Chip burn-in and test structure and method
    3.
    发明授权
    Chip burn-in and test structure and method 有权
    芯片烧录和测试结构及方法

    公开(公告)号:US5946546A

    公开(公告)日:1999-08-31

    申请号:US218639

    申请日:1998-12-22

    IPC分类号: G01R1/04 G01R31/28 H01L21/66

    摘要: A burn-in frame having at least one window and including resistors having resistor pads is situated on a flexible layer, and at least one integrated circuit chip having chip pads is situated in the at least one window. Via openings are formed in the flexible layer to extend to the chip pads and the resistor pads. A pattern of electrical conductors is applied over the flexible layer and extending into the vias. The at least one integrated circuit chip is burned in. The burn-in frame may further include fuses, frame contacts, and voltage bias tracks. After burning in the at least one integrated circuit chip, the chip pads can be electrically isolated and the at least one integrated circuit chip can be tested. This method can also be used to burn-in and test multichip modules.

    摘要翻译: 具有至少一个窗口并且包括具有电阻器焊盘的电阻器的老化框架位于柔性层上,并且至少一个具有芯片焊盘的集成电路芯片位于该至少一个窗口中。 在柔性层中形成通孔以延伸到芯片焊盘和电阻焊盘。 电导体的图案施加在柔性层上并延伸到通孔中。 该至少一个集成电路芯片被烧毁。老化框架还可以包括熔断器,框架触点和电压偏置轨道。 在至少一个集成电路芯片中燃烧之后,芯片焊盘可以是电隔离的,并且可以测试至少一个集成电路芯片。 该方法也可用于老化和测试多芯片模块。