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公开(公告)号:US11373972B2
公开(公告)日:2022-06-28
申请号:US16902887
申请日:2020-06-16
Applicant: Intel Corporation
Inventor: Omkar G. Karhade , Nitin A. Deshpande , Mohit Bhatia , Anurag Tripathi , Takeshi Nakazawa , Steve Cho
IPC: H01L23/538 , H01L23/00
Abstract: Disclosed herein are microelectronic structures including bridges, as well as related assemblies and methods. In some embodiments, a microelectronic structure may include a substrate and a bridge.
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公开(公告)号:US20210391295A1
公开(公告)日:2021-12-16
申请号:US16902927
申请日:2020-06-16
Applicant: Intel Corporation
Inventor: Omkar G. Karhade , Nitin A. Deshpande , Mohit Bhatia , Sairam Agraharam , Edvin Cetegen , Anurag Tripathi , Malavarayan Sankarasubramanian , Jan Krajniak , Manish Dubey , Jinhe Liu , Wei Li , Jingyi Huang
IPC: H01L23/00 , H01L23/538 , H01L23/498
Abstract: Disclosed herein are microelectronic structures including bridges, as well as related assemblies and methods. In some embodiments, a microelectronic structure may include a substrate and a bridge.
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公开(公告)号:US11114388B2
公开(公告)日:2021-09-07
申请号:US16280993
申请日:2019-02-20
Applicant: INTEL CORPORATION
Inventor: Eric J. Li , Guotao Wang , Huiyang Fei , Sairam Agraharam , Omkar G. Karhade , Nitin A. Deshpande
Abstract: Techniques for reducing warpage for microelectronic packages are provided. A warpage control layer or stiffener can be attached to a bottom surface of a substrate or layer that is used to attach the microelectronics package to a motherboard. The warpage control layer can have a thickness approximately equal to a thickness of a die of the microelectronics package. A coefficient of thermal expansion of the warpage control layer can be selected to approximately match a CTE of the die. The warpage control layer can be formed from an insulating material or a metallic material. The warpage control layer can comprise multiple materials and can include copper pillar segments to adjust the effective CTE of the warpage control layer. The warpage control layer can be positioned between the microelectronics package and the motherboard, thereby providing warpage control without contributing to the z-height of the microelectronics package.
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公开(公告)号:US20210272905A1
公开(公告)日:2021-09-02
申请号:US16804835
申请日:2020-02-28
Applicant: Intel Corporation
Inventor: Omkar G. Karhade , Debendra Mallik , Nitin A. Deshpande , Amruthavalli Pallavi Alur
IPC: H01L23/538 , H01L23/13 , H01L23/522 , H01L23/498 , H01L23/00
Abstract: Embodiments may relate to a microelectronic package that includes a substrate with a cavity therein. A component may be positioned within the substrate, and exposed by the cavity. A solder bump may be positioned within the cavity and coupled with the component, and a bridge die may be coupled with the solder bump. Other embodiments may be described or claimed.
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公开(公告)号:US10797000B2
公开(公告)日:2020-10-06
申请号:US16254126
申请日:2019-01-22
Applicant: INTEL CORPORATION
Inventor: Nitin A. Deshpande , Omkar G. Karhade
IPC: H01L23/538 , H01L25/065 , H01L25/00 , H01L23/13 , H01L23/522 , H01L21/48 , H01L23/00
Abstract: A microelectronic structure includes a substrate having a first surface and a cavity extending into the substrate from the substrate first surface, a first microelectronic device and a second microelectronic device attached to the substrate first surface, and a bridge disposed within the substrate cavity and attached to the first microelectronic device and to the second microelectronic device. The bridge includes a plurality conductive vias extending from a first surface to an opposing second surface of the bridge, wherein the conductive vias are electrically coupled to deliver electrical signals from the substrate to the first microelectronic device and the second microelectronic device. The bridge further creates at least one electrical signal connection between the first microelectronic device and the second microelectronic device.
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公开(公告)号:US10403512B2
公开(公告)日:2019-09-03
申请号:US15899222
申请日:2018-02-19
Applicant: Intel Corporation
Inventor: Omkar G. Karhade , Nitin A. Deshpande , Debendra Mallik , Bassam M. Ziadeh , Yoshihiro Tomita
Abstract: Embodiments of the invention include device packages and methods of forming such packages. In an embodiment, the method of forming a device package may comprise forming a reinforcement layer over a substrate. One or more openings may be formed through the reinforcement layer. In an embodiment, a device die may be placed into one of the openings. The device die may be bonded to the substrate by reflowing one or more solder bumps positioned between the device die and the substrate. Embodiments of the invention may include a molded reinforcement layer. Alternative embodiments include a reinforcement layer that is adhered to the surface of the substrate with an adhesive layer.
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公开(公告)号:US10068852B2
公开(公告)日:2018-09-04
申请号:US15636117
申请日:2017-06-28
Applicant: Intel Corporation
Inventor: Ravindranath V. Mahajan , Christopher J. Nelson , Omkar G. Karhade , Feras Eid , Nitin A. Deshpande , Shawna M. Liff
IPC: H01L23/538 , H01L25/065 , H01L23/367 , H01L23/31
Abstract: Embodiments of the present disclosure are directed towards an integrated circuit (IC) package having first and second dies with first and second input/output (I/O) interconnect structures, respectively. The IC package may include a bridge having first and second electrical routing features coupled to a portion of the first and second I/O interconnect structures, respectively. In embodiments, the first and second electrical routing features may be disposed on one side of the bridge; and third electrical routing features may be disposed on an opposite side. The first and second electrical routing features may be configured to route electrical signals between the first die and the second die and the third electrical routing features may be configured to route electrical signals between the one side and the opposite side. The first die, the second die, and the bridge may be embedded in electrically insulating material. Other embodiments may be described and/or claimed.
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公开(公告)号:US09899238B2
公开(公告)日:2018-02-20
申请号:US14576166
申请日:2014-12-18
Applicant: Intel Corporation
Inventor: Omkar G. Karhade , Nitin A. Deshpande , Debendra Mallik , Bassam M. Ziadeh , Yoshihiro Tomita
IPC: H01L23/00 , H01L21/56 , H01L25/00 , H01L25/065 , H01L25/18
CPC classification number: H01L21/563 , H01L24/13 , H01L24/16 , H01L24/73 , H01L24/81 , H01L24/83 , H01L24/92 , H01L24/97 , H01L25/0657 , H01L25/18 , H01L25/50 , H01L2224/0401 , H01L2224/13082 , H01L2224/131 , H01L2224/13124 , H01L2224/13144 , H01L2224/13147 , H01L2224/16145 , H01L2224/16227 , H01L2224/26175 , H01L2224/73204 , H01L2224/81011 , H01L2224/81191 , H01L2224/81192 , H01L2224/81203 , H01L2224/81211 , H01L2224/81815 , H01L2224/83192 , H01L2224/92125 , H01L2224/97 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2225/06568 , H01L2924/1434 , H01L2924/15311 , H01L2924/1579 , H01L2924/2064 , H01L2924/3511 , H01L2224/81 , H01L2224/83 , H01L2924/014 , H01L2924/00014
Abstract: Embodiments of the invention include device packages and methods of forming such packages. In an embodiment, the method of forming a device package may comprise forming a reinforcement layer over a substrate. One or more openings may be formed through the reinforcement layer. In an embodiment, a device die may be placed into one of the openings. The device die may be bonded to the substrate by reflowing one or more solder bumps positioned between the device die and the substrate. Embodiments of the invention may include a molded reinforcement layer. Alternative embodiments include a reinforcement layer that is adhered to the surface of the substrate with an adhesive layer.
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公开(公告)号:US09754890B2
公开(公告)日:2017-09-05
申请号:US15114036
申请日:2014-02-26
Applicant: INTEL CORPORATION
Inventor: Nitin A. Deshpande , Omkar G. Karhade
IPC: H01L23/538 , H01L23/13 , H01L23/522 , H01L21/48 , H01L23/00 , H01L25/065 , H01L25/00
CPC classification number: H01L23/5383 , H01L21/486 , H01L23/13 , H01L23/522 , H01L23/5381 , H01L23/5384 , H01L23/5385 , H01L24/97 , H01L25/0652 , H01L25/0655 , H01L25/50 , H01L2224/0401 , H01L2224/0557 , H01L2224/06181 , H01L2224/14 , H01L2224/16145 , H01L2224/16227 , H01L2224/16238 , H01L2224/1703 , H01L2225/0651 , H01L2225/06513 , H01L2225/06541 , H01L2924/15153 , H01L2924/15192
Abstract: A microelectronic structure includes a substrate having a first surface and a cavity extending into the substrate from the substrate first surface, a first microelectronic device and a second microelectronic device attached to the substrate first surface, and a bridge disposed within the substrate cavity and attached to the first microelectronic device and to the second microelectronic device. The bridge includes a plurality conductive vias extending from a first surface to an opposing second surface of the bridge, wherein the conductive vias are electrically coupled to deliver electrical signals from the substrate to the first microelectronic device and the second microelectronic device. The bridge further creates at least one electrical signal connection between the first microelectronic device and the second microelectronic device.
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公开(公告)号:US09716067B2
公开(公告)日:2017-07-25
申请号:US15004774
申请日:2016-01-22
Applicant: Intel Corporation
Inventor: Ravindranath V. Mahajan , Christopher J. Nelson , Omkar G. Karhade , Feras Eid , Nitin A. Deshpande , Shawna M. Liff
IPC: H01L23/538 , H01L25/00 , H01L25/16 , H01L23/367 , H01L23/00 , H01L21/56 , H01L23/14 , H01L23/31 , H01L23/433 , H01L23/498
CPC classification number: H01L23/5381 , H01L21/563 , H01L21/568 , H01L23/145 , H01L23/3114 , H01L23/3128 , H01L23/367 , H01L23/3675 , H01L23/4334 , H01L23/49816 , H01L23/49827 , H01L23/5389 , H01L24/16 , H01L24/17 , H01L24/19 , H01L24/24 , H01L24/73 , H01L24/81 , H01L24/92 , H01L25/0657 , H01L25/165 , H01L25/50 , H01L2224/0401 , H01L2224/04105 , H01L2224/12105 , H01L2224/16145 , H01L2224/16225 , H01L2224/16227 , H01L2224/16265 , H01L2224/17181 , H01L2224/24145 , H01L2224/24245 , H01L2224/291 , H01L2224/29109 , H01L2224/29111 , H01L2224/29113 , H01L2224/29116 , H01L2224/2912 , H01L2224/29139 , H01L2224/29144 , H01L2224/2919 , H01L2224/32225 , H01L2224/32245 , H01L2224/73209 , H01L2224/73253 , H01L2224/73259 , H01L2224/73267 , H01L2224/81005 , H01L2224/92124 , H01L2224/92224 , H01L2224/92242 , H01L2224/92244 , H01L2225/06513 , H01L2225/06517 , H01L2225/06541 , H01L2225/06565 , H01L2924/12042 , H01L2924/1432 , H01L2924/1433 , H01L2924/1434 , H01L2924/15192 , H01L2924/181 , H01L2924/18161 , H01L2924/18162 , H01L2924/19041 , H01L2924/19042 , H01L2924/19043 , H01L2924/19104 , H01L2924/014 , H01L2924/00 , H01L2924/0665
Abstract: Embodiments of the present disclosure are directed towards an integrated circuit (IC) package having first and second dies with first and second input/output (I/O) interconnect structures, respectively. The IC package may include a bridge having first and second electrical routing features coupled to a portion of the first and second I/O interconnect structures, respectively. In embodiments, the first and second electrical routing features may be disposed on one side of the bridge; and third electrical routing features may be disposed on an opposite side. The first and second electrical routing features may be configured to route electrical signals between the first die and the second die and the third electrical routing features may be configured to route electrical signals between the one side and the opposite side. The first die, the second die, and the bridge may be embedded in electrically insulating material. Other embodiments may be described and/or claimed.
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