公开(公告)号：US09766123B2

公开(公告)日：2017-09-19

申请号：US15317592

申请日：2015-06-09

Applicant: STC.UNM

Inventor： Steven R. J. Brueck ,  Alexander Neumann ,  Payman Zarkesh-Ha

IPC: G01J5/02 ,  G01J1/06 ,  G01J3/28 ,  G01J3/18 ,  G01J1/44 ,  H01L27/144 ,  H01L31/0232 ,  H01L31/103 ,  H01L31/02 ,  H01L31/0216 ,  G02B6/122 ,  G02B6/12 ,  G02B6/124

CPC classification number: G01J1/06 ,  G01J1/44 ,  G01J3/0218 ,  G01J3/0259 ,  G01J3/18 ,  G01J3/1895 ,  G01J3/2803 ,  G01J2001/448 ,  G02B6/12004 ,  G02B6/122 ,  G02B6/124 ,  G02B2006/12061 ,  G02B2006/12107 ,  G02B2006/12138 ,  H01L27/1446 ,  H01L31/02019 ,  H01L31/02164 ,  H01L31/02327 ,  H01L31/103

Abstract: A 2-D sensor array includes a semiconductor substrate and a plurality of pixels disposed on the semiconductor substrate. Each pixel includes a coupling region and a junction region, and a slab waveguide structure disposed on the semiconductor substrate and extending from the coupling region to the region. The slab waveguide includes a confinement layer disposed between a first cladding layer and a second cladding layer. The first cladding and the second cladding each have a refractive index that is lower than a refractive index of the confinement layer. Each pixel also includes a coupling structure disposed in the coupling region and within the slab waveguide. The coupling structure includes two materials having different indices of refraction arranged as a grating defined by a grating period. The junction region comprises a p-n junction in communication with electrical contacts for biasing and collection of carriers resulting from absorption of incident radiation.

公开(公告)号：US09683890B2

公开(公告)日：2017-06-20

申请号：US14755745

申请日：2015-06-30

Applicant: SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC

Inventor： Orit Skorka ,  Salman Kabir

IPC: H01L27/00 ,  G01J1/44 ,  G01J1/02 ,  G01J1/04 ,  H01L27/146

CPC classification number: G01J1/44 ,  G01J1/0209 ,  G01J1/0411 ,  G01J1/0488 ,  G01J2001/446 ,  G01J2001/448 ,  H01L27/1461 ,  H01L27/14621 ,  H01L27/14627 ,  H01L27/14636 ,  H01L27/1464 ,  H01L27/14685

Abstract: An image sensor with an array of pixels is provided. In order to achieve high image quality, it may be desirable to improve well capacity of individual pixels within the array by forming deep photodiodes in a thick substrate. When forming the array of pixels, conductive contacts may be formed in a back surface of the substrate opposing ground contacts located on a front side of the substrate. A conductive grid layer may be formed over the conductive contacts. A color filter layer may be formed over the conductive grid layer that may include a barrier grid in which color filter material is deposited. The conductive grid layer and conductive contacts may be biased to a voltage to improve the strength of electric fields in the substrate. Conductive contacts will thereby improve charge collection and electrical isolation and prevent electrical crosstalk and blooming.

公开(公告)号：US20170131143A1

公开(公告)日：2017-05-11

申请号：US15318373

申请日：2014-07-02

Applicant: Andreas G. ANDREOU ,  Joseph H. LIN ,  Philippe O. POULIQUEN ,  Charbel G. RIZK ,  The Johns Hopkins University

Inventor： Andreas G. Andreou ,  Joseph H. Lin ,  Philippe O. Pouliquen ,  Charbel G. Rizk

IPC: G01J1/44 ,  H01L31/02 ,  H01L31/0352 ,  H01L31/107

CPC classification number: G01J1/44 ,  G01J2001/4406 ,  G01J2001/442 ,  G01J2001/4466 ,  G01J2001/448 ,  H01L31/02027 ,  H01L31/035272 ,  H01L31/107

Abstract: A photodetection circuit includes an avalanche photodiode and a mode switching circuit that may be configured to selectively switch an operating mode of the photodetection circuit between linear mode and Geiger mode. The photodetection circuit may further include a quenching circuit configured to quench and reset the avalanche photodiode in response to an avalanche event when the photodetection circuit is operated in Geiger mode. The photodetection circuit may additionally include an integration circuit configured to integrate photocurrent output by the photodiode and generate integrated charge units when the photodetection circuit is operated in linear mode. The photodetection circuit may also include a counter configured to count pulses output by the avalanche photodiode when the photodetection circuit is operated in Geiger mode and to count integrated charge units generated by the integration circuit when the photodetection circuit is operated in linear mode.

公开(公告)号：US09574936B2

公开(公告)日：2017-02-21

申请号：US14666762

申请日：2015-03-24

Applicant: Sharper Shape Oy

Inventor： Tero Heinonen

IPC: H01L27/146 ,  G01J1/44 ,  G01S17/00

CPC classification number: G01S7/4863 ,  G01J1/0228 ,  G01J1/4257 ,  G01J1/44 ,  G01J2001/448 ,  G01S17/00 ,  G01S17/107 ,  G01S17/89 ,  H01L27/146 ,  H01L27/14609

Abstract: A planar imaging sensor is provided. The planar imaging sensor comprises a plurality of photo detectors, wherein the plurality of photo detectors are divided into at least a first group and a second group. The number of photo detectors in the second group is larger than the number of photo detectors in the first group. The photo detectors of the first group are configured to have a first detection window, while the photo detectors of the second group are configured to have a second detection window. The second detection window is configured to start later in time than the first detection window.

Abstract translation: 提供平面成像传感器。 平面成像传感器包括多个光电检测器，其中多个光电检测器被分成至少第一组和第二组。 第二组中的光检测器的数量大于第一组中的光检测器的数量。 第一组的光电检测器被配置为具有第一检测窗口，而第二组的光电检测器被配置为具有第二检测窗口。 第二检测窗口被配置为比第一检测窗口更晚地启动。

公开(公告)号：US20160247848A1

公开(公告)日：2016-08-25

申请号：US15087733

申请日：2016-03-31

Applicant: SONY CORPORATION

Inventor： Ryosuke NAKAMURA ,  Fumihiko KOGA ,  Taiichiro WATANABE

IPC: H01L27/146 ,  G01J1/44

CPC classification number: H01L27/14614 ,  G01J1/44 ,  G01J2001/448 ,  H01L27/14605 ,  H01L27/1461 ,  H01L27/14612 ,  H01L27/14621 ,  H01L27/14627 ,  H01L27/14636 ,  H01L27/14638 ,  H01L27/1464 ,  H01L27/14641 ,  H01L27/14643 ,  H01L27/14645 ,  H01L27/14647 ,  H01L27/14689

Abstract: There is provided a solid-state image pickup device including: a semiconductor substrate (21); a photodiode (11A, 11B) formed in the semiconductor substrate; a transistor (10) having a gate electrode (14) part or all of which is embedded in the semiconductor substrate, the transistor being configured to read a signal electric charge from the photodiode via the gate electrode; and an electric charge transfer layer (13) provided between the gate electrode and the photodiode.

Abstract translation: 提供一种固态摄像装置，包括：半导体衬底（21）; 形成在半导体衬底中的光电二极管（11A，11B） 晶体管（10），其栅极电极（14）的一部分或全部嵌入所述半导体衬底中，所述晶体管被配置为经由所述栅极电极从所述光电二极管读取信号电荷; 以及设置在栅电极和光电二极管之间的电荷转移层（13）。

公开(公告)号：US20150145539A1

公开(公告)日：2015-05-28

申请号：US14258184

申请日：2014-04-22

Applicant: NATIONAL CHI NAN UNIVERSITY

Inventor： Tai-Ping SUN ,  Yi-Chuan LU ,  Tsung-Shuo KAO

IPC: G01R27/02

CPC classification number: G11C7/1051 ,  A61B5/0531 ,  A61B5/7225 ,  G01J1/44 ,  G01J2001/448 ,  G01L1/205 ,  G01R27/02 ,  G01R27/14 ,  H04N5/357 ,  H04N5/3745 ,  H04N5/378

Abstract: A readout device includes a plurality of detecting circuits arranged in rows and columns to form a detecting array, and an output module. Each of the detecting circuits includes two transistors for generating a detection signal associated with impedance at a target site. Through selection of the rows and the columns of the detecting circuits, the output module outputs an output voltage signal having a magnitude positively correlated with magnitude of a selected one of the detection signals received from the detecting circuits.

Abstract translation: 读出装置包括以行和列排列以形成检测阵列的多个检测电路和输出模块。 每个检测电路包括用于产生与目标位置处的阻抗相关联的检测信号的两个晶体管。 通过选择检测电路的行和列，输出模块输出具有与从检测电路接收的所选择的一个检测信号的幅度正相关的幅度的输出电压信号。

公开(公告)号：US08969782B2

公开(公告)日：2015-03-03

申请号：US13607123

申请日：2012-09-07

Applicant: Young-Chul Sohn

Inventor： Young-Chul Sohn

IPC: H01J40/14 ,  H01J27/00

CPC classification number: G01J1/46 ,  G01J2001/448 ,  G11C27/02 ,  G11C27/024 ,  H04N5/378

Abstract: A signal sampling circuit includes: a signal output unit configured to output a level signal to an output node in response to a control signal; a signal sampling unit coupled to the output node and configured to sample the level signal in a sampling period; a first current sinking unit configured to sink a constant current from the output node; and a second current sinking unit configured to sink a current from the output node after a time point where the control signal is deactivated.

Abstract translation: 信号采样电路包括：信号输出单元，被配置为响应于控制信号将电平信号输出到输出节点; 信号采样单元，其耦合到所述输出节点并且被配置为在采样周期中对所述电平信号进行采样; 第一电流吸收单元，被配置为从所述输出节点吸收恒定电流; 以及第二电流吸收单元，配置成在控制信号被去激活的时间点之后从输出节点吸收电流。

公开(公告)号：US5233174A

公开(公告)日：1993-08-03

申请号：US849569

申请日：1992-03-11

Applicant: William Zmek

Inventor： William Zmek

IPC: G01J1/44 ,  G01J9/00

CPC classification number: G01J9/00 ,  G01J2001/448

Abstract: A wavefront sensor (10) includes a radiation sensor (2) and an array (12) of lenslets (12A) that are optically coupled to the radiation sensor. The array of lenslets has a radiation receiving surface for receiving an incident wavefront and for focussing the wavefront at a plurality of focal positions upon the radiation sensor. Each of the lenslets comprises a diffractive optical element having an optical center that is located at a predetermined point for inducing an equal and opposite tilt to a portion of the wavefront incident on the lenslet. As a result, an aberration within that portion of the wavefront is cancelled. The predetermined point is determined to be equal to and opposite a focal spot shift of the lenslet.

Abstract translation: 波前传感器（10）包括光学耦合到辐射传感器的辐射传感器（2）和小透镜阵列（12）。 小透镜阵列具有用于接收入射波阵面的辐射接收表面，并用于在波长传感器上的多个焦点位置聚焦波前。 每个小透镜包括衍射光学元件，该衍射光学元件具有位于预定点处的光学中心，用于引起与入射到小透镜上的波前的一部分相等且相反的倾斜。 结果，波前的该部分内的像差被消除。 该预定点被确定为等于和相对于小透镜的焦点偏移。

公开(公告)号：US5010827A

公开(公告)日：1991-04-30

申请号：US521082

申请日：1990-05-08

Applicant: George Kychakoff ,  Gene P. Ort

Inventor： George Kychakoff ,  Gene P. Ort

IPC: F23M11/04 ,  D21C11/12 ,  F23G5/50 ,  F23G7/04 ,  F23N5/00 ,  F23N5/08 ,  F23N5/26 ,  G01J1/44 ,  G01J5/00 ,  G01N15/10

CPC classification number: G01J5/08 ,  F23N5/082 ,  G01J5/0044 ,  G01J5/0846 ,  F23N2029/08 ,  F23N2029/16 ,  F23N2035/06 ,  F23N2035/14 ,  G01J2001/448 ,  G01J2005/0077 ,  G01N15/10

Abstract: An apparatus for detecting the presence of carryover particles in an upper region of a furnace, such as a smelt bed boiler, includes plural spaced apart detectors. These detectors monitor discrete portions of the interior of the furnace for the purpose of detecting carryover particles in such monitored portions. Signals indicative of the carryover particles are processed to obtain a count of the carryover particles. The carryover particle count may then be displayed. For example, the signals from all of the detectors may be averaged with trends and overall changes in count rates then displayed. In addition, the counts from the individual detectors may also be displayed to assist an operator in locating the source of excessive carryover particles in the furnace. An image sensor, such as a charged coupled device (CCD) detector, may be used to provide a visual display of detected carryover particles. The information on carryover particle count may be used in controlling parameters affecting the performance of the furnace directly, or indirectly by way of operator input.

Abstract translation: 用于检测在诸如冶炼床锅炉的炉的上部区域中的残留颗粒的存在的装置包括多个间隔开的检测器。 这些检测器监测炉内部的离散部分，以便检测这些监测部分中的残留颗粒。 处理指示残留颗粒的信号以获得携带颗粒的计数。 然后可以显示携带粒子计数。 例如，来自所有检测器的信号可以用趋势进行平均，然后显示计数率的总体变化。 此外，还可以显示来自各个检测器的计数，以帮助操作者将过量携带颗粒的源定位在炉中。 可以使用诸如电荷耦合器件（CCD）检测器的图像传感器来提供检测到的携带粒子的视觉显示。 关于携带粒子计数的信息可以直接用于控制影响炉子性能的参数，或间接地用于操作员输入。

公开(公告)号：US12123975B2

公开(公告)日：2024-10-22

申请号：US18495608

申请日：2023-10-26

Applicant: STMICROELECTRONICS (RESEARCH & DEVELOPMENT) LIMITED

Inventor： Christopher Townsend ,  Thineshwaran Gopal Krishnan ,  James Peter Drummond Downing ,  Kevin Channon

IPC: G01S7/481 ,  G01J1/44 ,  G01S17/10 ,  G02B27/30 ,  H01S5/02253 ,  H01S5/42

CPC classification number: G01S7/4814 ,  G01J1/44 ,  G01S7/4816 ,  G01S17/10 ,  G02B27/30 ,  H01S5/02253 ,  H01S5/423 ,  G01J2001/4466 ,  G01J2001/448

Abstract: An apparatus comprises an array of vertical-cavity surface-emitting lasers. Each of the vertical-cavity surface-emitting lasers is configured to be a source of light. The apparatus also comprises an optical arrangement configured to receive light from a plurality of the vertical-cavity surface-emitting lasers and to output a plurality of light beams.