Method for Manufacturing Optical Sensor Arrangements And Housing For An Optical Sensor

    公开(公告)号:US20190267424A1

    公开(公告)日:2019-08-29

    申请号:US16346273

    申请日:2017-10-19

    Applicant: ams AG

    Abstract: A method for manufacturing optical sensor arrangements is provided. The method comprises providing at least two optical sensors on a carrier and providing a cover material on the side of the optical sensors facing away from the carrier. The method further comprises providing an aperture for each optical sensor on a top side of the cover material facing away from the carrier and forming at least one trench between the optical sensors from the carrier towards the top side of the cover material, the trench comprising inner walls. Moreover, the method comprises coating the inner walls with an opaque material, such that an inner volume of the trench is free of the opaque material, and singulating of the optical sensor arrangements along the at least one trench. Furthermore, a housing for an optical sensor is provided.

    OPTICAL SENSOR ARRANGEMENT, DEVICE AND METHOD OF MANUFACTURING AN OPTICAL SENSOR ARRANGEMENT

    公开(公告)号:US20210373132A1

    公开(公告)日:2021-12-02

    申请号:US17272718

    申请日:2019-09-02

    Applicant: ams AG

    Abstract: A method of manufacturing an optical sensor arrangement including the steps of providing a substrate having a surface and providing an integrated circuit comprising an optical detector arranged for detecting light of a desired wavelength range. The integrated circuit and a light emitter are mounted onto the surface, wherein the light emitter is arranged for emitting light in the desired wavelength range. The integrated circuit and the light emitter are electrically connected to each other and to the substrate. A light barrier is formed between the optical detector and the light emitter by dispensing a first optically opaque material along a profile of the integrated circuit. A mold layer is formed by at least partly encapsulating the substrate, the integrated circuit and the light emitter with an optically transparent material. A casing, made from a second optically opaque material, is mounted on the light barrier and thereby encloses a hollow space between the casing and the mold layer.

    CHIP SCALE CURRENT SENSOR PACKAGE AND METHOD OF PRODUCING A CURRENT SENSOR PACKAGE
    4.
    发明申请
    CHIP SCALE CURRENT SENSOR PACKAGE AND METHOD OF PRODUCING A CURRENT SENSOR PACKAGE 审中-公开
    芯片尺寸电流传感器封装和生产电流传感器封装的方法

    公开(公告)号:US20160313375A1

    公开(公告)日:2016-10-27

    申请号:US15102410

    申请日:2014-11-27

    Applicant: AMS AG

    CPC classification number: G01R15/202 G01R15/20 G01R19/0092

    Abstract: The chip scale current sensor package comprises an IC chip (1) including a sensor (5) for measuring a magnetic field, and an electrically conductive layer (2) applied to a main surface (10) of the IC chip. The sensor is arranged for a measurement of a magnetic field generated by an electric current (6) flowing in the electrically conductive layer, and the electrically conductive layer is insulated from contact pads (4) electrically connecting the IC.

    Abstract translation: 芯片级电流传感器封装包括包括用于测量磁场的传感器(5)的IC芯片(1)和施加到IC芯片的主表面(10)的导电层(2)。 传感器布置成用于测量由在导电层中流动的电流(6)产生的磁场,并且导电层与电连接IC的接触焊盘(4)绝缘。

    METHOD FOR FABRICATING A PLURALITY OF TIME-OF-FLIGHT SENSOR DEVICES

    公开(公告)号:US20200333442A1

    公开(公告)日:2020-10-22

    申请号:US16754335

    申请日:2018-10-10

    Applicant: ams AG

    Abstract: A method for fabricating a plurality of Time-of-Flight sensor devices (1) comprises a step of providing a wafer (100) including a plurality of wafer portions (110) for a respective one of the Time-of-Flight sensor devices (1), wherein each of the wafer portions (110) includes a first light detecting area (10) and a second light detecting area (20) and a respective light emitter device (30). The respective light emitter device (30) and the respective first light detecting area (10) is encapsulated by a first volume (40) of a light transparent material (130), and the respective second light detecting area (20) is encapsulated by a second volume (50) of the light transparent material (130). Before singulation of the devices (1), an opaque material (60) is placed on the wafer portions (110) in a space (120) between the respective first and second volume (40, 50) of the light transparent material (130).

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