Abstract:
Disclosed is a bump structure, which has a hollow body, for electrically connecting a first member and a second member. Also disclosed is a method for making a bump structure, which has the steps of: preparing a molding plate with a concave mold to mold a bump-forming member; forming a conductive thin film so as to form a predetermined cavity in the concave mold of the molding plate; preparing a substrate to which the conductive thin film is to be transferred; and transferring the conductive thin film formed on the molding plate to the substrate.
Abstract:
An electronic device assembly for dense mounting of electronic devices and method of connecting the electronic devices are disclosed. Conductive portions implemented by metal bumps and sealing portions implemented by adhesive seal resin are connected by thermocompress ion at the same time between two electronic devices. This may be repeated between three or more electronic device.
Abstract:
A metal layer is formed on each surface of topside substrate electrodes on a substrate. Another metal layer is formed on each surface of chip electrodes on a function element chip. Both ends of vertical coil springs are connected to the topside substrate electrodes and the chip electrodes through the metal layers, respectively. In this way, the topside substrate electrodes are connected to the chip electrodes through the vertical coil springs by means of flip hip bonding. Thereby, there is provided a semiconductor device having flip chip bonding structure, a production method thereof, a coil spring cutting jig and a coil spring guiding jig applied thereto, wherein: it is possible to prevent faulty connection caused by the thermal expansion difference between a function element device and a substrate; after a function element device and a substrate that are connected through a connection formation is separated from each other because a faulty point has been found in an electrical inspection after the tentative connection, it is possible to easily reconnect the function element device and the substrate; the configuration is simple and the packaging cost is low; and even if a high-power-consumption-type function element device is applied, it is possible to realize low thermal resistibility and high reliability of connection.
Abstract:
A semiconductor device includes (a) a semiconductor chip, (b) a patterned lead composed of an electrical conductor and formed on the semiconductor chip in electrical contact with the semiconductor chip, and (c) a resin film sealing a main surface of the semiconductor chip therewith. The lead has a portion projecting beyond the main surface of the semiconductor chip.