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1928 条记录 (耗时 0.034 秒)

    Differential phase-contrast imaging
    84.
    发明授权
    Differential phase-contrast imaging 有权

    公开(公告)号：US09861330B2

    公开(公告)日：2018-01-09

    申请号：US13878841

    申请日：2011-10-17

    申请人： Ewald Rössl

    发明人： Ewald Rössl

    IPC分类号： A61B6/00 ,  G21K1/06 ,  G01N23/04 ,  A61B6/03 ,  G01N23/20 ,  A61B6/06

    CPC分类号： A61B6/484 ,  A61B6/032 ,  A61B6/06 ,  A61B6/4035 ,  A61B6/4291 ,  G01N23/046 ,  G01N23/20075 ,  G21K1/06 ,  G21K1/067

    摘要： The present invention relates to differential phase-contrast imaging, in particular to a structure of a diffraction grating, e.g. an analyzer grating and a phase grating, for X-ray differential phase-contrast imaging. In order to provide enhanced phase-gradient based image data, a diffraction grating (14, 15) for X-ray differential phase-contrast imaging, is provided with a first sub-area (23) comprising at least one portion (24) of a first grating structure (26) and at least one portion (28) of a second grating structure (30). The first grating structure comprises a plurality of bars (34) and gaps (36) with a first grating orientation GO1 (37), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The second grating structure comprises a plurality of bars (40) and gaps (42) with a second grating orientation GO2 (44), being arranged periodically, wherein the bars are arranged such that they change the phase and/or amplitude of an X-ray radiation and wherein the gaps are X-ray transparent. The first grating orientation GO1 is different than the second grating orientation GO2. Thus, phase-gradient based image information can be acquired for different directions without the necessity to rotate or pivot any of the respective gratings between the acquisition steps, for example.

    Measurement chamber for a compact goniometer in an x-ray spectrometer
    87.
    发明申请
    Measurement chamber for a compact goniometer in an x-ray spectrometer 审中-公开

    公开(公告)号：US20170356862A1

    公开(公告)日：2017-12-14

    申请号：US15617154

    申请日：2017-06-08

    申请人： Bruker AXS GmbH

    发明人： Gerhard HAMMERSCHMID ,  Carolin BENZ ,  Frank FILSINGER

    IPC分类号： G01N23/207 ,  G01N23/223 ,  G01N23/20

    CPC分类号： G01N23/2076 ,  G01N23/20016 ,  G01N23/2209 ,  G01N23/223 ,  G01N2223/076

    摘要： A measurement chamber (2) of an x-ray spectrometer (1) comprising a goniometer (3) for analyzing x-ray fluorescence radiation from a measuring sample (4) comprises an entrance opening for the entry of x-ray fluorescence radiation into the measurement chamber, a first goniometer arm (5) for holding and adjusting an analyzer crystal (5a), and a second goniometer arm (6) for holding and adjusting an x-ray detector (6a, 6b), wherein the measurement chamber is sealed in a vacuum-tight manner and the entrance opening for the x-ray fluorescence radiation is sealed in a vacuum-tight manner by way of a window (7). The measurement chamber is distinguished in that it contains a bearing block (8) for receiving and holding both goniometer arms in a concentric and rotatable manner, said goniometer arms each being mechanically adjustable by means of a plezo-motor (15, 16), which is securely connected to the bearing block or a drive plate (9′, 9″) of the respective goniometer arm, and in that the measurement chamber contains all mechanical components of the goniometer. This allows the provision of a more compact, lighter and more stable x-ray spectrometer comprising a rotatable goniorneter, which causes as little heat influx, into the overall system as possible. At the same time, the mechanical stability requirements in respect of the measurement chamber are minimized in order to reduce costs and weight.