公开(公告)号：US12107626B2

公开(公告)日：2024-10-01

申请号：US17420639

申请日：2020-01-08

Applicant: Nippon Telegraph and Telephone Corporation

Inventor： Osamu Moriwaki ,  Takashi Saida ,  Kenya Suzuki ,  Takashi Go ,  Manabu Oguma ,  Yuichiro Ikuma

IPC: H04B10/079 ,  G01J3/45 ,  G02B6/293 ,  H04B10/572 ,  H04Q11/00

CPC classification number: H04B10/07957 ,  G01J3/45 ,  G02B6/2935 ,  G02B6/2938 ,  G02B6/29385 ,  H04B10/572 ,  H04Q11/0005 ,  H04Q2011/0011 ,  H04Q2011/0015 ,  H04Q2011/0016

Abstract: A wavelength monitoring apparatus includes a wavelength monitoring circuit. The wavelength monitoring circuit includes: a split circuit that splits an input optical signal into two; an optical delay circuit that applies a delay time difference to the two split optical signals; and a two-input two-output optical multiplexer/demultiplexer circuit that outputs a result of applying multiplexing interference to the optical signals to which the delay time difference has been applied. The wavelength monitoring apparatus further includes photoelectric conversion elements that perform photoelectric conversions on the two optical signals output from the wavelength monitoring circuit so as to output electrical signals. The wavelength monitoring apparatus is configured to obtain the wavelength of the optical signal, by calculating a ratio between two electrical outputs of the photoelectric conversion elements and referring to a correspondence table indicating wavelengths of optical signals input to the wavelength monitoring circuit and ratios between electrical outputs.

公开(公告)号：US12085448B2

公开(公告)日：2024-09-10

申请号：US17509141

申请日：2021-10-25

Applicant: MLS ACQ, Inc.

Inventor： Martin L. Spartz

IPC: G01J3/45 ,  G01J3/28 ,  G01N21/3504 ,  G01J3/12 ,  G01J3/453 ,  G01N21/35

CPC classification number: G01J3/45 ,  G01J3/28 ,  G01N21/3504 ,  G01J2003/1213 ,  G01J2003/2869 ,  G01J2003/4534 ,  G01N2021/3595

Abstract: A gas analysis system with an FTIR spectrometer preferably utilizes a long path gas cell, a narrow band detector, and an optical filter that narrows the detection region. The interferograms are further prevent baseline drift and analyze the resultant spectra.

公开(公告)号：US12023099B2

公开(公告)日：2024-07-02

申请号：US17473839

申请日：2021-09-13

Applicant: AdOM, ADVANCED OPTICAL TECHNOLOGIES LTD.

Inventor： Yoel Arieli ,  Yoel Cohen ,  Shlomi Epstein ,  Dror Arbel ,  Ra'anan Gefen

IPC: A61B3/10 ,  A61B3/00 ,  A61B3/15 ,  G01B9/02 ,  G01B11/06 ,  G01J3/02 ,  G01J3/45 ,  G01J3/453

CPC classification number: A61B3/101 ,  A61B3/0025 ,  A61B3/1005 ,  A61B3/152 ,  G01B9/02044 ,  G01B11/0625 ,  G01B11/0675 ,  G01J3/0248 ,  G01J3/45 ,  G01J3/453 ,  G01J3/0229

Abstract: Apparatus and methods are described for performing tear film structure measurement on a tear film of an eye of a subject. A broadband light source (100) is configured to generate broadband light. A spectrometer (250) is configured to measure a spectrum of light of the broadband light that is reflected from at least one spot on the tear film, the spot having a diameter of between 100 microns and 240 microns. A computer processor (28) is coupled to the spectrometer and configured to determine a characteristic of the tear film based upon the spectrum of light measured by the spectrometer. Other applications are also described.

公开(公告)号：US11994533B2

公开(公告)日：2024-05-28

申请号：US17105475

申请日：2020-11-25

Applicant: The Regents of the University of Colorado, a body corporate

Inventor： Rafael Piestun ,  Simon Labouesse ,  Markus B. Raschke ,  Eric Muller ,  Samuel Johnson

IPC: G01J3/02 ,  G01J3/10 ,  G01J3/28 ,  G01J3/44 ,  G01J3/45 ,  G01Q10/06 ,  G01Q30/04 ,  G01Q60/06 ,  G01Q60/22

CPC classification number: G01Q60/22 ,  G01J3/0208 ,  G01J3/10 ,  G01J3/2846 ,  G01J3/4412 ,  G01J3/45 ,  G01Q10/06 ,  G01Q30/04 ,  G01Q60/06

Abstract: Infrared (IR) vibrational scattering scanning near-field optical microscopy (s-SNOM) has advanced to become a powerful nanoimaging and spectroscopy technique with applications ranging from biological to quantum materials. However, full spatiospectral s-SNOM continues to be challenged by long measurement times and drift during the acquisition of large associated datasets. Various embodiments provide for a novel approach of computational spatiospectral s-SNOM by transforming the basis from the stationary frame into the rotating frame of the IR carrier frequency. Some embodiments see acceleration of IR s-SNOM data collection by a factor of 10 or more in combination with prior knowledge of the electronic or vibrational resonances to be probed, the IR source excitation spectrum, and other general sample characteristics.

公开(公告)号：US20240110779A1

公开(公告)日：2024-04-04

申请号：US18535364

申请日：2023-12-11

Applicant: HAMAMATSU PHOTONICS K.K.

Inventor： Tomofumi SUZUKI ,  Kyosuke KOTANI ,  Tatsuya SUGIMOTO ,  Yutaka KURAMOTO ,  Katsumi SHIBAYAMA ,  Noburo HOSOKAWA ,  Hirokazu YAMAMOTO ,  Takuo KOYAMA

IPC: G01B9/02 ,  B81B3/00 ,  G01J3/02 ,  G01J3/10 ,  G01J3/14 ,  G01J3/45 ,  G02B7/182 ,  G02B26/08 ,  G02B27/14

CPC classification number: G01B9/02051 ,  B81B3/00 ,  B81B3/0021 ,  B81B3/007 ,  G01B9/02049 ,  G01J3/0202 ,  G01J3/021 ,  G01J3/0237 ,  G01J3/108 ,  G01J3/14 ,  G01J3/45 ,  G02B7/182 ,  G02B26/0816 ,  G02B26/0833 ,  G02B26/0841 ,  G02B27/144 ,  B81B2201/042 ,  B81B2203/0154 ,  G01J2003/104 ,  G01J3/4532

Abstract: A mirror unit 2 includes a mirror device 20 including a base 21 and a movable mirror 22, an optical function member 13, and a fixed mirror 16 that is disposed on a side opposite to the mirror device 20 with respect to the optical function member 13. The mirror device 20 is provided with a light passage portion 24 that constitutes a first portion of an optical path between the beam splitter unit 3 and the fixed mirror 16. The optical function member 13 is provided with a light transmitting portion 14 that constitutes a second portion of the optical path between the beam splitter unit 3 and the fixed mirror 16. A second surface 21b of the base 21 and a third surface 13a of the optical function member 13 are joined to each other.

公开(公告)号：US11925456B2

公开(公告)日：2024-03-12

申请号：US17061539

申请日：2020-10-01

Applicant: HyperSpectral Corp.

Inventor： David M. Palacios ,  Harry Hopper

IPC: A61B5/08 ,  A61B5/00 ,  A61B5/097 ,  A61B10/00 ,  G01J3/18 ,  G01J3/45 ,  G01N1/42 ,  G01N21/25 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/497

CPC classification number: A61B5/082 ,  A61B5/7282 ,  A61B10/00 ,  G01J3/18 ,  G01J3/45 ,  G01N1/42 ,  G01N21/255 ,  G01N21/3504 ,  G01N21/359 ,  G01N33/497 ,  A61B5/097 ,  A61B2010/0087 ,  G01N2033/4975 ,  G01N2201/063

Abstract: A method comprising at least one light source configured to generate a light of at least one wavelength and project the light over an optical path, a sample device, the device containing a sample obtained from exhalation of a person, a vortex mask configured to receive the light after the light passes through at least a portion of the sample device, the vortex mask including a series of concentric circles etched in a substrate, the vortex mask configured to provide destructive interference of coherent light received from the at least one light source, a detector configured to detect and measure wavelength intensities from the light in the optical path, the wavelength intensities being impacted by the light passing through the sample, the detector receiving the light that remained after passing through the vortex mask, and a processor configured to provide measurement results based on the wavelength intensities.

公开(公告)号：US11921285B2

公开(公告)日：2024-03-05

申请号：US17594457

申请日：2020-04-19

Applicant: ARIZONA BOARD OF REGENTS ON BEHALF OF THE UNIVERSITY OF ARIZONA

Inventor： John Koshel ,  Emma Landsiedel

IPC: H04N23/959 ,  G01B9/02 ,  G01B11/24 ,  G01J3/26 ,  G01J3/45 ,  G02B27/00 ,  H04N23/56 ,  H04N23/67

CPC classification number: G02B27/0075 ,  G01B9/02 ,  G01B11/2441 ,  G01J3/26 ,  G01J3/45 ,  H04N23/56 ,  H04N23/67 ,  H04N23/959

Abstract: Method and system for on-chip processing to obtain an EDOF image combines interferometry and imaging so the two operations do not interfere with one another but, rather, work together to create an in-focus, true color image of a three-dimensional object. This image has no significant artifacts and requires only limited processing. In addition, a coarse depth map is created in the process which may also be helpful in subsequent usage of the acquired image. A CMOS pixel-array sensor includes circuitry to implement processing at the pixel level.

公开(公告)号：US20240060821A1

公开(公告)日：2024-02-22

申请号：US18224729

申请日：2023-07-21

Applicant: Deutsches Zentrum für Luft- und Raumfahrt e.V.

Inventor： Oliver Kliebisch ,  Peter Mahnke ,  Raoul-Amadeus Lorbeer

IPC: G01J3/45 ,  G01J3/10 ,  G02B27/09 ,  G02B27/42

CPC classification number: G01J3/45 ,  G01J3/10 ,  G02B27/0905 ,  G02B27/4233 ,  G01J2003/451

Abstract: An optical device, a system and a method for dispersion interferometry includes a frequency doubling device and an optical modulation device, a transmission beam path which is configured to emit a first and second measurement beam on an optical element and a reception beam path which is configured to receive a first and second measuring beam returned by the optical element.

公开(公告)号：US11885677B2

公开(公告)日：2024-01-30

申请号：US17227440

申请日：2021-04-12

Applicant: Massachusetts Institute of Technology

Inventor： Derek Kita ,  Carlos Andres Rios Ocampo ,  Juejun Hu

IPC: G01J3/02 ,  G01J3/45 ,  G01J3/453 ,  G02F1/21

CPC classification number: G01J3/0256 ,  G01J3/0205 ,  G01J3/0213 ,  G01J3/45 ,  G01J3/4531 ,  G01J3/4532 ,  G02F1/212

Abstract: We disclose an on-chip photonic spectroscopy system capable of dramatically improving the signal-to-noise ratio (SNR), dynamic range, and reconstruction quality of Fourier transform spectrometers. Secondly, we disclose a system of components that makes up a complete on-chip RF spectrum analyzer with low-cost and high-performance.

公开(公告)号：US11874169B2

公开(公告)日：2024-01-16

申请号：US17042197

申请日：2020-01-09

Applicant: HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES

Inventor： Yingjian Wang ,  Yufei Chu ,  Dong Liu ,  Decheng Wu ,  Zhenzhu Wang ,  Kunming Xing ,  Zhiqiang Kuang ,  Bangxin Wang ,  Zhiqing Zhong ,  Aiyuan Fan ,  Chenbo Xie

IPC: G01J3/26 ,  G01J3/02 ,  G01J3/45

CPC classification number: G01J3/26 ,  G01J3/0208 ,  G01J3/0297 ,  G01J3/45

Abstract: This application relates to a device for measuring a transmittance curve of an Fabry-Perot using a frequency comb light source and a method using the same. The device includes the following components sequentially arranged in an optical path: a single frequency pulse laser generating single frequency pulse laser; a frequency comb laser converting received single frequency pulse laser into frequency comb laser; and an Fabry-Perot to be detected receiving laser output from the frequency comb laser; where the device further includes a first receiving unit receiving laser from an output end of the frequency comb laser and performing component and spectrum analysis, and a second receiving unit receiving laser from an output end of the Fabry-Perot to be detected and performing component and spectrum analysis.