SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
    2.
    发明申请
    SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME 有权
    半导体器件及其制造方法

    公开(公告)号:US20100019357A1

    公开(公告)日:2010-01-28

    申请号:US11574483

    申请日:2005-08-30

    IPC分类号: H01L29/51 H01L21/314

    摘要: A gate insulating film having a high dielectric constant, a semiconductor device provided with the gate insulating film, and a method for manufacturing such film and device are provided. The semiconductor device is provided with a group 14 (IVB) semiconductor board and a first oxide layer. The first oxide layer is composed of MO2 existing on the board, where M is a first metal species selected from the group 4 (IVA); and M′xOy, where M′ is a second metal species selected from the group 3 (IIIA) and a group composed of lanthanide series, and x and y are integers decided by the oxidation number of M.

    摘要翻译: 提供具有高介电常数的栅极绝缘膜,设置有栅极绝缘膜的半导体器件及其制造方法。 半导体器件具有第14族(IVB)半导体基板和第1氧化物层。 第一氧化物层由存在于板上的MO2组成,其中M是选自第4族(IVA)的第一种金属; 和M'xOy,其中M'是选自组3(IIIA)的第二种金属和由镧系元素组成的组,x和y是由氧化数M决定的整数。