公开(公告)号：US20160247785A1

公开(公告)日：2016-08-25

申请号：US15146811

申请日：2016-05-04

Applicant: Intel Corporation

Inventor： Michael P. Skinner ,  Teodora Ossiander ,  Sven Albers ,  Georg Seidemann

IPC: H01L25/065 ,  H01L25/00

CPC classification number: H01L25/0657 ,  H01F7/04 ,  H01L23/32 ,  H01L23/49811 ,  H01L23/49866 ,  H01L24/13 ,  H01L24/16 ,  H01L24/81 ,  H01L25/50 ,  H01L2224/10135 ,  H01L2224/10165 ,  H01L2224/11332 ,  H01L2224/11522 ,  H01L2224/132 ,  H01L2224/13298 ,  H01L2224/13355 ,  H01L2224/13357 ,  H01L2224/1336 ,  H01L2224/13444 ,  H01L2224/13464 ,  H01L2224/13469 ,  H01L2224/1601 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/811 ,  H01L2224/81139 ,  H01L2224/8114 ,  H01L2224/81193 ,  H01L2225/06513 ,  H01L2225/06527 ,  H01L2225/06531 ,  H01L2225/06568 ,  H01L2225/06593 ,  H01L2225/06596 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/207 ,  H01L2924/00012

Abstract: Embodiments of the present disclosure are directed to integrated circuit (IC) package assemblies with magnetic contacts, as well as corresponding fabrication methods and systems incorporating such magnetic contacts. A first IC substrate may have a first magnet coupled with a first electrical routing feature. A second IC substrate may have a second magnet coupled with a second electrical routing feature. The magnets may be embedded in the IC substrates and/or electrical routing features. The magnets may generate a magnetic field that extends across a gap between the first and second electrical routing features. Electrically conductive magnetic particles may be applied to one or both of the IC substrates to form a magnetic interconnect structure that extends across the gap. In some embodiments, magnetic contacts may be demagnetized by heating the magnets to a corresponding partial demagnetization temperature (PDT) or Curie temperature. Other embodiments may be described and/or claimed.

公开(公告)号：US20170103956A1

公开(公告)日：2017-04-13

申请号：US15294499

申请日：2016-10-14

Applicant: Intel Corporation

Inventor： Thorsten Meyer ,  Gerald Ofner ,  Teodora Ossiander ,  Frank Zudock ,  Christian Geissler

IPC: H01L23/00 ,  H01L21/02 ,  H01L21/768 ,  H01L21/311

CPC classification number: H01L24/11 ,  H01L21/02282 ,  H01L21/02318 ,  H01L21/311 ,  H01L21/31111 ,  H01L21/31116 ,  H01L21/76802 ,  H01L21/76834 ,  H01L21/7685 ,  H01L21/76871 ,  H01L23/525 ,  H01L24/02 ,  H01L24/03 ,  H01L24/05 ,  H01L24/13 ,  H01L24/16 ,  H01L24/19 ,  H01L24/20 ,  H01L24/81 ,  H01L24/94 ,  H01L2224/02311 ,  H01L2224/02313 ,  H01L2224/02331 ,  H01L2224/0345 ,  H01L2224/03462 ,  H01L2224/0361 ,  H01L2224/0381 ,  H01L2224/03914 ,  H01L2224/0401 ,  H01L2224/05083 ,  H01L2224/05144 ,  H01L2224/05147 ,  H01L2224/05164 ,  H01L2224/05166 ,  H01L2224/05171 ,  H01L2224/05548 ,  H01L2224/12105 ,  H01L2224/13022 ,  H01L2224/131 ,  H01L2224/16227 ,  H01L2224/211 ,  H01L2224/8112 ,  H01L2224/81191 ,  H01L2224/81801 ,  H01L2224/821 ,  H01L2224/82105 ,  H01L2224/94 ,  H01L2924/01022 ,  H01L2924/01024 ,  H01L2924/01029 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/12042 ,  H01L2924/143 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/01074 ,  H01L2224/03

Abstract: Embodiments of the present disclosure are directed towards a method of assembling an integrated circuit package. In embodiments the method may include providing a wafer having an unpatterned passivation layer to prevent corrosion of metal conductors embedded in the wafer. The method may further include laminating a dielectric material on the passivation layer to form a dielectric layer and selectively removing dielectric material to form voids in the dielectric layer. These voids may reveal portions of the passivation layer disposed over the metal conductors. The method may then involve removing the portions of the passivation layer to reveal the metal conductors. Other embodiments may be described and/or claimed.

公开(公告)号：US09601468B2

公开(公告)日：2017-03-21

申请号：US15146811

申请日：2016-05-04

Applicant: Intel Corporation

Inventor： Michael P. Skinner ,  Teodora Ossiander ,  Sven Albers ,  Georg Seidemann

IPC: H01F7/04 ,  H01L25/065 ,  H01L23/32 ,  H01L23/498 ,  H01L25/00 ,  H01L23/00

CPC classification number: H01L25/0657 ,  H01F7/04 ,  H01L23/32 ,  H01L23/49811 ,  H01L23/49866 ,  H01L24/13 ,  H01L24/16 ,  H01L24/81 ,  H01L25/50 ,  H01L2224/10135 ,  H01L2224/10165 ,  H01L2224/11332 ,  H01L2224/11522 ,  H01L2224/132 ,  H01L2224/13298 ,  H01L2224/13355 ,  H01L2224/13357 ,  H01L2224/1336 ,  H01L2224/13444 ,  H01L2224/13464 ,  H01L2224/13469 ,  H01L2224/1601 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/811 ,  H01L2224/81139 ,  H01L2224/8114 ,  H01L2224/81193 ,  H01L2225/06513 ,  H01L2225/06527 ,  H01L2225/06531 ,  H01L2225/06568 ,  H01L2225/06593 ,  H01L2225/06596 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/207 ,  H01L2924/00012

Abstract: Embodiments of the present disclosure are directed to integrated circuit (IC) package assemblies with magnetic contacts, as well as corresponding fabrication methods and systems incorporating such magnetic contacts. A first IC substrate may have a first magnet coupled with a first electrical routing feature. A second IC substrate may have a second magnet coupled with a second electrical routing feature. The magnets may be embedded in the IC substrates and/or electrical routing features. The magnets may generate a magnetic field that extends across a gap between the first and second electrical routing features. Electrically conductive magnetic particles may be applied to one or both of the IC substrates to form a magnetic interconnect structure that extends across the gap. In some embodiments, magnetic contacts may be demagnetized by heating the magnets to a corresponding partial demagnetization temperature (PDT) or Curie temperature. Other embodiments may be described and/or claimed.

公开(公告)号：US20180150156A1

公开(公告)日：2018-05-31

申请号：US15879729

申请日：2018-01-25

Applicant: Intel Corporation

Inventor： Sven Albers ,  Klaus Reingruber ,  Teodora Ossiander ,  Andreas Wolter ,  Sonja Koller ,  Georg Seidemann ,  Jan Proschwitz ,  Hans-Joachim Barth ,  Bastiaan Elshof

IPC: G06F3/044 ,  G06F3/045 ,  G06F3/042 ,  G01L1/24 ,  G06F3/0354 ,  G06F3/038 ,  H04B1/3827 ,  G06F1/16

CPC classification number: G06F3/044 ,  G01L1/24 ,  G06F1/163 ,  G06F3/03547 ,  G06F3/038 ,  G06F3/042 ,  G06F3/045 ,  G06F2203/04102 ,  G06F2203/04109 ,  H04B1/385

Abstract: Some forms relate to wearable computing devices that include a “touch pad” like interface. In some forms, the example wearable computing devices may be integrated with (or attached to) textiles (i.e. clothing). In other forms, the example wearable computing devices may be attached directly to the skin of someone (i.e., similar to a bandage) that utilizes any of the example wearable computing devices. The example wearable computing devices include a flexible touch pad that may allow a user of the wearable computing device to more easily operate the wearable computing device. The example wearable computing devices described herein may include a variety of electronics. Some examples include a power supply and/or a communication device among other types of electronics.

公开(公告)号：US09472515B2

公开(公告)日：2016-10-18

申请号：US14205093

申请日：2014-03-11

Applicant: INTEL CORPORATION

Inventor： Thorsten Meyer ,  Gerald Ofner ,  Teodora Ossiander ,  Frank Zudock ,  Christian Geissler

IPC: H01L23/48 ,  H01L23/00 ,  H01L23/525

CPC classification number: H01L24/11 ,  H01L21/02282 ,  H01L21/02318 ,  H01L21/311 ,  H01L21/31111 ,  H01L21/31116 ,  H01L21/76802 ,  H01L21/76834 ,  H01L21/7685 ,  H01L21/76871 ,  H01L23/525 ,  H01L24/02 ,  H01L24/03 ,  H01L24/05 ,  H01L24/13 ,  H01L24/16 ,  H01L24/19 ,  H01L24/20 ,  H01L24/81 ,  H01L24/94 ,  H01L2224/02311 ,  H01L2224/02313 ,  H01L2224/02331 ,  H01L2224/0345 ,  H01L2224/03462 ,  H01L2224/0361 ,  H01L2224/0381 ,  H01L2224/03914 ,  H01L2224/0401 ,  H01L2224/05083 ,  H01L2224/05144 ,  H01L2224/05147 ,  H01L2224/05164 ,  H01L2224/05166 ,  H01L2224/05171 ,  H01L2224/05548 ,  H01L2224/12105 ,  H01L2224/13022 ,  H01L2224/131 ,  H01L2224/16227 ,  H01L2224/211 ,  H01L2224/8112 ,  H01L2224/81191 ,  H01L2224/81801 ,  H01L2224/821 ,  H01L2224/82105 ,  H01L2224/94 ,  H01L2924/01022 ,  H01L2924/01024 ,  H01L2924/01029 ,  H01L2924/01046 ,  H01L2924/01079 ,  H01L2924/12042 ,  H01L2924/143 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/01074 ,  H01L2224/03

Abstract: Embodiments of the present disclosure are directed towards a method of assembling an integrated circuit package. In embodiments the method may include providing a wafer having an unpatterned passivation layer to prevent corrosion of metal conductors embedded in the wafer. The method may further include laminating a dielectric material on the passivation layer to form a dielectric layer and selectively removing dielectric material to form voids in the dielectric layer. These voids may reveal portions of the passivation layer disposed over the metal conductors. The method may then involve removing the portions of the passivation layer to reveal the metal conductors. Other embodiments may be described and/or claimed.

Abstract translation: 本公开的实施例涉及组装集成电路封装的方法。 在实施例中，该方法可以包括提供具有未图案化钝化层的晶片以防止嵌入晶片中的金属导体的腐蚀。 该方法还可以包括将绝缘材料层压在钝化层上以形成电介质层，并选择性地去除电介质材料以在电介质层中形成空隙。 这些空隙可以露出设置在金属导体上的钝化层的部分。 该方法可以包括去除钝化层的部分以露出金属导体。 可以描述和/或要求保护其他实施例。

公开(公告)号：US09343389B2

公开(公告)日：2016-05-17

申请号：US14827056

申请日：2015-08-14

Applicant: INTEL CORPORATION

Inventor： Michael P. Skinner ,  Teodora Ossiander ,  Sven Albers ,  Georg Seidemann

IPC: H01L23/32 ,  H01L23/498 ,  H01L25/065 ,  H01L25/00 ,  H01L23/00

CPC classification number: H01L25/0657 ,  H01F7/04 ,  H01L23/32 ,  H01L23/49811 ,  H01L23/49866 ,  H01L24/13 ,  H01L24/16 ,  H01L24/81 ,  H01L25/50 ,  H01L2224/10135 ,  H01L2224/10165 ,  H01L2224/11332 ,  H01L2224/11522 ,  H01L2224/132 ,  H01L2224/13298 ,  H01L2224/13355 ,  H01L2224/13357 ,  H01L2224/1336 ,  H01L2224/13444 ,  H01L2224/13464 ,  H01L2224/13469 ,  H01L2224/1601 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/811 ,  H01L2224/81139 ,  H01L2224/8114 ,  H01L2224/81193 ,  H01L2225/06513 ,  H01L2225/06527 ,  H01L2225/06531 ,  H01L2225/06568 ,  H01L2225/06593 ,  H01L2225/06596 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/207 ,  H01L2924/00012

Abstract: Embodiments of the present disclosure are directed to integrated circuit (IC) package assemblies with magnetic contacts, as well as corresponding fabrication methods and systems incorporating such magnetic contacts. A first IC substrate may have a first magnet coupled with a first electrical routing feature. A second IC substrate may have a second magnet coupled with a second electrical routing feature. The magnets may be embedded in the IC substrates and/or electrical routing features. The magnets may generate a magnetic field that extends across a gap between the first and second electrical routing features. Electrically conductive magnetic particles may be applied to one or both of the IC substrates to form a magnetic interconnect structure that extends across the gap. In some embodiments, magnetic contacts may be demagnetized by heating the magnets to a corresponding partial demagnetization temperature (PDT) or Curie temperature. Other embodiments may be described and/or claimed.

公开(公告)号：US20150357311A1

公开(公告)日：2015-12-10

申请号：US14827056

申请日：2015-08-14

Applicant: INTEL CORPORATION

Inventor： Michael P. Skinner ,  Teodora Ossiander ,  Sven Albers ,  Georg Seidemann

IPC: H01L25/065

CPC classification number: H01L25/0657 ,  H01F7/04 ,  H01L23/32 ,  H01L23/49811 ,  H01L23/49866 ,  H01L24/13 ,  H01L24/16 ,  H01L24/81 ,  H01L25/50 ,  H01L2224/10135 ,  H01L2224/10165 ,  H01L2224/11332 ,  H01L2224/11522 ,  H01L2224/132 ,  H01L2224/13298 ,  H01L2224/13355 ,  H01L2224/13357 ,  H01L2224/1336 ,  H01L2224/13444 ,  H01L2224/13464 ,  H01L2224/13469 ,  H01L2224/1601 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/811 ,  H01L2224/81139 ,  H01L2224/8114 ,  H01L2224/81193 ,  H01L2225/06513 ,  H01L2225/06527 ,  H01L2225/06531 ,  H01L2225/06568 ,  H01L2225/06593 ,  H01L2225/06596 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/207 ,  H01L2924/00012

Abstract: Embodiments of the present disclosure are directed to integrated circuit (IC) package assemblies with magnetic contacts, as well as corresponding fabrication methods and systems incorporating such magnetic contacts. A first IC substrate may have a first magnet coupled with a first electrical routing feature. A second IC substrate may have a second magnet coupled with a second electrical routing feature. The magnets may be embedded in the IC substrates and/or electrical routing features. The magnets may generate a magnetic field that extends across a gap between the first and second electrical routing features. Electrically conductive magnetic particles may be applied to one or both of the IC substrates to form a magnetic interconnect structure that extends across the gap. In some embodiments, magnetic contacts may be demagnetized by heating the magnets to a corresponding partial demagnetization temperature (PDT) or Curie temperature. Other embodiments may be described and/or claimed.

公开(公告)号：US09921694B2

公开(公告)日：2018-03-20

申请号：US14778142

申请日：2014-12-16

Applicant: Intel Corporation

Inventor： Sven Albers ,  Klaus Reingruber ,  Teodora Ossiander ,  Andreas Wolter ,  Sonja Koller ,  Georg Seidemann ,  Jan Proschwitz ,  Hans-Joachim Barth ,  Bastiaan Elshof

IPC: G09G5/00 ,  G06F3/044 ,  H04B1/3827 ,  G01L1/24 ,  G06F1/16 ,  G06F3/038 ,  G06F3/042 ,  G06F3/045 ,  G06F3/0354

CPC classification number: G06F3/044 ,  G01L1/24 ,  G06F1/163 ,  G06F3/03547 ,  G06F3/038 ,  G06F3/042 ,  G06F3/045 ,  G06F2203/04102 ,  G06F2203/04109 ,  H04B1/385

Abstract: Some forms relate to wearable computing devices that include a “touch pad” like interface. In some forms, the example wearable computing devices may be integrated with (or attached to) textiles (i.e. clothing). In other forms, the example wearable computing devices may be attached directly to the skin of someone (i.e., similar to a bandage) that utilizes any of the example wearable computing devices. The example wearable computing devices include a flexible touch pad that may allow a user of the wearable computing device to more easily operate the wearable computing device. The example wearable computing devices described herein may include a variety of electronics. Some examples include a power supply and/or a communication device among other types of electronics.

公开(公告)号：US09142475B2

公开(公告)日：2015-09-22

申请号：US13965746

申请日：2013-08-13

Applicant: INTEL CORPORATION

Inventor： Michael P. Skinner ,  Teodora Ossiander ,  Sven Albers ,  Georg Seidemann

IPC: H01L23/32 ,  H01L23/498 ,  H01L25/065 ,  H01L25/00

CPC classification number: H01L25/0657 ,  H01F7/04 ,  H01L23/32 ,  H01L23/49811 ,  H01L23/49866 ,  H01L24/13 ,  H01L24/16 ,  H01L24/81 ,  H01L25/50 ,  H01L2224/10135 ,  H01L2224/10165 ,  H01L2224/11332 ,  H01L2224/11522 ,  H01L2224/132 ,  H01L2224/13298 ,  H01L2224/13355 ,  H01L2224/13357 ,  H01L2224/1336 ,  H01L2224/13444 ,  H01L2224/13464 ,  H01L2224/13469 ,  H01L2224/1601 ,  H01L2224/16225 ,  H01L2224/16227 ,  H01L2224/811 ,  H01L2224/81139 ,  H01L2224/8114 ,  H01L2224/81193 ,  H01L2225/06513 ,  H01L2225/06527 ,  H01L2225/06531 ,  H01L2225/06568 ,  H01L2225/06593 ,  H01L2225/06596 ,  H01L2924/014 ,  H01L2924/00014 ,  H01L2924/207 ,  H01L2924/00012

Abstract: Embodiments of the present disclosure are directed to integrated circuit (IC) package assemblies with magnetic contacts, as well as corresponding fabrication methods and systems incorporating such magnetic contacts. A first IC substrate may have a first magnet coupled with a first electrical routing feature. A second IC substrate may have a second magnet coupled with a second electrical routing feature. The magnets may be embedded in the IC substrates and/or electrical routing features. The magnets may generate a magnetic field that extends across a gap between the first and second electrical routing features. Electrically conductive magnetic particles may be applied to one or both of the IC substrates to form a magnetic interconnect structure that extends across the gap. In some embodiments, magnetic contacts may be demagnetized by heating the magnets to a corresponding partial demagnetization temperature (PDT) or Curie temperature. Other embodiments may be described and/or claimed.

Abstract translation: 本公开的实施例涉及具有磁性触点的集成电路（IC）封装组件，以及包含这种磁性触点的对应的制造方法和系统。 第一IC基板可以具有与第一电路径特征耦合的第一磁体。 第二IC基板可以具有与第二电路径特征耦合的第二磁体。 磁体可以嵌入在IC基板和/或电路径特征中。 磁体可以产生延伸穿过第一和第二电路由特征之间的间隙的磁场。 可以将导电磁性颗粒施加到IC基板中的一个或两个以形成跨越间隙延伸的磁互连结构。 在一些实施例中，通过将磁体加热到对应的部分退磁温度（PDT）或居里温度，磁接触件可以去磁。 可以描述和/或要求保护其他实施例。

公开(公告)号：US10157869B2

公开(公告)日：2018-12-18

申请号：US15294499

申请日：2016-10-14

Applicant: Intel Corporation

Inventor： Thorsten Meyer ,  Gerald Ofner ,  Teodora Ossiander ,  Frank Zudock ,  Christian Geissler

IPC: H01L21/00 ,  H01L23/00 ,  H01L21/02 ,  H01L21/311 ,  H01L21/768 ,  H01L23/525

Abstract: Embodiments of the present disclosure are directed towards a method of assembling an integrated circuit package. In embodiments the method may include providing a wafer having an unpatterned passivation layer to prevent corrosion of metal conductors embedded in the wafer. The method may further include laminating a dielectric material on the passivation layer to form a dielectric layer and selectively removing dielectric material to form voids in the dielectric layer. These voids may reveal portions of the passivation layer disposed over the metal conductors. The method may then involve removing the portions of the passivation layer to reveal the metal conductors. Other embodiments may be described and/or claimed.