PROCESS KIT FOR RF PHYSICAL VAPOR DEPOSITION
    2.
    发明申请
    PROCESS KIT FOR RF PHYSICAL VAPOR DEPOSITION 审中-公开
    RF物理蒸气沉积工艺套件

    公开(公告)号:US20110036709A1

    公开(公告)日:2011-02-17

    申请号:US12850312

    申请日:2010-08-04

    IPC分类号: C23C14/34

    摘要: Embodiments of the invention generally relate to a process kit for a semiconductor processing chamber, and a semiconductor processing chamber having a kit. More specifically, embodiments described herein relate to a process kit including a cover ring, a shield, and an isolator for use in a physical deposition chamber. The components of the process kit work alone and in combination to significantly reduce particle generation and stray plasmas. In comparison with existing multiple part shields, which provide an extended RF return path contributing to RF harmonics causing stray plasma outside the process cavity, the components of the process kit reduce the RF return path thus providing improved plasma containment in the interior processing region.

    摘要翻译: 本发明的实施例一般涉及用于半导体处理室的处理套件和具有套件的半导体处理室。 更具体地,本文所述的实施例涉及包括用于物理沉积室中的盖环,屏蔽和隔离器的处理套件。 过程组件的组件单独工作并组合起来,以显着减少颗粒产生和杂散等离子体。 与现有的多部分屏蔽相比,其提供了有助于RF谐波的扩展的RF返回路径,从而在处理空腔之外引起杂散等离子体,处理套件的部件降低了RF返回路径,从而在内部处理区域中提供了改进的等离子体容纳物。

    Apparatus for physical vapor deposition having centrally fed RF energy
    4.
    发明授权
    Apparatus for physical vapor deposition having centrally fed RF energy 有权
    用于物理气相沉积的装置具有中央馈送的RF能量

    公开(公告)号:US08795488B2

    公开(公告)日:2014-08-05

    申请号:US13048440

    申请日:2011-03-15

    IPC分类号: C23C14/40

    CPC分类号: H01J37/3405 H01J37/3411

    摘要: In some embodiments, a feed structure to couple RF energy to a target may include a body having a first end to receive RF energy and a second end opposite the first end to couple the RF energy to a target, the body further having a central opening disposed through the body from the first end to the second end; a first member coupled to the body at the first end, wherein the first member comprises a first element circumscribing the body and extending radially outward from the body, and one or more terminals disposed in the first member to receive RF energy from an RF power source; and a source distribution plate coupled to the second end of the body to distribute the RF energy to the target, wherein the source distribution plate includes a hole disposed through the plate and aligned with the central opening of the body.

    摘要翻译: 在一些实施例中,将RF能量耦合到目标的馈送结构可以包括具有接收RF能量的第一端的主体和与第一端相对的第二端以将RF能量耦合到目标,所述主体还具有中心开口 从第一端至第二端穿过本体; 第一构件,其在所述第一端处联接到所述主体,其中所述第一构件包括限定所述主体并且从所述主体径向向外延伸的第一元件以及设置在所述第一构件中以从RF电源接收RF能量的一个或多个端子 ; 以及耦合到所述主体的第二端以将RF能量分配到所述目标的源分布板,其中所述源分配板包括穿过所述板布置并与所述主体的中心开口对准的孔。

    Encapsulated sputtering target
    7.
    发明授权
    Encapsulated sputtering target 有权
    封装溅射靶

    公开(公告)号:US08133368B2

    公开(公告)日:2012-03-13

    申请号:US12263013

    申请日:2008-10-31

    CPC分类号: C23C14/3407

    摘要: Embodiments of the invention provide encapsulated sputtering targets and methods for preparing such targets prior to a physical vapor deposition (PVD) process. In one embodiment, an encapsulated target for PVD is provided which includes a target layer containing lanthanum disposed on a backing plate and an encapsulation layer containing titanium disposed on or over the target layer. In one example, the target layer contains metallic lanthanum or lanthanum oxide and the encapsulation layer contains titanium. The encapsulation layer may have a thickness within a range from about 1,000 Å to about 2,000 Å. In another embodiment, a method for preparing an encapsulated target prior to a PVD process is provided which includes positioning an encapsulated target within a PVD chamber and exposing the encapsulation layer to a plasma while removing the encapsulation layer and revealing an upper surface of the target layer.

    摘要翻译: 本发明的实施方案提供了封装的溅射靶和在物理气相沉积(PVD))方法之前制备这些靶的方法。 在一个实施方案中,提供了用于PVD的包封的靶,其包括设置在背板上的含有镧的靶层和包含设置在靶层上或上的钛的包封层。 在一个实例中,目标层包含金属镧或氧化镧,并且包封层含有钛。 封装层的厚度可以在大约从1000到大约2000的范围内。 在另一个实施方案中,提供了一种用于在PVD工艺之前制备封装的靶的方法,其包括将包封的靶定位在PVD室内并将封装层暴露于等离子体,同时移除封装层并露出靶层的上表面 。

    Encapsulated sputtering target
    8.
    发明授权
    Encapsulated sputtering target 有权
    封装溅射靶

    公开(公告)号:US08435392B2

    公开(公告)日:2013-05-07

    申请号:US13397184

    申请日:2012-02-15

    CPC分类号: C23C14/3407

    摘要: Embodiments of the invention provide encapsulated sputtering targets for physical vapor deposition. In one embodiment, an encapsulated target contains a target layer containing a first metal or an oxide of the first metal disposed over a backing plate, an adhesion interlayer disposed between the target layer and the backing plate, and an encapsulation layer containing a second metal or an oxide of the second metal disposed over the target layer and an annular sidewall of the backing plate. The target layer is encapsulated by the backing plate and the encapsulation layer and the first metal is different than the second metal. In some examples, the first metal is lanthanum or lithium and the target layer contains metallic lanthanum, lanthanum oxide, or metallic lithium. In other examples, the second metal is titanium or aluminum and the encapsulation layer contains metallic titanium, titanium oxide, metallic aluminum, or aluminum oxide.

    摘要翻译: 本发明的实施例提供用于物理气相沉积的封装溅射靶。 在一个实施方案中,包封的靶含有包含设置在背板上的第一金属或第一金属的氧化物的目标层,设置在靶层和背衬板之间的粘合中间层,以及包含第二金属或 设置在目标层上的第二金属的氧化物和背板的环形侧壁。 目标层被背板封装,并且封装层和第一金属不同于第二金属。 在一些实例中,第一金属是镧或锂,靶层含有金属镧,氧化镧或金属锂。 在其他实例中,第二金属是钛或铝,并且包封层含有金属钛,氧化钛,金属铝或氧化铝。