Apparatus for improving stencil/screen print quality
    91.
    发明申请
    Apparatus for improving stencil/screen print quality 审中-公开
    提高模板/丝网印刷质量的设备

    公开(公告)号:US20050145169A1

    公开(公告)日:2005-07-07

    申请号:US10630544

    申请日:2003-07-29

    Abstract: A method and apparatus for improved stencil/screen print quality is disclosed. The stencil or screen assists in application of a printable material onto a substrate, such as an adhesive to a semiconductor die of a semiconductor wafer during a lead-on-chip (LOC) packaging process. In one embodiment, the stencil includes a coating applied to at least one surface of a pattern of the stencil or screen to retard running of the printable material onto the surface. In another embodiment, the stencil or screen includes a second coating applied to at least one other surface of the pattern to promote spreading of the printable material onto the substrate.

    Abstract translation: 公开了一种用于改进模板/丝网印刷质量的方法和装置。 在片上(LOC)包装过程中,模板或屏幕有助于将可印刷材料施加到基板上,例如到半导体晶片的半导体管芯的粘合剂。 在一个实施例中,模板包括施加到模板或筛网的图案的至少一个表面上的涂层,以延迟可印刷材料在表面上的运行。 在另一个实施例中,模板或丝网包括施加到图案的至少一个其他表面的第二涂层,以促进可印刷材料在基底上的铺展。

    Microelectronic package with reduced underfill and methods for forming such packages
    92.
    发明授权
    Microelectronic package with reduced underfill and methods for forming such packages 有权
    具有减少底部填料的微电子封装和形成这种封装的方法

    公开(公告)号:US06900080B2

    公开(公告)日:2005-05-31

    申请号:US10925505

    申请日:2004-08-24

    Abstract: A microelectronic package and method for manufacture. The package can include a support member and a microelectronic substrate positioned at least proximate to the support member. The microelectronic substrate can have a first surface and a second surface facing opposite the first surface, with the first surface having an outer edge and facing toward the support member. At least a portion of the first surface can be spaced apart from an interior surface of the support member to define an intermediate region. At least one conductive coupler is coupled between the microelectronic substrate and the support member. A generally electrically non-conductive material is positioned in the intermediate region with the material contacting the support member and the first surface of the microelectronic substrate and having an outer surface recessed inwardly from the outer edge of the microelectronic substrate.

    Abstract translation: 一种微电子封装及其制造方法。 封装可以包括支撑构件和至少邻近支撑构件定位的微电子衬底。 微电子衬底可以具有第一表面和与第一表面相对的第二表面,其中第一表面具有外边缘并面向支撑构件。 第一表面的至少一部分可以与支撑构件的内表面间隔开以限定中间区域。 至少一个导电耦合器耦合在微电子衬底和支撑构件之间。 通常不导电的材料定位在中间区域中,其中材料与微电子衬底的支撑构件和第一表面接触,并且具有从微电子衬底的外边缘向内凹陷的外表面。

    Semiconductor packages and methods for making the same
    94.
    发明授权
    Semiconductor packages and methods for making the same 失效
    半导体封装及其制造方法

    公开(公告)号:US06891108B2

    公开(公告)日:2005-05-10

    申请号:US09971985

    申请日:2001-10-04

    Abstract: Semiconductor package support elements including cover members attached to one or more reject die sites. Also, methods for making the support elements and for making semiconductor packages using the same. Reject die sites on defective substrates of a support element are covered prior to the encapsulation process using a cover member. The cover member comprises, for example, pressure-sensitive or temperature-activated tape, reject dies, or the like. The support elements and methods of the present invention virtually eliminate bleeding or flashing during encapsulation due to the presence of reject die sites. The support elements and methods of the present invention further ensure that functional dice are not sacrificed by being attached to reject die sites, thereby decreasing manufacturing costs while increasing yield of functional semiconductor packages.

    Abstract translation: 半导体封装支撑元件包括附接到一个或多个废弃模具位置的盖构件。 而且,制造支撑元件的方法以及使用该支撑元件制造半导体封装的方法。 在使用盖构件的封装工艺之前,覆盖支撑元件的有缺陷的基底上的模具位置。 盖构件包括例如压敏或温度活化的带,废模或类似物。 本发明的支撑元件和方法由于存在废弃模具位置而实际上消除了在封装期间的渗出或闪烁。 本发明的支撑元件和方法进一步确保功能性骰子不会被附着到废弃模具位置而牺牲,从而降低制造成本,同时提高功能性半导体封装的产量。

    Method of selectively adjusting surface tension of soldermask material
    95.
    发明授权
    Method of selectively adjusting surface tension of soldermask material 有权
    选择性调节焊膏材料表面张力的方法

    公开(公告)号:US06889430B2

    公开(公告)日:2005-05-10

    申请号:US10020352

    申请日:2001-12-12

    Abstract: A method of selectively adjusting surface tension of a soldermask material. Specifically, a method of selectively adjusting the surface tension of a soldermask material to promote adhesion of a molding compound in a ball grid array package while maintaining a low surface tension on the ball attach area to prevent bridging between the solder balls. Solder balls require a low surface tension soldermask to minimize bridging, while the molding compound requires a high surface tension to provide adequate adhesion to the surface of the soldermask. By exposing selected portions of the soldermask to an activation method, such as ultra-violet radiation, the surface tension of the soldermask can be varied such that different areas of the package exhibit different surface tensions.

    Abstract translation: 选择性地调节焊接材料的表面张力的方法。 具体地说,可以选择性地调节焊料材料的表面张力以促进模塑料在球栅阵列封装中的粘附,同时保持球附着区域上的低表面张力以防止焊球之间的桥接。 焊球需要低表面张力焊接掩模以最小化桥接,而模塑料需要高表面张力以提供对焊接表面的足够的粘附。 通过将焊接掩模的选定部分暴露于诸如紫外辐射的激活方法,可以改变焊接掩模的表面张力,使得封装的不同区域表现出不同的表面张力。

    Method for in-line testing of flip-chip semiconductor assemblies
    97.
    发明申请
    Method for in-line testing of flip-chip semiconductor assemblies 失效
    倒装芯片半导体组件的在线测试方法

    公开(公告)号:US20050007142A1

    公开(公告)日:2005-01-13

    申请号:US10900771

    申请日:2004-07-27

    CPC classification number: G01R1/0483 Y10T29/4913 Y10T29/49144

    Abstract: Flip-chip semiconductor assemblies, each including integrated circuit (IC) dice and an associated substrate, are electrically tested before encapsulation using an in-line or in-situ test socket or probes at a die-attach station. Those assemblies using “wet” quick-cure epoxies for die attachment may be tested prior to the epoxy being cured by pressing the integrated circuit (IC) dice against interconnection points on the substrate for electrical connection, while those assemblies using “dry” epoxies may be cured prior to testing. In either case, any failures in the dice or in the interconnections between the dice and the substrates can be easily fixed, and the need for the use of known-good-die (KGD) rework procedures during repair is eliminated.

    Abstract translation: 每个包括集成电路(IC)裸片和相关衬底的倒装芯片半导体组件在封装之前使用在线或原位测试插座或芯片附接站的探针进行电测试。 在通过将集成电路(IC)芯片压在基板上的互连点以进行电连接的环氧树脂固化之前,可以测试使用“湿”快速固化环氧树脂进行芯片附接的那些组件,而使用“干”环氧树脂的那些组件 在测试之前进行治愈。 在任一种情况下,骰子或骰子与基板之间的互连中的任何故障都可以很容易地固定,并且消除了在维修期间使用已知好模具(KGD)返工程序的需要。

    Thermally conductive adhesive tape for semiconductor devices and method for using the same
    100.
    发明授权
    Thermally conductive adhesive tape for semiconductor devices and method for using the same 有权
    用于半导体器件的导热胶带及其使用方法

    公开(公告)号:US06737299B1

    公开(公告)日:2004-05-18

    申请号:US09665430

    申请日:2000-09-19

    Applicant: Tongbi Jiang

    Inventor: Tongbi Jiang

    Abstract: A thermally conductive adhesive tape and method for its use in packaging integrated circuits fabricated on semiconductor material. The thermally conductive adhesive tape includes a thermally conductive base upon which an adhesive layer is laminated or coated onto at least one side of the thermally conductive base. Thermal energy generated by operating the integrated circuit may be transferred from the integrated circuit via the thermally conductive adhesive tape to a medium to which the semiconductor material is attached. As a result, any excessive heat that may negatively affect the performance of the integrated circuit is dissipated through the medium.

    Abstract translation: 一种导热胶带及其用于封装在半导体材料上制造的集成电路的方法。 导热性粘合带包括导热性基材,粘合剂层层叠或涂覆在导热性基材的至少一面上。 通过操作集成电路产生的热能可以从集成电路经由导热胶带转移到附接有半导体材料的介质。 因此,可能会对集成电路的性能产生负面影响的任何过热消散通过介质。

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