Method for examining surface of copper layer in circuit board and
process for producing circuit board
    4.
    发明授权
    Method for examining surface of copper layer in circuit board and process for producing circuit board 失效
    电路板铜层表面检测方法及电路板生产工艺

    公开(公告)号:US5633121A

    公开(公告)日:1997-05-27

    申请号:US662299

    申请日:1996-06-12

    摘要: The surface of a copper layer in a circuit board is irradiated with a beam, and the degree of progress of oxidation of the surface of the copper layer is determined by taking advantage of the resultant reflected beam (for example, an intensity or a hue of a reflected beam). Then, the step of coating a resist is carried out only when the thickness of the copper oxide film is not more than about 10 nm. Alternatively, the step of coating a resist may be carried out after removal or reduction of the oxide film or cladding of the oxide film with copper.The present invention enables occurrence of peeling of the resist or dive of plating to be prevented in the step of effecting selective etching or plating of a copper layer in a circuit board using a resist pattern as a mask.

    摘要翻译: 用光束照射电路板中的铜层的表面,并且通过利用所得到的反射光束(例如,强度或色调的强度或色调来确定铜层的表面的氧化进程的程度) 反射光束)。 然后,只有当氧化铜膜的厚度不大于约10nm时,才进行涂覆抗蚀剂的步骤。 或者,涂布抗蚀剂的步骤可以在用铜去除或还原氧化膜或氧化膜的包层之后进行。 在使用抗蚀剂图案作为掩模的电路板中进行铜层的选择性蚀刻或镀覆的步骤中,本发明能够防止抗蚀剂的剥离或电镀的潜在的发生。