TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT DEVICE AND TOTAL REFLECTION SPECTROSCOPIC MEASUREMENT METHOD

    公开(公告)号:US20170336259A1

    公开(公告)日:2017-11-23

    申请号:US15597329

    申请日:2017-05-17

    Inventor: Yoichi KAWADA

    Abstract: A total reflection spectroscopic measurement device includes a terahertz wave generation unit, an internal total reflection prism, a detection unit configured to detect the terahertz wave, an electric field vector measurement unit configured to measure an electric field vector of the terahertz wave, and an analysis unit configured to acquire information about an optical constant of the object to be measured. Proportions of S polarization component and P polarization component of the terahertz wave are constant. The analysis unit acquires the information about the optical constant on the basis of a ratio between S polarization component and P polarization component of the measured electric field vector when the object is not arranged on the total reflection surface and a ratio between S polarization component and P polarization component of the measured electric field vector when the object is arranged on the total reflection surface.

    IMAGE PICKUP APPARATUS, SPECTROSCOPIC SYSTEM, AND SPECTROSCOPIC METHOD
    198.
    发明申请
    IMAGE PICKUP APPARATUS, SPECTROSCOPIC SYSTEM, AND SPECTROSCOPIC METHOD 有权
    图像拾取装置,光谱系统和光谱方法

    公开(公告)号:US20160123810A1

    公开(公告)日:2016-05-05

    申请号:US14883097

    申请日:2015-10-14

    Abstract: An image pickup apparatus includes an encoder which is arranged on an optical path of light incident from an object and which has a plurality of regions with first light transmittance and a plurality of regions with second light transmittance lower than the first light transmittance, a dispersive element which is arranged on an optical path of at least one part of light after passage through the encoder and which spatially shifts the at least one part of the light in accordance with wavelength, and at least one image pickup device which is arranged to receive light after passage through the dispersive element and light without passage through the dispersive element and which acquires a first image, in which light components for respective wavelengths spatially shifted by the dispersive element are superimposed, and a second image based on the light without passage through the dispersive element.

    Abstract translation: 一种图像拾取装置,包括:编码器,被布置在从物体入射的光的光路上,并且具有多个具有第一透光率的区域和具有比第一透光率低的第二光透射率的多个区域;色散元件 其布置在通过编码器的至少一部分光的光路上,并且根据波长空间上移动光的至少一部分;以及至少一个图像拾取装置,其被配置为接收光后的光 通过分散元件和光,而不通过色散元件,并且其获取第一图像,其中由分散元件空间偏移的各个波长的光分量叠加在一起,并且基于光而不通过色散元件的第二图像 。

    ULTRA DARK FIELD MICROSCOPE
    199.
    发明申请
    ULTRA DARK FIELD MICROSCOPE 审中-公开
    超级暗场显微镜

    公开(公告)号:US20160054225A1

    公开(公告)日:2016-02-25

    申请号:US14703477

    申请日:2015-05-04

    Applicant: CHROMx, LLC.

    Abstract: A fluorescence microscope includes a nearly monochromatic light source, a Brewster angle wedge, and an optical system for irradiating a sample with a light beam from the light source and directing fluorescence light from said sample onto the Brewster angle wedge. Collection optics are provided for focusing a hyper-spectral, wide angle and dark field image of the sample from the Brewster angle wedge onto recording optics.

    Abstract translation: 荧光显微镜包括近似单色的光源,布鲁斯特角楔和用于从光源照射样品的光束并将来自所述样品的荧光引导到布鲁斯特角楔上的光学系统。 提供收集光学器件用于将来自布鲁斯特角楔的样品的超光谱,广角和暗场图像聚焦到记录光学器件上。

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