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公开(公告)号:US20240313117A1
公开(公告)日:2024-09-19
申请号:US18675293
申请日:2024-05-28
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Seiichi YONEDA
IPC: H01L29/786 , H01L27/12
CPC classification number: H01L29/786 , H01L27/1225
Abstract: A first transistor and a second transistor are stacked. The first transistor and the second transistor have a gate electrode in common. At least one of semiconductor films used in the first transistor and the second transistor is an oxide semiconductor film. With the use of the oxide semiconductor film as the semiconductor film in the transistor, high field-effect mobility and high-speed operation can be achieved. Since the first transistor and the second transistor are stacked and have the gate electrode in common, the area of a region where the transistors are disposed can be reduced.
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公开(公告)号:US20240310938A1
公开(公告)日:2024-09-19
申请号:US18673733
申请日:2024-05-24
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Hajime KIMURA , Shunpei YAMAZAKI
IPC: G06F3/041 , G02F1/1333 , G02F1/1335 , G02F1/1343 , G02F1/1368 , G06F3/044
CPC classification number: G06F3/0412 , G02F1/13338 , G02F1/134363 , G02F1/1368 , G06F3/0445 , G06F3/0446 , G02F1/133553 , G02F2201/44 , G06F2203/04108
Abstract: An input/output device includes a first sensor electrode and a second sensor electrode. In addition, the input/output device includes a first electrode and a second electrode which are electrodes for a display element, and a substrate sandwiched between the first sensor electrode and the second sensor electrode. The second sensor electrode is formed concurrently with the first electrode using the same material. The input/output device sensors a change in capacitance of a capacitor formed between the first sensor electrode and the second sensor electrode. Furthermore, a third sensor electrode to which a floating potential is applied may be provided to overlap with the first electrode. In the input/output device, either a liquid crystal element or a light-emitting element may be used, or both the liquid crystal element and the light-emitting element may be used.
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公开(公告)号:US12096670B2
公开(公告)日:2024-09-17
申请号:US17625854
申请日:2020-07-08
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Daisuke Kubota , Taisuke Kamada , Ryo Hatsumi , Koji Kusunoki , Kazunori Watanabe , Susumu Kawashima
IPC: H01L51/52 , H10K50/86 , H10K59/35 , H10K59/65 , H10K102/00
CPC classification number: H10K59/353 , H10K50/865 , H10K59/351 , H10K59/352 , H10K59/65 , H10K2102/311
Abstract: The resolution of a display apparatus having alight detection function is increased. The display apparatus includes a light-emitting device and a light-emitting and light-receiving device. The light-emitting device includes a first pixel electrode, a first light-emitting layer, and a common electrode; the light-emitting and light-receiving device includes a second pixel electrode, a second light-emitting layer, an active layer, and the common electrode; the active layer includes an organic compound; the first light-emitting layer is positioned between the first pixel electrode and the common electrode; the second light-emitting layer and the active layer are each positioned between the second pixel electrode and the common electrode; the light-emitting device has a function of emitting light of a first color; and the light-emitting and light-receiving device has a function of emitting light of a second color and a function of receiving light of the first color. The light-emitting and light-receiving device functions as both a light-emitting device and a light-receiving device, whereby a pixel can have a light-receiving function without an increase in the number of subpixels included in the pixel. Furthermore, the pixel can be provided with a light-receiving function without a reduction in the resolution of the display apparatus or a reduction in the aperture ratio of each subpixel.
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公开(公告)号:US12095440B2
公开(公告)日:2024-09-17
申请号:US17765046
申请日:2020-10-05
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Kazuaki Ohshima , Hitoshi Kunitake , Yuto Yakubo , Takayuki Ikeda
IPC: H03H7/38 , H01L21/02 , H01L21/822 , H01L27/088 , H03F3/19 , H03F3/60
CPC classification number: H03H7/38 , H01L21/02565 , H01L21/822 , H01L27/088 , H03F3/19 , H03F3/60
Abstract: An amplifier is formed in a wiring layer. A semiconductor device includes a second layer over a first layer with a metal oxide therebetween. The first layer includes a first transistor including a first semiconductor layer containing silicon. The second layer includes an impedance matching circuit, and the impedance matching circuit includes a second transistor including a second semiconductor layer containing gallium. The first transistor forms first coupling capacitance between the first transistor and the metal oxide, and the impedance matching circuit forms second coupling capacitance between the impedance matching circuit and the metal oxide. The impedance matching circuit is electrically connected to the metal oxide through the second coupling capacitance. The metal oxide inhibits the influence of first radiation noise emitted from the impedance matching circuit on the operation of the first transistor.
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公开(公告)号:US12094982B2
公开(公告)日:2024-09-17
申请号:US18100200
申请日:2023-01-23
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei Yamazaki , Hiromichi Godo , Satoshi Kobayashi
IPC: H01L29/786 , H01L29/24 , H01L29/423
CPC classification number: H01L29/7869 , H01L29/24 , H01L29/42356 , H01L29/78648
Abstract: An object is to provide a semiconductor device having electrical characteristics such as high withstand voltage, low reverse saturation current, and high on-state current. In particular, an object is to provide a power diode and a rectifier which include non-linear elements. An embodiment of the present invention is a semiconductor device including a first electrode, a gate insulating layer covering the first electrode, an oxide semiconductor layer in contact with the gate insulating layer and overlapping with the first electrode, a pair of second electrodes covering end portions of the oxide semiconductor layer, an insulating layer covering the pair of second electrodes and the oxide semiconductor layer, and a third electrode in contact with the insulating layer and between the pair of second electrodes. The pair of second electrodes are in contact with end surfaces of the oxide semiconductor layer.
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公开(公告)号:US12094368B2
公开(公告)日:2024-09-17
申请号:US17346348
申请日:2021-06-14
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Toshiyuki Isa , Akio Endo , Yosuke Tsukamoto , Jun Koyama
CPC classification number: G09F9/301 , G06F1/1626 , G06F1/1643 , G06F1/1652
Abstract: An electronic device including a large display region and with improved portability is provided. An electronic device with improved reliability is provided.
An information processing device includes a first film, a panel substrate, and at least a first housing. The panel substrate has flexibility and a display region, and the first film has a visible-light-transmitting property and flexibility. The first housing includes a first slit, the panel substrate includes a region positioned between the first film and a second film, the first slit has a function of storing the region, and one or both of the panel substrate and the first film can slide along the first slit.-
177.
公开(公告)号:US20240304611A1
公开(公告)日:2024-09-12
申请号:US18440172
申请日:2024-02-13
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Shunpei YAMAZAKI , Koji KUSUNOKI , Shingo EGUCHI , Takayuki IKEDA
IPC: H01L25/18 , G06F3/044 , H01L23/00 , H01L25/00 , H01L25/065 , H01L25/16 , H01L27/12 , H01L27/15 , H01L33/00
CPC classification number: H01L25/18 , G06F3/044 , H01L24/94 , H01L25/0657 , H01L25/167 , H01L25/50 , H01L33/0093 , G06F2203/04103 , H01L24/16 , H01L27/1225 , H01L27/156 , H01L2224/16145 , H01L2225/06513 , H01L2924/12041
Abstract: A display device with high resolution is provided. A display device with high display quality is provided. The display device includes a substrate, an insulating layer, a plurality of transistors, and a plurality of light-emitting diodes. The plurality of light-emitting diodes are provided in a matrix over the substrate. Each of the plurality of transistors is electrically connected to at least one of the plurality of light-emitting diodes. The plurality of light-emitting diodes are positioned closer to the substrate than the plurality of transistors are. The plurality of light-emitting diodes emit light toward the substrate. Each of the plurality of transistors includes a metal oxide layer and a gate electrode. The metal oxide layer includes a channel formation region. The top surface of the gate electrode is substantially level with the top surface of the insulating layer.
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公开(公告)号:US12087938B2
公开(公告)日:2024-09-10
申请号:US15374048
申请日:2016-12-09
Applicant: Semiconductor Energy Laboratory Co., LTD.
Inventor: Hiroyuki Miyake , Nobuhiro Inoue , Ryo Yamauchi , Mako Motoyoshi , Takahiro Kawakami , Mayumi Mikami , Miku Fujita , Shunpei Yamazaki
IPC: H01M4/36 , H01G11/06 , H01G11/28 , H01G11/30 , H01G11/36 , H01G11/50 , H01M4/134 , H01M4/38 , H01M4/62 , H01M10/0525
CPC classification number: H01M4/366 , H01G11/06 , H01G11/28 , H01G11/30 , H01G11/36 , H01G11/50 , H01M4/134 , H01M4/386 , H01M4/626 , H01M10/0525
Abstract: A power storage device having high capacitance is provided. A power storage device with excellent cycle characteristics is provided. A power storage device with high charge and discharge efficiency is provided. A power storage device including a negative electrode with low resistance is provided. A negative electrode for a power storage device includes a number of composites in particulate forms. The composites include a negative electrode active material, a first functional material, and a compound. The compound includes a constituent element of the negative electrode active material and a constituent element of the first functional material. The negative electrode active material includes a region in contact with at least one of the first functional material or the compound.
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179.
公开(公告)号:US12087866B2
公开(公告)日:2024-09-10
申请号:US17182269
申请日:2021-02-23
Applicant: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Inventor: Kosei Noda
IPC: H01L29/24 , H01L21/425 , H01L29/22 , H01L29/66 , H01L29/786
CPC classification number: H01L29/7869 , H01L21/425 , H01L29/22 , H01L29/24 , H01L29/66969 , H01L29/78696
Abstract: A semiconductor device with stable electrical characteristics is provided. Alternatively, a semiconductor device having normally-off electrical characteristics is provided. A semiconductor device includes a gate electrode, a gate insulator, and an oxide semiconductor, the oxide semiconductor contains fluorine in a channel formation region, and a fluorine concentration in the channel formation region is higher than or equal to 1×1020 atoms/cm3 and lower than or equal to 1×1022 atoms/cm3. Note that fluorine is added by an ion implantation method.
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公开(公告)号:US12087824B2
公开(公告)日:2024-09-10
申请号:US18228134
申请日:2023-07-31
Applicant: Semiconductor Energy Laboratory Co., Ltd.
Inventor: Shunpei Yamazaki , Yasuharu Hosaka , Yukinori Shima , Junichi Koezuka , Kenichi Okazaki
IPC: H01L29/24 , H01L29/06 , H01L29/10 , H01L29/423 , H01L29/49 , H01L29/786
CPC classification number: H01L29/24 , H01L29/0692 , H01L29/1037 , H01L29/42384 , H01L29/4908 , H01L29/78648 , H01L29/7869 , H01L29/78696
Abstract: A novel material is provided. A composite oxide semiconductor includes a first region and a second region. The first region contains indium. The second region contains an element M (the element M is one or more of Ga, Al, Hf, Y, and Sn). The first region and the second region are arranged in a mosaic pattern. The composite oxide semiconductor further includes a third region. The element M is gallium. The first region contains indium oxide or indium zinc oxide. The second region contains gallium oxide or gallium zinc oxide. The third region contains zinc oxide.
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