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    MICROPARTICLE MEASUREMENT DEVICE
    26.
    发明申请
    MICROPARTICLE MEASUREMENT DEVICE 有权
    微波测量装置

    公开(公告)号：US20170045437A1

    公开(公告)日：2017-02-16

    申请号：US15117536

    申请日：2015-02-20

    申请人： NATIONAL UNIVERSITY CORPORATION KAGAWA UNIVERSITY

    发明人： Ichiro ISHIMARU

    IPC分类号： G01N15/14 ,  G01N21/64 ,  B01L3/00 ,  G01N21/65

    CPC分类号： G01N15/1436 ,  B01L3/502 ,  B01L2200/0647 ,  B01L2300/0609 ,  B01L2300/0654 ,  B01L2300/0861 ,  B01L2300/168 ,  G01N15/1434 ,  G01N15/1459 ,  G01N21/253 ,  G01N21/645 ,  G01N21/65 ,  G01N2015/0073 ,  G01N2015/1006 ,  G01N2021/6421 ,  G01N2021/6463 ,  G01N2201/06113

    摘要： In a microparticle measurement device, a sample is passed through each channel in a multi-flow channel, and a predetermined linear area is illuminated with light. Measurement light originating from a microparticle in the sample, such as scattered or fluorescent light, is shaped into a parallel beam by an objective lens and passes through a first and second transmission portions. The beams transmitted through these two portions are converged as first and second measurement beams onto the same straight line by a cylindrical lens. The intensity of the interference light formed by these beams is detected with a detector. Meanwhile, the light emitted from the light source and passing through the multi-flow channel without hitting the microparticle falls through the objective lens onto a non-reflection portion and does not travel toward the cylindrical lens. Accordingly, only the interference light formed by the measurement beams is allowed to fall onto the detector.

    摘要翻译： 在微粒测量装置中，样品通过多通道中的每个通道，并且用光照射预定的线性区域。 来自样品中的微粒（例如散射或荧光）的测量光通过物镜成形为平行光束，并通过第一和第二透射部分。 透过这两个部分的光束通过柱面透镜作为第一和第二测量光束会聚在相同的直线上。 由检测器检测由这些光束形成的干涉光的强度。 同时，从光源发射并穿过多流通道而不撞击微粒的光通过物镜落到非反射部分上，并且不朝向柱面透镜行进。 因此，只有由测量光束形成的干涉光才能落在检测器上。

    Microscope for high spatial resolution imaging a structure of interest in a sample
    29.
    发明授权
    Microscope for high spatial resolution imaging a structure of interest in a sample 有权
    显微镜用于高空间分辨率成像样本中感兴趣的结构

    公开(公告)号：US09348128B2

    公开(公告)日：2016-05-24

    申请号：US14394009

    申请日：2013-05-03

    申请人： Marc Guillon ,  Marcel Lauterbach ,  Valentina Emiliant

    发明人： Marc Guillon ,  Marcel Lauterbach ,  Valentina Emiliant

    IPC分类号： G02B21/00 ,  G01N21/64

    CPC分类号： G02B21/0032 ,  G01N21/6402 ,  G01N21/645 ,  G01N2021/6463 ,  G02B21/0056 ,  G02B21/0076

    摘要： A microscope for high spatial resolution imaging a structure of interest in a sample comprising a substance having a first state with first spectral properties and a second state with second spectral properties, the microscope comprising: an objective-lens assembly, a wave front modulating optical device adapted to spatially vary an intensity of a transfer light beam, a probe detector arranged to detect an optical measurement signal from a portion of the substance in the second state and placed in an area of the transfer light beam with an intensity adapted not to transfer the substance between the first and second states said microscope comprising a phase contrast microscopy system which includes an intensity detector arranged to detect an intensity of an illuminating light beam after said illuminating light beam has passed through the sample, the objective-lens assembly and the wave front modulating optical device.

    摘要翻译： 一种用于高空间分辨率成像的显微镜，其包括具有第一光谱特性的第一状态的物质和具有第二光谱特性的第二状态的样品中的感兴趣的结构，所述显微镜包括：物镜组件，波前调制光学装置 适于在空间上改变传输光束的强度;探测器检测器，被布置成检测来自第二状态的物质的一部分的光学测量信号，并且被放置在转印光束的区域中，强度不适于传送光 第一状态和第二状态之间的物质，所述显微镜包括相差显微镜系统，该相位显微镜系统包括强度检测器，该强度检测器被布置成在所述照明光束已经通过样品，物镜组件和波前面之后检测照明光束的强度 调制光学器件。