CONTACT RESISTANCE MEASUREMENT FOR RESISTANCE LINEARITY IN NANOSTRUCTURE THIN FILMS
    22.
    发明申请
    CONTACT RESISTANCE MEASUREMENT FOR RESISTANCE LINEARITY IN NANOSTRUCTURE THIN FILMS 审中-公开
    接触电阻测量在纳米薄膜中的电阻线性

    公开(公告)号:US20110042126A1

    公开(公告)日:2011-02-24

    申请号:US12862548

    申请日:2010-08-24

    IPC分类号: H05K1/00 G01R27/08

    CPC分类号: G06F3/045

    摘要: The present disclosure is directed to a transparent conductor for use in touch panel devices having a plurality of nanostructures therein that provides reliable output based on user touch or pen input. To determine if a touch panel is reliable, there is disclosed a method of measuring voltages across the transparent conductor when it is touched. These measured voltages are converted into contact resistances, which are statistically analyzed. A median contact resistance is determined based on the converted contact resistances. The remaining set of converted contact resistances are analyzed to determine if they are within acceptable limits. Acceptable limits may include most of the contact resistances falling within a range, none of the contact resistances exceeding an upper limit, and a difference in contact resistances converted for different users or pens does not exceed a maximum variability.

    摘要翻译: 本公开涉及一种用于其中具有多个纳米结构的触摸面板装置的透明导体,其基于用户触摸或笔输入提供可靠的输出。 为了确定触摸面板是否可靠,公开了一种当触摸时测量透明导体上的电压的方法。 这些测量的电压被转换为接触电阻,进行统计分析。 基于转换的接触电阻确定中值接触电阻。 分析剩余的一组转换的接触电阻以确定它们是否在可接受的限度内。 可接受的限制可以包括大部分接触电阻落在一个范围内,接触电阻不超过上限,并且不同用户或笔转换的接触电阻差不超过最大变化。

    CONDUCTIVE NANOSTRUCTURE-BASED FILMS WITH IMPROVED ESD PERFORMANCE
    27.
    发明申请
    CONDUCTIVE NANOSTRUCTURE-BASED FILMS WITH IMPROVED ESD PERFORMANCE 有权
    具有改进的ESD性能的基于导电的纳米结构膜

    公开(公告)号:US20140340811A1

    公开(公告)日:2014-11-20

    申请号:US14260888

    申请日:2014-04-24

    摘要: Optical stacks containing one or more patterned transparent conductor layers may be damaged by electrostatic discharges that occur during the optical stack manufacturing process. Such damage may result in non-conductive conductors within the patterned transparent conductor layer. An electrostatic discharge protected optical stack may include a substrate layer, a first anti-static layer having a sheet resistance of from about 106 ohms per square (Ω/sq) to about 109 Ω/sq, and a patterned transparent conductor layer. Methods of testing and assessing damage to patterned transparent conductors are provided.

    摘要翻译: 包含一个或多个图案化的透明导体层的光学堆叠可能由于在光学堆叠制造过程中发生的静电放电而损坏。 这种损坏可能导致图案化的透明导体层内的非导电导体。 静电放电保护光学堆叠可以包括基底层,具有约106欧姆/平方(约OHgr / sq)至约109&OHgr / sq的薄层电阻的第一抗静电层和图案化的透明导体层。 提供了测试和评估图案化透明导体损坏的方法。

    Methods and compositions for ink jet deposition of conductive features
    30.
    发明授权
    Methods and compositions for ink jet deposition of conductive features 有权
    用于喷墨沉积导电特征的方法和组合物

    公开(公告)号:US08632700B2

    公开(公告)日:2014-01-21

    申请号:US12380293

    申请日:2009-02-25

    申请人: Adrian Winoto

    发明人: Adrian Winoto

    IPC分类号: H01B1/22

    摘要: Disclosed is an electrically conductive feature on a substrate, and methods and compositions for forming the same, wherein the electrically conductive feature includes metallic anisotropic nanostructures and is formed by injetting onto the substrate a coating solution containing the conductive anisotropic nanostructures.

    摘要翻译: 公开了一种基板上的导电特征,以及用于形成该导电特征的方法和组合物,其中导电特征包括金属各向异性纳米结构,并且通过将包含导电各向异性纳米结构的涂布溶液喷射到基板上形成。