Semiconductor memory device
    9.
    发明授权
    Semiconductor memory device 失效
    半导体存储器件

    公开(公告)号:US4991139A

    公开(公告)日:1991-02-05

    申请号:US228022

    申请日:1988-08-04

    IPC分类号: G11C29/04 G11C29/34 G11C29/38

    CPC分类号: G11C29/34 G11C29/04 G11C29/38

    摘要: A semiconductor memory device is provided which includes a plurality of data lines coupled to memory cells and to a detecting arrangement for detecting if logical levels of each of the data lines coincide to each other or not. A test read arrangement is also provided which stores the same information, in advance, in plural memory cells so that if there is a defect in one of the memory cells, this can be detected by the detecting arrangement.

    摘要翻译: 提供一种半导体存储器件,其包括耦合到存储器单元的多条数据线以及用于检测每条数据线的逻辑电平是否彼此一致的检测装置。 还提供了一种测试读取装置,其预先在多个存储单元中存储相同的信息,使得如果存储单元之一存在缺陷,则可以通过检测装置来检测。