PLASMA-ACTIVATED DEPOSITION OF CONFORMAL FILMS
    6.
    发明申请
    PLASMA-ACTIVATED DEPOSITION OF CONFORMAL FILMS 审中-公开
    等离子体活化沉积膜

    公开(公告)号:US20130319329A1

    公开(公告)日:2013-12-05

    申请号:US13963212

    申请日:2013-08-09

    Abstract: Embodiments related to depositing thin conformal films using plasma-activated conformal film deposition (CFD) processes are described herein. In one example, a method of processing a substrate includes, applying photoresist to the substrate, exposing the photoresist to light via a stepper, patterning the resist with a pattern and transferring the pattern to the substrate, selectively removing photoresist from the substrate, placing the substrate into a process station, and, in the process station, in a first phase, generating radicals off of the substrate and adsorbing the radicals to the substrate to form active species, in a first purge phase, purging the process station, in a second phase, supplying a reactive plasma to the surface, the reactive plasma configured to react with the active species and generate the film, and in a second purge phase, purging the process station.

    Abstract translation: 本文描述了使用等离子体激活的保形膜沉积(CFD)工艺沉积薄保形膜的实施例。 在一个实例中,处理衬底的方法包括:将光致抗蚀剂施加到衬底,通过步进器将光致抗蚀剂曝光,将图案图案化并将图案转移到衬底,从衬底选择性地去除光致抗蚀剂, 底物进入处理站,并且在处理站中,在第一阶段中,在第一阶段中产生自由基,并且将基团吸附到基底上以形成活性物质,在第一清洗阶段中,在第二阶段中以第二阶段净化处理站 将反应性等离子体供应到所述表面,所述反应性等离子体被配置为与所述活性物质反应并产生所述膜,并且在第二清除阶段中清除所述处理站。

    Carbon deposition-etch-ash gap fill process
    9.
    发明授权
    Carbon deposition-etch-ash gap fill process 有权
    碳沉积 - 蚀刻 - 灰渣填充过程

    公开(公告)号:US09023731B2

    公开(公告)日:2015-05-05

    申请号:US13896729

    申请日:2013-05-17

    Abstract: Techniques, systems, and apparatuses for performing carbon gap-fill in semiconductor wafers are provided. The techniques may include performing deposition-etching operations in a cyclic fashion to fill a gap feature with carbon. A plurality of such deposition-etching cycles may be performed, resulting in a localized build-up of carbon film on the top surface of the semiconductor wafer near the gap feature. An ashing operation may then be performed to preferentially remove the built-up material from the top surface of the semiconductor wafer. Further groups of deposition-etching cycles may then be performed, interspersed with further ashing cycles.

    Abstract translation: 提供了用于在半导体晶片中进行碳隙填充的技术,系统和装置。 这些技术可以包括以循环方式执行沉积蚀刻操作以填充碳的间隙特征。 可以执行多个这样的沉积蚀刻循环,导致在间隙特征附近在半导体晶片的顶表面上局部积累碳膜。 然后可以执行灰化操作以从半导体晶片的顶表面优先移除积聚材料。 然后可以执行另外的沉积 - 蚀刻循环组,并进一步散布灰化循环。

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