Multi-layer interconnected spiral capacitor

    公开(公告)号:US09653533B2

    公开(公告)日:2017-05-16

    申请号:US14625484

    申请日:2015-02-18

    CPC classification number: H01L28/86 H01G4/33 H01L23/5223 H01L23/642 H01L28/60

    Abstract: An upper planar capacitor is spaced above a lower planar capacitor by a dielectric layer. A bridged-post inter-layer connector couples the capacitances in parallel, through first posts and second posts. The first posts and second posts extend through the dielectric layer, adjacent the upper and lower planar capacitors. A first level coupler extends under the dielectric layer and couples the first posts together and to a conductor of the lower planar capacitor, and couples another conductor of the lower planar capacitor to one of the second posts. A second level coupler extends above the dielectric layer, and couples the second posts together and to a conductor of the upper planar capacitor, and couples another conductor of the upper planar capacitor to one of the first posts.

    INDUCTOR STRUCTURE IN A SEMICONDUCTOR DEVICE
    4.
    发明申请
    INDUCTOR STRUCTURE IN A SEMICONDUCTOR DEVICE 有权
    电感器结构在半导体器件中的应用

    公开(公告)号:US20160372253A1

    公开(公告)日:2016-12-22

    申请号:US14746652

    申请日:2015-06-22

    Abstract: An inductor structure includes a first set of traces corresponding to a first layer of an inductor, a second set of traces corresponding to a second layer of the inductor, and a third set of traces corresponding to a third layer of the inductor that is positioned between the first layer and the second layer. The first set of traces includes a first trace and a second trace that is parallel to the first trace. A dimension of the first trace is different from a corresponding dimension of the second trace. The second set of traces is coupled to the first set of traces. The second set of traces includes a third trace that is coupled to the first trace and to the second trace. The third set of traces is coupled to the first set of traces.

    Abstract translation: 电感器结构包括对应于电感器的第一层的第一组迹线,对应于电感器的第二层的第二组迹线,以及对应于电感器的第三层的第三组迹线,其位于 第一层和第二层。 第一组轨迹包括与第一轨迹平行的第一轨迹和第二轨迹。 第一个跟踪的维度与第二个跟踪的相应维度不同。 第二组迹线耦合到第一组迹线。 第二组迹线包括耦合到第一迹线和第二迹线的第三迹线。 第三组迹线耦合到第一组迹线。

    Embedded package substrate capacitor
    5.
    发明授权
    Embedded package substrate capacitor 有权
    嵌入式封装衬底电容器

    公开(公告)号:US09502490B2

    公开(公告)日:2016-11-22

    申请号:US14283980

    申请日:2014-05-21

    Abstract: A package substrate is provided that includes a core substrate and a capacitor embedded in the core substrate including a first side. The capacitor includes a first electrode and a second electrode disposed at opposite ends of the capacitor. The package also includes a first power supply metal plate extending laterally in the core substrate. The first power supply metal plate is disposed directly on the first electrode of the capacitor from the first side of the core substrate. A first via extending perpendicular to the first metal plate and connected to the first power supply metal plate from the first side of the core substrate.

    Abstract translation: 提供一种封装基板,其包括芯基板和嵌入在包括第一侧的芯基板中的电容器。 电容器包括设置在电容器的相对端的第一电极和第二电极。 封装还包括在芯基板中横向延伸的第一电源金属板。 第一电源金属板从芯基板的第一侧直接设置在电容器的第一电极上。 第一通孔,其垂直于第一金属板延伸并从芯基板的第一侧连接到第一电源金属板。

    KNOWN GOOD DIE TESTING FOR HIGH FREQUENCY APPLICATIONS
    6.
    发明申请
    KNOWN GOOD DIE TESTING FOR HIGH FREQUENCY APPLICATIONS 有权
    已知的高频应用的良好的测试

    公开(公告)号:US20160327590A1

    公开(公告)日:2016-11-10

    申请号:US14703677

    申请日:2015-05-04

    Abstract: Embodiments contained in the disclosure provide a method and apparatus for testing an electronic device. An electronic device is installed in a test socket guide. A pusher tip applies a load to the guided coaxial spring probes and forces contact with pads on the device. Test and ground signals are routed through the device and test socket. The apparatus includes a socket having at least one guided coaxial spring probe pin. A socket guide shim is positioned between the receptacle for the electronic device and the socket. A socket guide aids positioning. A pusher tip is placed on the side opposite that of the guided coaxial spring probe pins. The pusher tip mates with a pusher shim and the pusher spring. A top is then placed on the assembly and acts to compress the pusher spring and engage the guided coaxial spring probe pins with the pads on the device.

    Abstract translation: 本公开内容的实施例提供了一种用于测试电子设备的方法和装置。 电子设备安装在测试插座导轨中。 推动器尖端对被引导的同轴弹簧探针施加负载,并强制与设备上的焊盘接触。 测试和接地信号通过设备和测试插座进行路由。 该装置包括具有至少一个被引导的同轴弹簧探针销的插座。 插座引导垫片位于电子设备的插座和插座之间。 插座导轨辅助定位。 推动器尖端放置在与所引导的同轴弹簧探针的相对侧的一侧。 推杆与推动垫片和推杆弹簧配合。 然后将顶部放置在组件上并且用于压缩推动器弹簧并且将引导的同轴弹簧探针针与装置上的垫接合。

    INTEGRATED DEVICE PACKAGE COMPRISING SILICON BRIDGE IN PHOTO IMAGEABLE LAYER
    10.
    发明申请
    INTEGRATED DEVICE PACKAGE COMPRISING SILICON BRIDGE IN PHOTO IMAGEABLE LAYER 审中-公开
    在照相图像层中包含硅桥的集成设备包

    公开(公告)号:US20160141234A1

    公开(公告)日:2016-05-19

    申请号:US14543560

    申请日:2014-11-17

    Abstract: An integrated device package includes a base portion, a redistribution portion, a first die and a second die. The base portion includes a photo imageable layer, a bridge that is at least partially embedded in the photo imageable layer, and a set of vias in the photo imageable layer. The bridge includes a first set of interconnects comprising a first density. The set of vias includes a second density. The redistribution portion is coupled to base portion. The redistribution portion includes at least one dielectric layer, a second set of interconnects coupled to the first set of interconnects, and a third set of interconnects coupled to the set of vias. The first die is coupled to the redistribution portion. The second die is coupled to the redistribution portion, where the first die and the second die are coupled to each other through an electrical path that includes the bridge.

    Abstract translation: 集成器件封装包括基部,再分配部分,第一管芯和第二管芯。 基部包括可照像图像层,至少部分地嵌入在可照光成像层中的桥以及可照片成像层中的一组通孔。 桥包括包括第一密度的第一组互连。 该组通孔包括第二密度。 再分配部分耦合到基部。 再分配部分包括耦合到第一组互连的至少一个电介质层,第二组互连以及耦合到该组通孔的第三组互连。 第一管芯耦合到再分配部分。 第二管芯耦合到再分配部分,其中第一管芯和第二管芯通过包括桥的电路相互连接。

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