Apparatus for measuring the electrical characteristics of a
semiconductor wafer
    1.
    发明授权
    Apparatus for measuring the electrical characteristics of a semiconductor wafer 失效
    用于测量半导体波形的电气特性的装置

    公开(公告)号:US5179333A

    公开(公告)日:1993-01-12

    申请号:US614153

    申请日:1990-11-16

    CPC分类号: G01R31/2831

    摘要: A semiconductor wafer evaluation apparatus, wherein a conductivity detector and a carrier mobility detector are independently arranged so that detections can be made under optimum conditions, respectively. A wafer carrying unit is arranged so as to carry or convey a semiconductor wafer on a carrying path between the two detectors. These components are controlled by a controller. A carrier concentration is calculated from the conductivity and the carrier mobility detected by both detectors. When a partition wall for preventing interference of an electromagnetic wave is provided between the conductivity detector and the carrier mobility detector, interference between the two detectors is further reduced.

    Light-emission gun amusement machine for home use
    2.
    发明授权
    Light-emission gun amusement machine for home use 失效
    用于家庭使用的轻型喷枪机

    公开(公告)号:US4052066A

    公开(公告)日:1977-10-04

    申请号:US659553

    申请日:1976-02-19

    申请人: Takao Ohta

    发明人: Takao Ohta

    CPC分类号: F41G3/2627 F41J5/10 F41J9/14

    摘要: A compact light-emission gun amusement machine for home use, comprising a light source, a screen, a mirror as disposed between the screen and light source, the angle of reflection of the mirror being variable to project a moving mark on said screen, a light-emission weapon and a novel hit indicating device in a novel combination. The hit indicating device includes a mirror vertical drive mechanism connected to a driving shaft driven by an electric motor and a mirror horizontal drive mechanism which is associated with the driving shaft in such relation that the former is driven only when the latter is driven in a reverse direction. Thus, as the motor is driven in a normal direction, the mark is caused to move in a composite direction made up of horizontal and vertical components to simulate a flight of a winged creature, while as the same motor is driven in reverse, the horizontal drive of the mirror is suspended to cause the mark to move in a vertically downward direction only across the screen to simulate a fall of the creature shot by the weapon.

    Delay switch
    7.
    发明授权
    Delay switch 失效
    延时开关

    公开(公告)号:US4638128A

    公开(公告)日:1987-01-20

    申请号:US766397

    申请日:1985-08-16

    IPC分类号: H01H7/14 H01H23/22 H01H7/00

    CPC分类号: H01H23/22 H01H7/14

    摘要: A delay switch comprising a delay element provided in the center of a body to produce a delayed output, a delay cam unit provided on one side of the delay element to start its actuation always from an identical position in response to the delayed output, and switching contact members electrically connected to terminals on other opposing sides of the delay element through the delay cam unit, realizing thus concurrently a constant delay time and a compact assembly.

    摘要翻译: 一种延迟开关,包括设置在主体中心以产生延迟输出的延迟元件,延迟凸轮单元,其设置在所述延迟元件的一侧上,以响应于所述延迟输出始终从相同的位置开始其致动,并且切换 接触构件通过延迟凸轮单元电连接到延迟元件的其它相对侧上的端子,从而同时实现恒定的延迟时间和紧凑的组装。

    Measuring circuit device
    8.
    发明授权
    Measuring circuit device 失效
    测量电路装置

    公开(公告)号:US4592003A

    公开(公告)日:1986-05-27

    申请号:US521837

    申请日:1983-08-10

    IPC分类号: G01K1/02 G01K7/24 G01K7/16

    CPC分类号: G01K7/245 G01K1/028

    摘要: A measuring circuit device comprising a measuring circuit, a display associated with the measuring circuit for displaying data generated by the measuring circuit, a display test circuit for testing the display, a performance test circuit associated with the measuring circuit for actuating the measuring circuit to display predetermined reference measured data by the display, a switch for initiating operation of the device, a switch circuit which upon actuation of the switch actuates the display test circuit and the performance test circuit, and which in a predetermined time period, initiates a measuring operation by the measuring circuit.

    摘要翻译: 一种测量电路装置,包括测量电路,与用于显示测量电路产生的数据的测量电路相关联的显示器,用于测试显示器的显示测试电路,与测量电路相关联的性能测试电路,用于致动测量电路以显示 通过显示器的预定参考测量数据,用于启动设备的操作的开关,开关电路,其在开关致动时致动显示测试电路和性能测试电路,并且在预定时间段内,通过以下方式启动测量操作: 测量电路。

    Method of fabricating MOS device on a SOS wafer by stabilizing interface
region with silicon and oxygen implant
    9.
    发明授权
    Method of fabricating MOS device on a SOS wafer by stabilizing interface region with silicon and oxygen implant 失效
    通过用硅和氧气植入物稳定界面区域在SOS晶片上制造MOS器件的方法

    公开(公告)号:US4523963A

    公开(公告)日:1985-06-18

    申请号:US583833

    申请日:1984-02-27

    摘要: A method for manufacturing a semiconductor device, comprising the steps of forming a monocrystalline silicon layer on a sapphire substrate, ion-implanting silicon and oxygen in a portion of the silicon layer which is in the vicinity of an interface between the substrate and the silicon layer, performing annealing to improve a crystal structure of the portion of the silicon layer in the vicinity of the interface and forming an insulation layer, selectively forming an element isolation region in the silicon layer to obtain an island silicon layer, forming a gate insulation film on the island silicon layer, forming a gate electrode on the gate insulation film, ion-implanting an impurity in the island silicon layer by using the gate electrode as a mask, and annealing a resultant structure to form source and drain regions in the island silicon layer such that bottoms thereof reach a surface of the insulation layer.

    摘要翻译: 一种制造半导体器件的方法,包括以下步骤:在蓝宝石衬底上形成单晶硅层,在硅层的位于衬底和硅层之间的界面附近的部分中离子注入硅和氧 ,进行退火以提高界面附近的硅层的部分的晶体结构,形成绝缘层,在硅层中选择性地形成元件隔离区域,得到岛状硅层,形成栅极绝缘膜 岛状硅层,在栅极绝缘膜上形成栅电极,通过使用栅极电极作为掩模,在岛状硅层中离子注入杂质,退火所得的结构,在岛状硅层中形成源极和漏极区域 使得其底部到达绝缘层的表面。