Method and system for controlling an implantation process
    1.
    发明授权
    Method and system for controlling an implantation process 有权
    用于控制植入过程的方法和系统

    公开(公告)号:US08241924B2

    公开(公告)日:2012-08-14

    申请号:US12394201

    申请日:2009-02-27

    Abstract: A method for implant uniformity is provided that includes determining a variation of critical dimensions (CD) of a semiconductor wafer, moving the semiconductor wafer in a two-dimensional mode during an implantation process, and controlling a velocity of the movement of the semiconductor wafer so that an implant dose to the semiconductor wafer is varied based on the variation of CD.

    Abstract translation: 提供了一种用于植入均匀性的方法,其包括确定半导体晶片的临界尺寸(CD)的变化,在注入过程期间以二维模式移动半导体晶片,以及控制半导体晶片的移动速度 基于CD的变化改变对半导体晶片的植入剂量的变化。

    METHOD AND SYSTEM FOR CONTROLLING AN IMPLANTATION PROCESS
    2.
    发明申请
    METHOD AND SYSTEM FOR CONTROLLING AN IMPLANTATION PROCESS 有权
    用于控制植入过程的方法和系统

    公开(公告)号:US20100221849A1

    公开(公告)日:2010-09-02

    申请号:US12394201

    申请日:2009-02-27

    Abstract: A method for implant uniformity is provided that includes determining a variation of critical dimensions (CD) of a semiconductor wafer, moving the semiconductor wafer in a two-dimensional mode during an implantation process, and controlling a velocity of the movement of the semiconductor wafer so that an implant dose to the semiconductor wafer is varied based on the variation of CD.

    Abstract translation: 提供了一种用于植入均匀性的方法,其包括确定半导体晶片的临界尺寸(CD)的变化,在注入过程期间以二维模式移动半导体晶片,以及控制半导体晶片的移动速度 基于CD的变化改变对半导体晶片的植入剂量的变化。

    Method for fabricating an isolation structure
    8.
    发明授权
    Method for fabricating an isolation structure 有权
    隔离结构的制造方法

    公开(公告)号:US08580653B2

    公开(公告)日:2013-11-12

    申请号:US13775907

    申请日:2013-02-25

    CPC classification number: H01L21/76224 H01L21/76232

    Abstract: A method of fabricating an isolation structure including forming a trench in a top surface of a substrate and partially filling the trench with a first oxide, wherein the first oxide is a pure oxide. Partially filling the trench includes forming a liner layer in the trench and forming the first oxide over the liner layer using silane and oxygen precursors at a pressure less than 10 milliTorr (mTorr) and a temperature ranging from about 500° C. to about 1000° C. The method further includes producing a solid reaction product in a top portion of the first oxide. The method further includes sublimating the solid reaction product by heating the substrate in a chamber at a temperature from 100° C. to 200° C. and removing the sublimated solid reaction product by flowing a carrier gas over the substrate. The method further includes filling the trench with a second oxide.

    Abstract translation: 一种制造隔离结构的方法,包括在衬底的顶表面中形成沟槽并用第一氧化物部分地填充沟槽,其中第一氧化物是纯氧化物。 部分地填充沟槽包括在沟槽中形成衬层,并且在低于10毫托(mTorr)的压力和约500℃至约1000℃的温度下使用硅烷和氧前体在衬层上形成第一氧化物 该方法还包括在第一氧化物的顶部产生固体反应产物。 该方法还包括通过在室内在100℃至200℃的温度下加热基底来升华固体反应产物,并通过使载气流过基底而除去升华的固体反应产物。 该方法还包括用第二氧化物填充沟槽。

    INDUCTIVE PLASMA DOPING
    9.
    发明申请
    INDUCTIVE PLASMA DOPING 审中-公开
    电感等离子喷涂

    公开(公告)号:US20100167506A1

    公开(公告)日:2010-07-01

    申请号:US12347483

    申请日:2008-12-31

    Abstract: In some embodiments, a method of doping a semiconductor wafer disposed on a pedestal electrode in an inductive plasma chamber includes generating a plasma having a first voltage with respect to ground in the inductive plasma chamber, and applying a radio frequency (RF) voltage with respect to ground to the pedestal electrode in the inductive plasma chamber. The positive RF voltage is based on the first voltage of the plasma.

    Abstract translation: 在一些实施例中,掺杂设置在感应等离子体室中的基座电极上的半导体晶片的方法包括在感应等离子体室中产生相对于接地的第一电压的等离子体,并且施加射频(RF)电压 接地到电感等离子体室中的基座电极。 正RF电压基于等离子体的第一电压。

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