公开(公告)号：US07934313B1

公开(公告)日：2011-05-03

申请号：US12759237

申请日：2010-04-13

申请人： Pang-Chun Lin ,  Hsiao-Jen Hung ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

发明人： Pang-Chun Lin ,  Hsiao-Jen Hung ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC分类号： H05K3/30

CPC分类号： H01L25/105 ,  H01L23/3128 ,  H01L23/49811 ,  H01L23/49816 ,  H01L23/49861 ,  H01L24/16 ,  H01L24/48 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/48247 ,  H01L2224/73265 ,  H01L2224/97 ,  H01L2225/1035 ,  H01L2225/1058 ,  H01L2225/1088 ,  H01L2924/00014 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/15311 ,  H01L2924/15331 ,  H01L2924/181 ,  H01L2924/3025 ,  Y10T29/4913 ,  Y10T29/49131 ,  Y10T29/49144 ,  Y10T29/49146 ,  Y10T29/49165 ,  H01L2224/85 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A fabrication method of a package structure includes: preparing a metal plate having first and second surfaces and defined with an active region; forming a wiring layer with conductive traces and first electrical contact pads on the first surface; forming third electrical contact pads corresponding to the first electrical contact pads on the second surface; forming a first encapsulant on the first surface; forming on the second surface an open area to penetrate the metal plate, wherein the metal plate form conductive posts between the first and third electrical contact pads; mounting in the open area a chip electrically connected to the wiring layer; forming a second encapsulant in the open area, the wiring layer and the third electrical contact pads; forming first and second openings in the first and second encapsulants to expose the third electrical contact pads, respectively; and cutting the metal plate to remove the metal layer.

摘要翻译： 包装结构的制造方法包括：制备具有第一表面和第二表面并且限定有活性区域的金属板; 在所述第一表面上形成具有导电迹线和第一电接触焊盘的布线层; 形成对应于第二表面上的第一电接触焊盘的第三电接触焊盘; 在所述第一表面上形成第一密封剂; 在所述第二表面上形成穿透所述金属板的开放区域，其中所述金属板在所述第一和第三电接触焊盘之间形成导电柱; 在所述开放区域中安装与所述布线层电连接的芯片; 在所述开放区域中形成第二密封剂，所述布线层和所述第三电接触焊盘; 在第一和第二密封剂中形成第一和第二开口以分别露出第三电接触垫; 并切割金属板以去除金属层。

公开(公告)号：US20110157851A1

公开(公告)日：2011-06-30

申请号：US12759117

申请日：2010-04-13

申请人： Pang-Chun Lin ,  Hsiao-Jen Hung ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

发明人： Pang-Chun Lin ,  Hsiao-Jen Hung ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC分类号： H05K7/02

CPC分类号： H01L25/105 ,  H01L23/3128 ,  H01L23/49811 ,  H01L23/49816 ,  H01L23/49861 ,  H01L24/16 ,  H01L24/48 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/48247 ,  H01L2224/73265 ,  H01L2224/97 ,  H01L2225/1035 ,  H01L2225/1058 ,  H01L2225/1088 ,  H01L2924/00014 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/15311 ,  H01L2924/15331 ,  H01L2924/181 ,  H01L2924/3025 ,  Y10T29/4913 ,  Y10T29/49131 ,  Y10T29/49144 ,  Y10T29/49146 ,  Y10T29/49165 ,  H01L2224/85 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A package structure includes a base body having a first encapsulant and a wiring layer embedded in and exposed from the first encapsulant. The wiring layer has a plurality of conductive traces and a plurality of first electrical contact pads. The first encapsulant has openings for exposing the first electrical contact pads, a chip electrically connected to the wiring layer, and a second encapsulant formed on the base body for covering the chip and the wiring layer, thereby providing an even surface for preventing the encapsulant from cracking when the chip is mounted.

摘要翻译： 封装结构包括具有第一密封剂和嵌入第一密封剂并暴露于第一密封剂的布线层的基体。 布线层具有多个导电迹线和多个第一电接触焊盘。 第一密封剂具有用于暴露第一电接触焊盘的开口，与布线层电连接的芯片，以及形成在基体上的用于覆盖芯片和布线层的第二密封剂，从而提供均匀的表面，以防止密封剂 芯片安装时开裂。

公开(公告)号：US08873244B2

公开(公告)日：2014-10-28

申请号：US12759117

申请日：2010-04-13

申请人： Pang-Chun Lin ,  Hsiao-Jen Hung ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

发明人： Pang-Chun Lin ,  Hsiao-Jen Hung ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC分类号： H05K7/02 ,  H05K7/06 ,  H05K7/08 ,  H05K7/10 ,  H01L23/498 ,  H01L25/10 ,  H01L23/31 ,  H01L23/00

CPC分类号： H01L25/105 ,  H01L23/3128 ,  H01L23/49811 ,  H01L23/49816 ,  H01L23/49861 ,  H01L24/16 ,  H01L24/48 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/48247 ,  H01L2224/73265 ,  H01L2224/97 ,  H01L2225/1035 ,  H01L2225/1058 ,  H01L2225/1088 ,  H01L2924/00014 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/15311 ,  H01L2924/15331 ,  H01L2924/181 ,  H01L2924/3025 ,  Y10T29/4913 ,  Y10T29/49131 ,  Y10T29/49144 ,  Y10T29/49146 ,  Y10T29/49165 ,  H01L2224/85 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A package structure includes a base body having a first encapsulant and a wiring layer embedded in and exposed from the first encapsulant. The wiring layer has a plurality of conductive traces and a plurality of first electrical contact pads. The first encapsulant has openings for exposing the first electrical contact pads, a chip electrically connected to the wiring layer, and a second encapsulant formed on the base body for covering the chip and the wiring layer, thereby providing an even surface for preventing the encapsulant from cracking when the chip is mounted.

摘要翻译： 封装结构包括具有第一密封剂和嵌入第一密封剂并暴露于第一密封剂的布线层的基体。 布线层具有多个导电迹线和多个第一电接触焊盘。 第一密封剂具有用于暴露第一电接触焊盘的开口，与布线层电连接的芯片，以及形成在基体上的用于覆盖芯片和布线层的第二密封剂，从而提供均匀的表面，以防止密封剂 芯片安装时开裂。

公开(公告)号：US08421199B2

公开(公告)日：2013-04-16

申请号：US12770028

申请日：2010-04-29

申请人： Pang-Chun Lin ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

发明人： Pang-Chun Lin ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC分类号： H01L23/495 ,  H01L23/48

CPC分类号： H01L23/495 ,  H01L21/4832 ,  H01L23/3107 ,  H01L23/4951 ,  H01L24/48 ,  H01L24/49 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/49171 ,  H01L2924/00014 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/181 ,  Y10T29/49117 ,  Y10T29/49171 ,  Y10T29/49172 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A semiconductor package structure includes: a dielectric layer; a metal layer disposed on the dielectric layer and having a die pad and traces, the traces each including a trace body, a bond pad extending to the periphery of the die pad, and an opposite trace end; metal pillars penetrating the dielectric layer with one ends thereof connecting to the die pad and the trace ends while the other ends thereof protruding from the dielectric layer; a semiconductor chip mounted on the die pad and electrically connected to the bond pads through bonding wires; and an encapsulant covering the semiconductor chip, the bonding wires, the metal layer, and the dielectric layer. The invention is characterized by disposing traces with bond pads close to the die pad to shorten bonding wires and forming metal pillars protruding from the dielectric layer to avoid solder bridging encountered in prior techniques.

公开(公告)号：US08390118B2

公开(公告)日：2013-03-05

申请号：US12859635

申请日：2010-08-19

申请人： Pang-Chun Lin ,  Chun-Yuan Li ,  Fu-Di Tang ,  Chien-Ping Huang ,  Chun-Chi Ke

发明人： Pang-Chun Lin ,  Chun-Yuan Li ,  Fu-Di Tang ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC分类号： H01L23/48 ,  H01L23/52

CPC分类号： H01L21/568 ,  H01L21/78 ,  H01L23/3128 ,  H01L24/45 ,  H01L24/48 ,  H01L24/85 ,  H01L2224/16 ,  H01L2224/45144 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/48247 ,  H01L2224/484 ,  H01L2224/48599 ,  H01L2224/48644 ,  H01L2224/48655 ,  H01L2224/48664 ,  H01L2224/85001 ,  H01L2224/85444 ,  H01L2224/85455 ,  H01L2224/85464 ,  H01L2924/00014 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01046 ,  H01L2924/0105 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/15151 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2224/78 ,  H01L2924/00 ,  H01L2224/05599 ,  H01L2924/00012

摘要： A semiconductor package having electrical connecting structures includes: a conductive layer having a die pad and traces surrounding the die pad; a chip; bonding wires; an encapsulant with a plurality of cavities having a depth greater than the thickness of the die pad and traces for embedding the die pad and the traces therein, and the cavities exposing the die pad and the traces; a solder mask layer formed in the cavities and having a plurality of openings for exposing the trace ends and a portion of the die pad; and solder balls formed in the openings and electrically connected to the trace ends. Engaging the solder mask layer with the encapsulant enhances adhesion strength of the solder mask layer so as to prolong the moisture permeation path and enhance package reliability.

摘要翻译： 具有电连接结构的半导体封装包括：具有管芯焊盘和围绕管芯焊盘的迹线的导电层; 一个芯片 接合线; 具有多个空腔的密封剂，其深度大于管芯焊盘的厚度，以及用于将管芯焊盘和其中的迹线嵌入其中的迹线，以及使裸片焊盘和迹线露出的空腔; 形成在所述空腔中的焊料掩模层，并且具有用于暴露所述迹线端部和所述管芯焊盘的一部分的多个开口; 以及形成在开口中并电连接到迹线端的焊球。 将焊料掩模层与密封剂接合，增强了焊料掩模层的粘合强度，从而延长了水分渗透路径并提高了封装的可靠性。

公开(公告)号：US20110159643A1

公开(公告)日：2011-06-30

申请号：US12770059

申请日：2010-04-29

申请人： Pang-Chun Lin ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

发明人： Pang-Chun Lin ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC分类号： H01L21/60 ,  H01L21/56

CPC分类号： H01L23/495 ,  H01L21/4832 ,  H01L23/3107 ,  H01L23/4951 ,  H01L24/48 ,  H01L24/49 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/49171 ,  H01L2924/00014 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/181 ,  Y10T29/49117 ,  Y10T29/49171 ,  Y10T29/49172 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A fabrication method of a semiconductor package structure includes: patterning a metal plate having first and second surfaces; forming a dielectric layer on the metal plate; forming a metal layer on the first surface and the dielectric layer; forming metal pads on the second surface, the metal layer having a die pad and traces each having a bond pad; mounting a semiconductor chip on the die pad, followed by connecting electrically the semiconductor chip to the bond pads through bonding wires; forming an encapsulant to cover the semiconductor chip and the metal layer; removing portions of the metal plate not covered by the metal pads so as to form metal pillars; and performing a singulation process. The fabrication method is characterized by disposing traces with bond pads close to the die pad to shorten the bonding wires and forming metal pillars protruding from the dielectric layer to avoid solder bridging.

摘要翻译： 半导体封装结构的制造方法包括：图案化具有第一表面和第二表面的金属板; 在所述金属板上形成电介质层; 在所述第一表面和所述电介质层上形成金属层; 在所述第二表面上形成金属焊盘，所述金属层具有管芯焊盘并且各自具有接合焊盘; 将半导体芯片安装在芯片焊盘上，然后通过接合线将半导体芯片电连接到焊盘; 形成密封剂以覆盖半导体芯片和金属层; 去除未被金属垫覆盖的金属板的部分，以形成金属柱; 并执行单独处理。 该制造方法的特征在于，将具有接合焊盘的迹线设置在芯片焊盘附近以缩短接合线并形成从电介质层突出的金属柱，以避免焊料桥接。

公开(公告)号：US20110156252A1

公开(公告)日：2011-06-30

申请号：US12859635

申请日：2010-08-19

申请人： Pang-Chun Lin ,  Chun-Yuan Li ,  Fu-Di Tang ,  Chien-Ping Huang ,  Chun-Chi Ke

发明人： Pang-Chun Lin ,  Chun-Yuan Li ,  Fu-Di Tang ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC分类号： H01L23/49 ,  H01L21/00

CPC分类号： H01L21/568 ,  H01L21/78 ,  H01L23/3128 ,  H01L24/45 ,  H01L24/48 ,  H01L24/85 ,  H01L2224/16 ,  H01L2224/45144 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/48247 ,  H01L2224/484 ,  H01L2224/48599 ,  H01L2224/48644 ,  H01L2224/48655 ,  H01L2224/48664 ,  H01L2224/85001 ,  H01L2224/85444 ,  H01L2224/85455 ,  H01L2224/85464 ,  H01L2924/00014 ,  H01L2924/01028 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01046 ,  H01L2924/0105 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/15151 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2224/78 ,  H01L2924/00 ,  H01L2224/05599 ,  H01L2924/00012

摘要： A semiconductor package having electrical connecting structures includes: a conductive layer having a die pad and traces surrounding the die pad; a chip; bonding wires; an encapsulant with a plurality of cavities having a depth greater than the thickness of the die pad and traces for embedding the die pad and the traces therein, and the cavities exposing the die pad and the traces; a solder mask layer formed in the cavities and having a plurality of openings for exposing the trace ends and a portion of the die pad; and solder balls formed in the openings and electrically connected to the trace ends. Engaging the solder mask layer with the encapsulant enhances adhesion strength of the solder mask layer so as to prolong the moisture permeation path and enhance package reliability.

摘要翻译： 具有电连接结构的半导体封装包括：具有管芯焊盘和围绕管芯焊盘的迹线的导电层; 一个芯片 接合线; 具有多个空腔的密封剂，其深度大于管芯焊盘的厚度，以及用于将管芯焊盘和其中的迹线嵌入其中的迹线，以及暴露管芯焊盘和迹线的空腔; 形成在所述空腔中的焊料掩模层，并且具有用于暴露所述迹线端部和所述管芯焊盘的一部分的多个开口; 以及形成在开口中并电连接到迹线端的焊球。 将焊料掩模层与密封剂接合，增强了焊料掩模层的粘合强度，从而延长了水分渗透路径并提高了封装的可靠性。

公开(公告)号：US20110156227A1

公开(公告)日：2011-06-30

申请号：US12770028

申请日：2010-04-29

申请人： Pang-Chun Lin ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

发明人： Pang-Chun Lin ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC分类号： H01L23/495

CPC分类号： H01L23/495 ,  H01L21/4832 ,  H01L23/3107 ,  H01L23/4951 ,  H01L24/48 ,  H01L24/49 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/49171 ,  H01L2924/00014 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/181 ,  Y10T29/49117 ,  Y10T29/49171 ,  Y10T29/49172 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A semiconductor package structure includes: a dielectric layer; a metal layer disposed on the dielectric layer and having a die pad and traces, the traces each including a trace body, a bond pad extending to the periphery of the die pad, and an opposite trace end; metal pillars penetrating the dielectric layer with one ends thereof connecting to the die pad and the trace ends while the other ends thereof protruding from the dielectric layer; a semiconductor chip mounted on the die pad and electrically connected to the bond pads through bonding wires; and an encapsulant covering the semiconductor chip, the bonding wires, the metal layer, and the dielectric layer. The invention is characterized by disposing traces with bond pads close to the die pad to shorten bonding wires and forming metal pillars protruding from the dielectric layer to avoid solder bridging encountered in prior techniques.

摘要翻译： 半导体封装结构包括：电介质层; 设置在电介质层上并具有芯片焊盘和迹线的金属层，每个迹线包括迹线体，延伸到管芯焊盘周边的接合焊盘和相对的迹线端; 金属柱贯穿电介质层，其一端连接到管芯焊盘并且其端部从电介质层突出; 半导体芯片，安装在芯片焊盘上，并通过接合线电连接到焊盘; 以及覆盖半导体芯片，接合线，金属层和电介质层的密封剂。 本发明的特征在于，将具有接合焊盘的迹线设置在芯片焊盘附近以缩短接合线并形成从电介质层突出的金属柱，以避免在现有技术中遇到的焊料桥接。

公开(公告)号：US08304268B2

公开(公告)日：2012-11-06

申请号：US12770059

申请日：2010-04-29

申请人： Pang-Chun Lin ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

发明人： Pang-Chun Lin ,  Chun-Yuan Li ,  Chien-Ping Huang ,  Chun-Chi Ke

IPC分类号： H01L21/44

CPC分类号： H01L23/495 ,  H01L21/4832 ,  H01L23/3107 ,  H01L23/4951 ,  H01L24/48 ,  H01L24/49 ,  H01L2224/48091 ,  H01L2224/48247 ,  H01L2224/49171 ,  H01L2924/00014 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/181 ,  Y10T29/49117 ,  Y10T29/49171 ,  Y10T29/49172 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A fabrication method of a semiconductor package structure includes: patterning a metal plate having first and second surfaces; forming a dielectric layer on the metal plate; forming a metal layer on the first surface and the dielectric layer; forming metal pads on the second surface, the metal layer having a die pad and traces each having a bond pad; mounting a semiconductor chip on the die pad, followed by connecting electrically the semiconductor chip to the bond pads through bonding wires; forming an encapsulant to cover the semiconductor chip and the metal layer; removing portions of the metal plate not covered by the metal pads so as to form metal pillars; and performing a singulation process. The fabrication method is characterized by disposing traces with bond pads close to the die pad to shorten the bonding wires and forming metal pillars protruding from the dielectric layer to avoid solder bridging.

摘要翻译： 半导体封装结构的制造方法包括：图案化具有第一表面和第二表面的金属板; 在所述金属板上形成电介质层; 在所述第一表面和所述电介质层上形成金属层; 在所述第二表面上形成金属焊盘，所述金属层具有管芯焊盘并且各自具有接合焊盘; 将半导体芯片安装在芯片焊盘上，然后通过接合线将半导体芯片电连接到焊盘; 形成密封剂以覆盖半导体芯片和金属层; 去除未被金属垫覆盖的金属板的部分，以形成金属柱; 并执行单独处理。 该制造方法的特征在于，将具有接合焊盘的迹线设置在芯片焊盘附近以缩短接合线并形成从电介质层突出的金属柱，以避免焊料桥接。

公开(公告)号：US20080303134A1

公开(公告)日：2008-12-11

申请号：US12156875

申请日：2008-06-05

申请人： Chun-Yuan Li ,  Hsiao-Jen Hung ,  Chin-Huang Chang ,  Jeng-Yuan Lai

发明人： Chun-Yuan Li ,  Hsiao-Jen Hung ,  Chin-Huang Chang ,  Jeng-Yuan Lai

IPC分类号： H01L23/52 ,  H01L21/02

CPC分类号： H01L21/4832 ,  H01L21/568 ,  H01L21/6835 ,  H01L23/3107 ,  H01L23/49503 ,  H01L23/49548 ,  H01L23/49582 ,  H01L24/27 ,  H01L24/48 ,  H01L2224/48091 ,  H01L2224/73265 ,  H01L2224/85001 ,  H01L2224/85444 ,  H01L2924/00014 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/01322 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/18165 ,  H05K3/341 ,  H05K3/3436 ,  H05K2201/0373 ,  H05K2201/09472 ,  H05K2201/10727 ,  H05K2201/10969 ,  Y02P70/613 ,  H01L2924/3512 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

摘要： A semiconductor package and a method for fabricating the same are disclosed, which includes: providing a carrier board, forming a plurality of metal bumps on the carrier board, forming a metal layer on the carrier board to encapsulate the metal bumps, having at least one semiconductor chip electrically connected to the metal layer, then forming an encapsulant on the carrier board to encapsulate the semiconductor chip, and next removing the carrier board and the metal bumps to correspondingly form a plurality of grooves on surface of the encapsulant, wherein bottom and sides of the grooves are covered with the metal layer to allow electroconductive components to be effectively positioned in the grooves and completely bonded with the metal layer.

摘要翻译： 公开了一种半导体封装及其制造方法，其包括：提供载体板，在载体板上形成多个金属凸块，在载体板上形成金属层以封装金属凸块，具有至少一个 半导体芯片与金属层电连接，然后在载体板上形成密封剂以封装半导体芯片，接着去除载体板和金属凸块，以在密封剂的表面上相应地形成多个凹槽，其中底部和侧面 的沟槽被金属层覆盖以允许导电部件有效地定位在槽中并与金属层完全粘合。