MEMORY DEVICE AND REPAIR METHOD WITH COLUMN-BASED ERROR CODE TRACKING

    公开(公告)号:US20170371740A1

    公开(公告)日:2017-12-28

    申请号:US15646025

    申请日:2017-07-10

    Applicant: Rambus Inc.

    Abstract: A memory device is disclosed that includes a row of storage locations that form plural columns. The plural columns include data columns to store data and a tag column to store tag information associated with error locations in the data columns. Each data column is associated with an error correction location including an error code bit location. Logic retrieves and stores the tag information associated with the row in response to activation of the row. A bit error in an accessed data column is repaired by a spare bit location based on the tag information.

    DETERMINISTIC OPERATION OF STORAGE CLASS MEMORY

    公开(公告)号:US20170177487A1

    公开(公告)日:2017-06-22

    申请号:US15376507

    申请日:2016-12-12

    Applicant: Rambus Inc.

    CPC classification number: G06F13/1689

    Abstract: Memory controllers, devices, modules, systems and associated methods are disclosed. In one embodiment, a memory controller is disclosed. The memory controller includes write queue logic that has first storage to temporarily store signal components of a write operation. The signal components include an address and write data. A transfer interface issues the signal components of the write operation to a bank of a storage class memory (SCM) device and generates a time value. The time value represents a minimum time interval after which a subsequent write operation can be issued to the bank. The write queue logic includes an issue queue to store the address and the time value for a duration corresponding to the time value.

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