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公开(公告)号:US20100080933A1
公开(公告)日:2010-04-01
申请号:US12353638
申请日:2009-01-14
申请人: Jozef Kudela , John M. White
发明人: Jozef Kudela , John M. White
IPC分类号: C23C16/505
CPC分类号: C23C16/5096 , C23C16/54 , H01J37/32091 , H01J37/32183 , H01J37/3244 , H01J37/32568 , H01J37/32752
摘要: Embodiments of the present invention generally relate to methods and apparatus for plasma generation in plasma processes. The methods and apparatus generally include a plurality of electrodes. The electrodes are connected to a RF power source, which powers the electrodes out of phase from one another. Adjacent electrodes are electrically isolated from one another by electrically insulating members disposed between and coupled to the electrodes. Processing gas may be delivered and/or withdrawn through the electrodes and/or the electrically insulating members. The substrate may remain electrically floating because the plasma may be capacitively coupled to it through a differential RF source drive.
摘要翻译: 本发明的实施例一般涉及等离子体工艺中等离子体产生的方法和装置。 所述方法和装置通常包括多个电极。 电极连接到RF电源,该电源使电极彼此相位不相位。 相邻的电极通过设置在电极之间并耦合到电极的电绝缘构件彼此电隔离。 处理气体可以通过电极和/或电绝缘构件输送和/或排出。 由于等离子体可以通过差分RF源驱动电容耦合到其上,基板可能保持电浮置。
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公开(公告)号:US09068262B2
公开(公告)日:2015-06-30
申请号:US13110184
申请日:2011-05-18
申请人: Jozef Kudela , Jonghoon Baek , John M. White , Robin Tiner , Suhail Anwar , Gaku Furuta
发明人: Jozef Kudela , Jonghoon Baek , John M. White , Robin Tiner , Suhail Anwar , Gaku Furuta
IPC分类号: C23C16/455 , C23C16/509 , H01J37/32
CPC分类号: B05B1/185 , C23C16/45565 , C23C16/509 , C23C16/5096 , H01J37/3244 , H01J37/32532 , H01J37/32623 , H01J37/32651 , Y10T137/6851
摘要: Embodiments of the invention generally include shield frame assembly for use with a showerhead assembly, and a showerhead assembly having a shield frame assembly that includes an insulator that tightly fits around the perimeter of a showerhead in a vacuum processing chamber. In one embodiment, a showerhead assembly includes a gas distribution plate and a multi-piece frame assembly that circumscribes a perimeter edge of the gas distribution plate. The multi-piece frame assembly allows for expansion of the gas distribution plate without creating gaps which may lead to arcing. In other embodiments, the insulator is positioned to be have the electric fields concentrated at the perimeter of the gas distribution plate located therein, thereby reducing arcing potential.
摘要翻译: 本发明的实施例通常包括用于喷头组件的屏蔽框架组件和具有屏蔽框架组件的喷头组件,所述屏蔽框架组件包括紧密配合在真空处理室中的喷头周边周围的绝缘体。 在一个实施例中,喷头组件包括气体分配板和环绕气体分布板的周边边缘的多片框架组件。 多件式框架组件允许气体分配板的膨胀而不产生可能导致电弧的间隙。 在其它实施例中,绝缘体被定位成具有集中在位于其中的气体分配板的周边的电场,从而减少电弧电势。
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公开(公告)号:US08438990B2
公开(公告)日:2013-05-14
申请号:US12353638
申请日:2009-01-14
申请人: Jozef Kudela , John M. White
发明人: Jozef Kudela , John M. White
CPC分类号: C23C16/5096 , C23C16/54 , H01J37/32091 , H01J37/32183 , H01J37/3244 , H01J37/32568 , H01J37/32752
摘要: Embodiments of the present invention generally relate to methods and apparatus for plasma generation in plasma processes. The methods and apparatus generally include a plurality of electrodes. The electrodes are connected to a RF power source, which powers the electrodes out of phase from one another. Adjacent electrodes are electrically isolated from one another by electrically insulating members disposed between and coupled to the electrodes. Processing gas may be delivered and/or withdrawn through the electrodes and/or the electrically insulating members. The substrate may remain electrically floating because the plasma may be capacitively coupled to it through a differential RF source drive.
摘要翻译: 本发明的实施例一般涉及等离子体工艺中等离子体产生的方法和装置。 所述方法和装置通常包括多个电极。 电极连接到RF电源,该电源使电极彼此相位不相位。 相邻的电极通过设置在电极之间并耦合到电极的电绝缘构件彼此电隔离。 处理气体可以通过电极和/或电绝缘构件传送和/或抽出。 由于等离子体可以通过差分RF源驱动电容耦合到其上,基板可能保持电浮置。
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公开(公告)号:US09324597B2
公开(公告)日:2016-04-26
申请号:US13098255
申请日:2011-04-29
申请人: Shinichi Kurita , Jozef Kudela , Suhail Anwar , John M. White , Dong-Kil Yim , Hans Georg Wolf , Dennis Zvalo , Makoto Inagawa , Ikuo Mori
发明人: Shinichi Kurita , Jozef Kudela , Suhail Anwar , John M. White , Dong-Kil Yim , Hans Georg Wolf , Dennis Zvalo , Makoto Inagawa , Ikuo Mori
IPC分类号: H01J37/32 , H01L21/67 , C23C16/458 , C23C16/46 , C23C16/511 , C23C16/54 , H01L21/677
CPC分类号: H01L21/67712 , C23C16/4587 , C23C16/46 , C23C16/463 , C23C16/511 , C23C16/54 , H01J37/32192 , H01J37/3222 , H01J37/32513 , H01J37/32522 , H01J37/32889 , H01J37/32899 , H01L21/67098 , H01L21/67126 , H01L21/67173 , H01L21/6719 , H01L21/67201
摘要: The present invention generally relates to a vertical CVD system having a processing chamber that is capable of processing multiple substrates. The multiple substrates are disposed on opposite sides of the processing source within the processing chamber, yet the processing environments are not isolated from each other. The processing source is a horizontally centered vertical plasma generator that permits multiple substrates to be processed simultaneously on either side of the plasma generator, yet independent of each other. The system is arranged as a twin system whereby two identical processing lines, each with their own processing chamber, are arranged adjacent to each other. Multiple robots are used to load and unload the substrates from the processing system. Each robot can access both processing lines within the system.
摘要翻译: 本发明一般涉及具有能够处理多个基板的处理室的垂直CVD系统。 多个基板设置在处理室内的处理源的相对侧上,但处理环境彼此不隔离。 处理源是水平居中的垂直等离子体发生器,其允许在等离子体发生器的任一侧上同时处理多个基板,但彼此独立。 该系统被布置为双系统,由此两个相同的处理线各自具有它们自己的处理室,彼此相邻布置。 多个机器人用于从处理系统装载和卸载基板。 每个机器人可以访问系统内的两条处理线。
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25.
公开(公告)号:US08906813B2
公开(公告)日:2014-12-09
申请号:US13886175
申请日:2013-05-02
申请人: Tae Kyung Won , Seon-Mee Cho , Soo Young Choi , Beom Soo Park , Dong-Kil Yim , John M. White , Jozef Kudela
发明人: Tae Kyung Won , Seon-Mee Cho , Soo Young Choi , Beom Soo Park , Dong-Kil Yim , John M. White , Jozef Kudela
IPC分类号: H01L21/31 , H01L21/02 , C23C16/40 , C23C16/455 , C23C16/511 , C23C16/54
CPC分类号: H01L21/0262 , C23C16/401 , C23C16/45578 , C23C16/511 , C23C16/545 , H01L21/02164 , H01L21/02211 , H01L21/02274
摘要: Methods for processing a substrate are described herein. Methods can include positioning a substrate in a processing chamber, maintaining the processing chamber at a temperature below 400° C., flowing a reactant gas comprising either a silicon hydride or a silicon halide and an oxidizing precursor into the process chamber, applying a microwave power to create a microwave plasma from the reactant gas, and depositing a silicon oxide layer on at least a portion of the exposed surface of a substrate.
摘要翻译: 本文描述了用于处理衬底的方法。 方法可以包括将基底定位在处理室中,将处理室保持在低于400℃的温度,使包含硅氢化物或硅卤化物的反应气体和氧化前体流入处理室,施加微波功率 以从反应气体中产生微波等离子体,以及在衬底的暴露表面的至少一部分上沉积氧化硅层。
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公开(公告)号:US20120031335A1
公开(公告)日:2012-02-09
申请号:US13098255
申请日:2011-04-29
申请人: Shinichi Kurita , Jozef Kudela , Suhail Anwar , John M. White , Dong-Kil Yim , Hans Georg Wolf , Dennis Zvalo , Makoto Inagawa , Ikuo Mori
发明人: Shinichi Kurita , Jozef Kudela , Suhail Anwar , John M. White , Dong-Kil Yim , Hans Georg Wolf , Dennis Zvalo , Makoto Inagawa , Ikuo Mori
IPC分类号: C23C16/511 , C23C16/458 , C23C16/455
CPC分类号: H01L21/67712 , C23C16/4587 , C23C16/46 , C23C16/463 , C23C16/511 , C23C16/54 , H01J37/32192 , H01J37/3222 , H01J37/32513 , H01J37/32522 , H01J37/32889 , H01J37/32899 , H01L21/67098 , H01L21/67126 , H01L21/67173 , H01L21/6719 , H01L21/67201
摘要: The present invention generally relates to a vertical CVD system having a processing chamber that is capable of processing multiple substrates. The multiple substrates are disposed on opposite sides of the processing source within the processing chamber, yet the processing environments are not isolated from each other. The processing source is a horizontally centered vertical plasma generator that permits multiple substrates to be processed simultaneously on either side of the plasma generator, yet independent of each other. The system is arranged as a twin system whereby two identical processing lines, each with their own processing chamber, are arranged adjacent to each other. Multiple robots are used to load and unload the substrates from the processing system. Each robot can access both processing lines within the system.
摘要翻译: 本发明一般涉及具有能够处理多个基板的处理室的垂直CVD系统。 多个基板设置在处理室内的处理源的相对侧上,但处理环境彼此不隔离。 处理源是水平居中的垂直等离子体发生器,其允许在等离子体发生器的任一侧上同时处理多个基板,但彼此独立。 该系统被布置为双系统,由此两个相同的处理线各自具有它们自己的处理室,彼此相邻布置。 多个机器人用于从处理系统装载和卸载基板。 每个机器人可以访问系统内的两条处理线。
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公开(公告)号:US08883269B2
公开(公告)日:2014-11-11
申请号:US13331021
申请日:2011-12-20
申请人: Tae Kyung Won , Helinda Nominanda , Seon-Mee Cho , Soo Young Choi , Beom Soo Park , John M. White , Suhail Anwar , Jozef Kudela
发明人: Tae Kyung Won , Helinda Nominanda , Seon-Mee Cho , Soo Young Choi , Beom Soo Park , John M. White , Suhail Anwar , Jozef Kudela
IPC分类号: H05H1/30 , C23C16/34 , C23C16/455 , C23C16/511 , C23C16/54 , H01J37/32
CPC分类号: C23C16/345 , C23C16/45578 , C23C16/511 , C23C16/545 , H01J37/32192 , H01J37/3222 , H01J37/3244
摘要: A method of processing a substrate in a processing chamber is provided. The method generally includes applying a microwave power to an antenna coupled to a microwave source disposed within the processing chamber, wherein the microwave source is disposed relatively above a gas feeding source configured to provide a gas distribution coverage covering substantially an entire surface of the substrate, and exposing the substrate to a microwave plasma generated from a processing gas provided by the gas feeding source to deposit a silicon-containing layer on the substrate at a temperature lower than about 200 degrees Celsius, the microwave plasma using a microwave power having a power density of about 500 milliWatts/cm2 to about 5,000 milliWatts/cm2 at a frequency of about 1 GHz to about 10 GHz.
摘要翻译: 提供了一种在处理室中处理衬底的方法。 该方法通常包括对耦合到设置在处理室内的微波源的天线施加微波功率,其中微波源设置在气体馈送源的相对上方,该气体馈送源被配置成提供覆盖基板整个表面的气体分布覆盖, 以及将所述衬底暴露于由所述气体供给源提供的处理气体产生的微波等离子体,以在低于约200摄氏度的温度下在所述衬底上沉积含硅层,所述微波等离子体使用具有功率密度 在约1GHz至约10GHz的频率下为约500毫瓦/厘米2至约5,000毫瓦/厘米2。
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公开(公告)号:US20090151636A1
公开(公告)日:2009-06-18
申请号:US12271613
申请日:2008-11-14
申请人: John M. White , Bradley O. Stimson , Jozef Kudela
发明人: John M. White , Bradley O. Stimson , Jozef Kudela
IPC分类号: C23C16/513 , C23C16/511
CPC分类号: H01J37/32697 , H01J37/32091 , H01J37/32192 , H01J37/32357 , H01J37/32862
摘要: The present invention generally comprises an apparatus having an RF choke and a remote plasma source combined into a single unit. Process gases may be introduced to the chamber via the showerhead assembly which may be driven as an RF electrode. The gas feed tube may provide process gases and the cleaning gases to the process chamber. The inside of the gas feed tube may remain at a zero RF field to avoid premature gas breakdown within the gas feed tube that may lead to parasitic plasma formation between the gas source and the showerhead during processing. Igniting the cleaning gas plasma within the gas feed tube permits the plasma to be ignited closer to the processing chamber. Thus, RF current travels along the outside of the apparatus during deposition and microwave current ignites a plasma within the apparatus before feeding the plasma to the processing chamber.
摘要翻译: 本发明通常包括具有组合成单个单元的RF扼流圈和远程等离子体源的装置。 工艺气体可以经由可被作为RF电极驱动的喷头组件引入室。 气体供给管可以将处理气体和清洁气体提供给处理室。 气体供给管的内部可以保持在零RF场,以避免气体进料管内的过早气体击穿,这可能在处理期间导致气体源和喷头之间的寄生等离子体形成。 点燃气体供给管内的清洁气体等离子体允许等离子体更靠近处理室被点燃。 因此,RF电流在沉积期间沿着设备的外部行进,并且在将等离子体馈送到处理室之前,微波电流点燃设备内的等离子体。
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公开(公告)号:US09382621B2
公开(公告)日:2016-07-05
申请号:US12700484
申请日:2010-02-04
申请人: Soo Young Choi , Robin L. Tiner , Shinichi Kurita , John M. White , Carl A. Sorensen , Jeffrey A. Kho , Suhail Anwar , Makoto Inagawa , Gaku Furuta
发明人: Soo Young Choi , Robin L. Tiner , Shinichi Kurita , John M. White , Carl A. Sorensen , Jeffrey A. Kho , Suhail Anwar , Makoto Inagawa , Gaku Furuta
IPC分类号: C23C16/509 , C23C16/458 , H01J37/32 , H01L21/67
CPC分类号: C23C16/5096 , C23C16/4585 , H01J37/32091 , H01J37/32174 , H01J37/32568 , H01L21/67069
摘要: A method and apparatus for providing an electrically symmetrical ground or return path for electrical current between two electrodes is described. The apparatus includes at least on radio frequency (RF) device coupled to one of the electrodes and between a sidewall and/or a bottom of a processing chamber. The method includes moving one electrode relative to another and realizing a ground return path based on the position of the displaced electrode using one or both of a RF device coupled to a sidewall and the electrode, a RF device coupled to a bottom of the chamber and the electrode, or a combination thereof.
摘要翻译: 描述了一种用于提供用于两个电极之间的电流的电对称接地或返回路径的方法和装置。 该装置至少包括耦合到电极之一和处理室的侧壁和/或底部之间的射频(RF)装置。 该方法包括相对于另一个电极移动一个电极,并且基于使用耦合到侧壁和电极的RF器件中的一个或两个的位移电极实现接地返回路径,耦合到腔室的底部的RF器件和 电极或其组合。
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公开(公告)号:US08853098B2
公开(公告)日:2014-10-07
申请号:US13401755
申请日:2012-02-21
申请人: Sam H. Kim , John M. White , Soo Young Choi , Carl A. Sorensen , Robin L. Tiner , Beom Soo Park
发明人: Sam H. Kim , John M. White , Soo Young Choi , Carl A. Sorensen , Robin L. Tiner , Beom Soo Park
IPC分类号: H01L21/00 , H01L21/44 , H01L21/31 , H01L21/469 , H01L21/687 , H01L21/683
CPC分类号: H01L21/68742 , H01L21/6831
摘要: Embodiments disclosed herein generally relate to an apparatus and a method for placing a substrate substantially flush against a substrate support in a processing chamber. When a large area substrate is placed onto a substrate support, the substrate may not be perfectly flush against the substrate support due to gas pockets that may be present between the substrate and the substrate support. The gas pockets can lead to uneven deposition on the substrate. Therefore, pulling the gas from between the substrate and the support may pull the substrate substantially flush against the support. During deposition, an electrostatic charge can build up and cause the substrate to stick to the substrate support. By introducing a gas between the substrate and the substrate support, the electrostatic forces may be overcome so that the substrate can be separated from the susceptor with less or no plasma support which takes extra time and gas.
摘要翻译: 本文公开的实施例通常涉及用于将衬底基本上与衬底支撑件齐平地放置在处理室中的装置和方法。 当将大面积基板放置在基板支撑件上时,由于可能存在于基板和基板支撑件之间的气体袋,基板可能不能完全与基板支撑件齐平。 气袋可导致基板上的不均匀沉积。 因此,从衬底和支撑件之间拉动气体可以将衬底基本上与支撑件齐平。 在沉积期间,静电电荷可能积聚并使衬底粘附到衬底支撑件上。 通过在衬底和衬底支撑件之间引入气体,可以克服静电力,使得衬底可以用较少或不需要额外时间和气体的等离子体支架与基座分离。
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