Nonvolatile memory erasure techniques
    1.
    发明授权
    Nonvolatile memory erasure techniques 有权
    非易失性存储器擦除技术

    公开(公告)号:US09543024B2

    公开(公告)日:2017-01-10

    申请号:US13995145

    申请日:2012-03-29

    摘要: Embodiments of the present disclosure describe methods, apparatus, and system configurations for conditional pre-programming of nonvolatile memory before erasure. In one instance, the method includes receiving a request to erase information in a portion of the nonvolatile memory device, in which the portion includes a plurality of storage units, determining whether one or more storage units of the plurality of storage units included in the portion of the non-volatile memory device are programmed, pre-programming the portion of the non-volatile memory device if the one or more storage units are determined to be programmed, and erasing the pre-programmed portion of the non-volatile memory device. A number of determined programmed storage units may not exceed a predetermined value. Other embodiments may be described and/or claimed.

    摘要翻译: 本公开的实施例描述了在擦除之前非易失性存储器的条件预编程的方法,装置和系统配置。 在一种情况下,该方法包括接收擦除非易失性存储器件的一部分中的信息的请求,其中该部分包括多个存储单元,确定包括在该部分中的多个存储单元中的一个或多个存储单元 对所述非易失性存储器件进行编程,如果所述一个或多个存储单元被确定为被编程,并且擦除所述非易失性存储器件的预编程部分,则对所述非易失性存储器件的所述部分进行预编程。 多个确定的编程存储单元可能不超过预定值。 可以描述和/或要求保护其他实施例。

    Dynamic window to improve NAND endurance
    2.
    发明授权
    Dynamic window to improve NAND endurance 有权
    动态窗口提高NAND耐久性

    公开(公告)号:US09330784B2

    公开(公告)日:2016-05-03

    申请号:US13997212

    申请日:2011-12-29

    摘要: Methods and apparatus to provide dynamic window to improve NAND (Not And) memory endurance are described. In one embodiment, a program-erase window associated with a NAND memory device is dynamically varied by starting with a higher erase verify (TEV) voltage and lowering the TEV voltage with subsequent cycles over a life of the NAND memory device based on a current cycle count value. Alternatively, the program-erase window is dynamically varied by starting with a higher erase verify (PV) voltage and erase verify (TEV) voltage and lowering the PV and TEV voltages with subsequent cycles over a life of the NAND memory device based on the current cycle count value. Other embodiments are also disclosed and claimed.

    摘要翻译: 描述了提供动态窗口以提高NAND(Not And)存储器耐久性的方法和装置。 在一个实施例中,与NAND存储器件相关联的编程擦除窗口通过从较高的擦除验证(TEV)电压开始并基于当前周期在NAND存储器件的使用寿命内随后的周期降低TEV电压而动态地改变 计数值。 或者,通过从更高的擦除验证(PV)电压和擦除验证(TEV)电压开始,并且基于当前的NAND存储器件的使用寿命的随后的周期来降低PV和TEV电压,编程擦除窗口被动态地变化 循环计数值。 还公开并要求保护其他实施例。

    ERROR CORRECTION IN NON_VOLATILE MEMORY
    4.
    发明申请
    ERROR CORRECTION IN NON_VOLATILE MEMORY 有权
    NON_VOLATILE MEMORY中的错误修正

    公开(公告)号:US20150220387A1

    公开(公告)日:2015-08-06

    申请号:US14126310

    申请日:2013-09-27

    IPC分类号: G06F11/10 H03M13/15 G11C29/52

    摘要: Apparatus, systems, and methods for error correction in memory are described. In one embodiment, a memory controller comprises logic to receive a read request for data stored in a memory, retrieve the data and at least one associated error correction codeword, wherein the data and an associated error correction codeword is distributed across a plurality of memory devices in memory, apply a first error correction routine to decode the error correction codeword retrieved with the data and in response to an uncorrectable error in the error correction codeword, apply a second error correction routine to the plurality of devices in memory. Other embodiments are also disclosed and claimed.

    摘要翻译: 描述了存储器中用于纠错的装置,系统和方法。 在一个实施例中,存储器控制器包括接收对存储在存储器中的数据的读取请求的逻辑,检索数据和至少一个相关联的纠错码字,其中数据和相关联的纠错码字分布在多个存储器件 在存储器中,应用第一纠错程序来解码用数据检索的纠错码字,并响应错误校正码字中的不可校正错误,对存储器中的多个设备应用第二纠错例程。 还公开并要求保护其他实施例。

    WORD LINE AND BIT LINE PROCESSING FOR CROSS-POINT MEMORIES
    5.
    发明申请
    WORD LINE AND BIT LINE PROCESSING FOR CROSS-POINT MEMORIES 审中-公开
    用于跨点记录的字线和位线处理

    公开(公告)号:US20140370664A1

    公开(公告)日:2014-12-18

    申请号:US13917068

    申请日:2013-06-13

    IPC分类号: H01L27/105

    摘要: Techniques for fabricating cross-point memory devices are disclosed in which word line (WL) and/or bit line (BL) processing is separate from cross-point memory memory-material processing, thereby providing an advantageous increase in thickness of the WL and/or BL metal that avoids an increase in the WL and BL resistances as feature sizes for cross-point memories scale smaller.

    摘要翻译: 公开了用于制造交叉点存储器件的技术,其中字线(WL)和/或位线(BL)处理与交叉点存储器材料处理分离,从而提供WL和/ 或BL金属,避免了WL和BL电阻的增加,因为交叉点存储器的特征尺寸缩小。

    NONVOLATILE MEMORY ERASURE TECHNIQUES
    6.
    发明申请
    NONVOLATILE MEMORY ERASURE TECHNIQUES 有权
    非易失性存储器擦除技术

    公开(公告)号:US20140297924A1

    公开(公告)日:2014-10-02

    申请号:US13995145

    申请日:2012-03-29

    IPC分类号: G11C16/16

    摘要: Embodiments of the present disclosure describe methods, apparatus, and system configurations for conditional pre-programming of nonvolatile memory before erasure. In one instance, the method includes receiving a request to erase information in a portion of the nonvolatile memory device, in which the portion includes a plurality of storage units, determining whether one or more storage units of the plurality of storage units included in the portion of the non-volatile memory device are programmed, pre-programming the portion of the non-volatile memory device if the one or more storage units are determined to be programmed, and erasing the pre-programmed portion of the non-volatile memory device. A number of determined programmed storage units may not exceed a predetermined value. Other embodiments may be described and/or claimed.

    摘要翻译: 本公开的实施例描述了在擦除之前非易失性存储器的条件预编程的方法,装置和系统配置。 在一种情况下,该方法包括接收擦除非易失性存储器件的一部分中的信息的请求,其中该部分包括多个存储单元,确定包括在该部分中的多个存储单元中的一个或多个存储单元 对所述非易失性存储器件进行编程,如果所述一个或多个存储单元被确定为被编程,并且擦除所述非易失性存储器件的预编程部分,则对所述非易失性存储器件的所述部分进行预编程。 多个确定的编程存储单元可能不超过预定值。 可以描述和/或要求保护其他实施例。

    MANAGING DISTURBANCE INDUCED ERRORS
    7.
    发明申请
    MANAGING DISTURBANCE INDUCED ERRORS 有权
    管理干扰引起的错误

    公开(公告)号:US20140281203A1

    公开(公告)日:2014-09-18

    申请号:US13832278

    申请日:2013-03-15

    IPC分类号: G11C11/406

    摘要: In an embodiment, a memory controller may determine that one or more neighboring memory cells associated with a target memory cell in a memory device are to be refreshed. The controller may generate a command associated with refreshing the one or more neighboring memory cells. The controller may transfer the command from the memory controller to the memory device containing the target memory cell. The command may direct the memory device to refresh the neighboring memory cells and/or return one or more addresses associated with the neighboring memory cells.

    摘要翻译: 在一个实施例中,存储器控制器可以确定与存储器件中的目标存储器单元相关联的一个或多个相邻存储器单元将被刷新。 控制器可以生成与刷新一个或多个相邻存储器单元相关联的命令。 控制器可以将命令从存储器控制器传送到包含目标存储器单元的存储器件。 命令可以指示存储器设备刷新相邻存储器单元和/或返回与相邻存储器单元相关联的一个或多个地址。

    Adaptive moving read references for memory cells
    10.
    发明授权
    Adaptive moving read references for memory cells 有权
    存储单元的自适应移动读取参考

    公开(公告)号:US09268631B2

    公开(公告)日:2016-02-23

    申请号:US13976463

    申请日:2012-03-29

    摘要: Examples are disclosed for generating or providing a moving read reference (MRR) table for recovering from a read error of one or more memory cells of a non-volatile memory included in a storage device. Priorities may be adaptively assigned to entries included in the MRR table and the entries may be ordered for use based on the assigned priorities. Other examples are described and claimed.

    摘要翻译: 公开了用于生成或提供用于从包括在存储设备中的非易失性存储器的一个或多个存储器单元的读取错误中恢复的移动读取参考(MRR)表的示例。 可以将优先级自适应地分配给包括在MRR表中的条目,并且可以基于分配的优先级对条目进行排序使用。 其他的例子被描述和要求保护。