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公开(公告)号:US09543024B2
公开(公告)日:2017-01-10
申请号:US13995145
申请日:2012-03-29
申请人: Hiroyuki Sanda , Kiran Pangal , Xin Guo , Kaoru Naganuma
发明人: Hiroyuki Sanda , Kiran Pangal , Xin Guo , Kaoru Naganuma
CPC分类号: G11C16/16 , G06F12/0246 , G11C11/5635 , G11C16/3445
摘要: Embodiments of the present disclosure describe methods, apparatus, and system configurations for conditional pre-programming of nonvolatile memory before erasure. In one instance, the method includes receiving a request to erase information in a portion of the nonvolatile memory device, in which the portion includes a plurality of storage units, determining whether one or more storage units of the plurality of storage units included in the portion of the non-volatile memory device are programmed, pre-programming the portion of the non-volatile memory device if the one or more storage units are determined to be programmed, and erasing the pre-programmed portion of the non-volatile memory device. A number of determined programmed storage units may not exceed a predetermined value. Other embodiments may be described and/or claimed.
摘要翻译: 本公开的实施例描述了在擦除之前非易失性存储器的条件预编程的方法,装置和系统配置。 在一种情况下,该方法包括接收擦除非易失性存储器件的一部分中的信息的请求,其中该部分包括多个存储单元,确定包括在该部分中的多个存储单元中的一个或多个存储单元 对所述非易失性存储器件进行编程,如果所述一个或多个存储单元被确定为被编程,并且擦除所述非易失性存储器件的预编程部分,则对所述非易失性存储器件的所述部分进行预编程。 多个确定的编程存储单元可能不超过预定值。 可以描述和/或要求保护其他实施例。
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公开(公告)号:US09330784B2
公开(公告)日:2016-05-03
申请号:US13997212
申请日:2011-12-29
申请人: Kiran Pangal , Ravi J. Kumar
发明人: Kiran Pangal , Ravi J. Kumar
CPC分类号: G06F3/0616 , G06F3/064 , G06F3/0653 , G06F3/0659 , G06F3/0679 , G06F11/1068 , G06F11/2094 , G11C11/5635 , G11C11/5642 , G11C16/00 , G11C16/14 , G11C16/26 , G11C16/3436 , G11C29/021 , G11C29/026 , G11C29/028 , G11C29/50016 , G11C29/52 , G11C2029/0401
摘要: Methods and apparatus to provide dynamic window to improve NAND (Not And) memory endurance are described. In one embodiment, a program-erase window associated with a NAND memory device is dynamically varied by starting with a higher erase verify (TEV) voltage and lowering the TEV voltage with subsequent cycles over a life of the NAND memory device based on a current cycle count value. Alternatively, the program-erase window is dynamically varied by starting with a higher erase verify (PV) voltage and erase verify (TEV) voltage and lowering the PV and TEV voltages with subsequent cycles over a life of the NAND memory device based on the current cycle count value. Other embodiments are also disclosed and claimed.
摘要翻译: 描述了提供动态窗口以提高NAND(Not And)存储器耐久性的方法和装置。 在一个实施例中,与NAND存储器件相关联的编程擦除窗口通过从较高的擦除验证(TEV)电压开始并基于当前周期在NAND存储器件的使用寿命内随后的周期降低TEV电压而动态地改变 计数值。 或者,通过从更高的擦除验证(PV)电压和擦除验证(TEV)电压开始,并且基于当前的NAND存储器件的使用寿命的随后的周期来降低PV和TEV电压,编程擦除窗口被动态地变化 循环计数值。 还公开并要求保护其他实施例。
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公开(公告)号:US20160049209A1
公开(公告)日:2016-02-18
申请号:US14461154
申请日:2014-08-15
申请人: Abhinav PANDEY , Hanmant P. BELGAL , Prashant S. DAMLE , Arjun KRIPANIDHI , Sebastian T. URIBE , Dany-Sebastien LY-GAGNON , Sanjay RANGAN , Kiran PANGAL
发明人: Abhinav PANDEY , Hanmant P. BELGAL , Prashant S. DAMLE , Arjun KRIPANIDHI , Sebastian T. URIBE , Dany-Sebastien LY-GAGNON , Sanjay RANGAN , Kiran PANGAL
CPC分类号: G11C7/12 , G06F11/1072 , G11C7/04 , G11C11/5678 , G11C13/0002 , G11C13/0004 , G11C13/0033 , G11C13/0069 , G11C14/0045 , G11C29/028 , G11C29/50004 , G11C2013/0057 , G11C2029/5004
摘要: Embodiments including systems, methods, and apparatuses associated with expanding a threshold voltage window of memory cells are described herein. Specifically, in some embodiments memory cells may be configured to store data by being set to a set state or a reset state. In some embodiments, a dummy-read process may be performed on memory cells in the set state prior to a read process. In some embodiments, a modified reset algorithm may be performed on memory cells in the reset state. Other embodiments may be described or claimed.
摘要翻译: 这里描述包括与扩展存储器单元的阈值电压窗口相关联的系统,方法和装置的实施例。 具体地,在一些实施例中,存储器单元可以被配置为通过被设置为设置状态或复位状态来存储数据。 在一些实施例中,可以在读取处理之前在设置状态下对存储器单元执行伪读取处理。 在一些实施例中,可以在复位状态的存储器单元上执行修改的复位算法。 可以描述或要求保护其他实施例。
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公开(公告)号:US20150220387A1
公开(公告)日:2015-08-06
申请号:US14126310
申请日:2013-09-27
申请人: Zion S. KWOK , Ravi H. MOTWANI , Kiran PANGAL , Prashant S. DAMLE
发明人: Zion S. Kwok , Ravi H. Motwani , Kiran Pangal , Prashant S. Damle
CPC分类号: G06F11/1068 , G06F11/10 , G06F11/1044 , G06F11/108 , G06F12/00 , G06F2212/7207 , G11C29/52 , H03M13/1515 , H03M13/152
摘要: Apparatus, systems, and methods for error correction in memory are described. In one embodiment, a memory controller comprises logic to receive a read request for data stored in a memory, retrieve the data and at least one associated error correction codeword, wherein the data and an associated error correction codeword is distributed across a plurality of memory devices in memory, apply a first error correction routine to decode the error correction codeword retrieved with the data and in response to an uncorrectable error in the error correction codeword, apply a second error correction routine to the plurality of devices in memory. Other embodiments are also disclosed and claimed.
摘要翻译: 描述了存储器中用于纠错的装置,系统和方法。 在一个实施例中,存储器控制器包括接收对存储在存储器中的数据的读取请求的逻辑,检索数据和至少一个相关联的纠错码字,其中数据和相关联的纠错码字分布在多个存储器件 在存储器中,应用第一纠错程序来解码用数据检索的纠错码字,并响应错误校正码字中的不可校正错误,对存储器中的多个设备应用第二纠错例程。 还公开并要求保护其他实施例。
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公开(公告)号:US20140370664A1
公开(公告)日:2014-12-18
申请号:US13917068
申请日:2013-06-13
申请人: Kiran Pangal , Khaled Hasnat , Shafqat Ahmed
发明人: Kiran Pangal , Khaled Hasnat , Shafqat Ahmed
IPC分类号: H01L27/105
CPC分类号: H01L27/1052 , H01L27/101 , H01L27/2463 , H01L45/1675
摘要: Techniques for fabricating cross-point memory devices are disclosed in which word line (WL) and/or bit line (BL) processing is separate from cross-point memory memory-material processing, thereby providing an advantageous increase in thickness of the WL and/or BL metal that avoids an increase in the WL and BL resistances as feature sizes for cross-point memories scale smaller.
摘要翻译: 公开了用于制造交叉点存储器件的技术,其中字线(WL)和/或位线(BL)处理与交叉点存储器材料处理分离,从而提供WL和/ 或BL金属,避免了WL和BL电阻的增加,因为交叉点存储器的特征尺寸缩小。
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公开(公告)号:US20140297924A1
公开(公告)日:2014-10-02
申请号:US13995145
申请日:2012-03-29
申请人: Hiroyuki Sanda , Kiran Pangal , Xin Guo , Kaoru Naganuma
发明人: Hiroyuki Sanda , Kiran Pangal , Xin Guo , Kaoru Naganuma
IPC分类号: G11C16/16
CPC分类号: G11C16/16 , G06F12/0246 , G11C11/5635 , G11C16/3445
摘要: Embodiments of the present disclosure describe methods, apparatus, and system configurations for conditional pre-programming of nonvolatile memory before erasure. In one instance, the method includes receiving a request to erase information in a portion of the nonvolatile memory device, in which the portion includes a plurality of storage units, determining whether one or more storage units of the plurality of storage units included in the portion of the non-volatile memory device are programmed, pre-programming the portion of the non-volatile memory device if the one or more storage units are determined to be programmed, and erasing the pre-programmed portion of the non-volatile memory device. A number of determined programmed storage units may not exceed a predetermined value. Other embodiments may be described and/or claimed.
摘要翻译: 本公开的实施例描述了在擦除之前非易失性存储器的条件预编程的方法,装置和系统配置。 在一种情况下,该方法包括接收擦除非易失性存储器件的一部分中的信息的请求,其中该部分包括多个存储单元,确定包括在该部分中的多个存储单元中的一个或多个存储单元 对所述非易失性存储器件进行编程,如果所述一个或多个存储单元被确定为被编程,并且擦除所述非易失性存储器件的预编程部分,则对所述非易失性存储器件的所述部分进行预编程。 多个确定的编程存储单元可能不超过预定值。 可以描述和/或要求保护其他实施例。
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公开(公告)号:US20140281203A1
公开(公告)日:2014-09-18
申请号:US13832278
申请日:2013-03-15
IPC分类号: G11C11/406
CPC分类号: G11C7/1072 , G11C11/406 , G11C11/40618 , G11C16/3431
摘要: In an embodiment, a memory controller may determine that one or more neighboring memory cells associated with a target memory cell in a memory device are to be refreshed. The controller may generate a command associated with refreshing the one or more neighboring memory cells. The controller may transfer the command from the memory controller to the memory device containing the target memory cell. The command may direct the memory device to refresh the neighboring memory cells and/or return one or more addresses associated with the neighboring memory cells.
摘要翻译: 在一个实施例中,存储器控制器可以确定与存储器件中的目标存储器单元相关联的一个或多个相邻存储器单元将被刷新。 控制器可以生成与刷新一个或多个相邻存储器单元相关联的命令。 控制器可以将命令从存储器控制器传送到包含目标存储器单元的存储器件。 命令可以指示存储器设备刷新相邻存储器单元和/或返回与相邻存储器单元相关联的一个或多个地址。
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公开(公告)号:US20140258804A1
公开(公告)日:2014-09-11
申请号:US13792597
申请日:2013-03-11
申请人: Kiran Pangal , Prashant S. Damle , Rajesh Sundaram , Shekoufeh Qawami , Julie M. Walker , Doyle Rivers
发明人: Kiran Pangal , Prashant S. Damle , Rajesh Sundaram , Shekoufeh Qawami , Julie M. Walker , Doyle Rivers
IPC分类号: H03M13/05
CPC分类号: G06F11/1076 , G06F3/0619 , G06F3/064 , G06F3/0679 , G06F11/1044 , G06F11/1048 , G06F11/1068 , H03M13/05 , H03M13/1515 , H03M13/152 , H03M13/19 , H03M13/27 , H03M13/6508
摘要: Uncorrectable memory errors may be reduced by determining a logical array address for a set of memory arrays and transforming the logical array address to at least two unique array addresses based, at least in part, on logical locations of at least two memory arrays within the set of memory arrays. The at least two memory arrays are then accessed using the at least two unique array addresses, respectively.
摘要翻译: 可以通过确定一组存储器阵列的逻辑阵列地址并且至少部分地基于该组内的至少两个存储器阵列的逻辑位置将逻辑阵列地址变换为至少两个唯一阵列地址来减少不可校正的存储器错误 的存储器阵列。 然后使用至少两个唯一的阵列地址分别访问至少两个存储器阵列。
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公开(公告)号:US08072022B2
公开(公告)日:2011-12-06
申请号:US12317535
申请日:2008-12-24
申请人: Pranav Kalavade , Krishna Parat , Ervin Hill , Kiran Pangal
发明人: Pranav Kalavade , Krishna Parat , Ervin Hill , Kiran Pangal
IPC分类号: H01L29/423 , H01L29/739
CPC分类号: G11C16/0416 , H01L21/28273 , H01L27/11521 , H01L29/42336 , H01L29/66825 , H01L29/7881
摘要: Embodiments of an apparatus and methods for providing improved flash memory cell characteristics are generally described herein. Other embodiments may be described and claimed.
摘要翻译: 本文通常描述用于提供改进的闪速存储器单元特性的装置和方法的实施例。 可以描述和要求保护其他实施例。
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公开(公告)号:US09268631B2
公开(公告)日:2016-02-23
申请号:US13976463
申请日:2012-03-29
申请人: Lark-Hoon Leem , Kiran Pangal , Xin Guo
发明人: Lark-Hoon Leem , Kiran Pangal , Xin Guo
CPC分类号: G06F11/08 , G06F11/1048 , G11C11/5628 , G11C16/3418
摘要: Examples are disclosed for generating or providing a moving read reference (MRR) table for recovering from a read error of one or more memory cells of a non-volatile memory included in a storage device. Priorities may be adaptively assigned to entries included in the MRR table and the entries may be ordered for use based on the assigned priorities. Other examples are described and claimed.
摘要翻译: 公开了用于生成或提供用于从包括在存储设备中的非易失性存储器的一个或多个存储器单元的读取错误中恢复的移动读取参考(MRR)表的示例。 可以将优先级自适应地分配给包括在MRR表中的条目,并且可以基于分配的优先级对条目进行排序使用。 其他的例子被描述和要求保护。
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