ERROR CORRECTION OF MULTIPLE BIT ERRORS PER CODEWORD

    公开(公告)号:US20190042357A1

    公开(公告)日:2019-02-07

    申请号:US16141862

    申请日:2018-09-25

    Inventor: Wei WU

    Abstract: Provided are an apparatus, memory device, and method to determine error location polynomial coefficients to provide to bit correction logic instances to decode bits of a codeword. A memory controller for a memory includes coefficient generating logic to receive as input a plurality of syndrome values to generate a plurality of coefficients for an error locator polynomial. A plurality of instances of bit correction logic, one instance for each bit of bits to correct in a codeword for a block in the memory array to decode. Each instance of bit correction logic is to receive as input the coefficients for the error locator polynomial and elements for the bit to correct from a decoder alphabet to determine whether to correct the bit and output as a decoded bit the bit or a corrected bit to include in a decoded codeword.

    SPARSE COLUMN-AWARE ENCODINGS FOR NUMERIC DATA TYPES

    公开(公告)号:US20210294799A1

    公开(公告)日:2021-09-23

    申请号:US17341963

    申请日:2021-06-08

    Abstract: Methods and apparatus for sparse column-aware encodings for numeric data types, including integer data and floating-point data (float, double, etc.). The encoding schemes are tailored to take advantage of column addressable memories such as stochastic associative memories (SAM) to enable Stochastic Associative Search (SAS), which is a highly efficient and fast way of searching through a very large database of records (order of Billions) and finding similar records to a given query record (search key). Techniques are also disclosed for performing range searches for both integer and floating-point data types. The integer or float data is converted to Hexadecimal form and encoded using an m-of-n constant weight encoding. Only the columns with set bits in search keys need to be read, which significantly reduces the number of reads required for searches.

    DYNAMIC RELIABILITY LEVELS FOR STORAGE DEVICES

    公开(公告)号:US20190044536A1

    公开(公告)日:2019-02-07

    申请号:US16022631

    申请日:2018-06-28

    CPC classification number: H03M13/05 G06F11/1044 G06F11/1048 H03M13/611

    Abstract: To address the storage needs of applications that work with noisy data (e.g. image, sound, video data), where errors can be tolerated to a certain extent and performance is more critical than data fidelity, dynamic reliability levels enable storage devices capable of storing and retrieving data with varying degrees of data fidelity to dynamically change the degree of data fidelity in response to an application's request specifying reliability level. By allowing the application to specify the reliability level at which its data is stored and retrieved, dynamic reliability levels can increase read/write performance without sacrificing application accuracy. The application can specify reliability levels for different types or units of data, such as different reliability levels for metadata as opposed to data and so forth.

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