is radiated by a laser unit onto a first end of a circuit pattern, and variation in impedance of a capacitor sensor disposed at a second end of the circuit pattern is measured, thus measuring the open/short circuits of the circuit pattern.Accordingly, the inspection apparatus and method are advantageous in that defects in the circuit pattern can be measured in a non-contact manner, so that the consumption of pin probes can be reduced, and the reliability of the measurement of defects in the circuit pattern can be improved.

    Abstract translation: 本文公开了一种用于检查电路图案中的缺陷的装置和方法。 在检查装置和方法中,通过激光单元将激光束照射到电路图案的第一端,并且测量设置在电路图案的第二端的电容器传感器的阻抗的变化,从而测量开路/ 电路图案短路。 因此,检查装置和方法的优点在于,可以以非接触的方式测量电路图案的缺陷,从而可以减少引脚探针的消耗,并且电路图案中的缺陷的测量的可靠性可以 要改进

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