摘要:
A data system may dynamically prioritize and ingest data so that, regardless of the memory size of the dataset hosted by the data system, it may process and analyze the hosted dataset in constant time. The system and method may implement a first space-efficient probabilistic data structure on the dataset, wherein the dataset includes a plurality of profile data. It may then receive update data corresponding to some of the plurality of profile data and implement a second space-efficient probabilistic data structure on the dataset including the update data. The system and method may then determine a set of non-shared profile data of the second space-efficient probabilistic data structure and prioritize the set of non-shared profile data of the second space-efficient probabilistic data structure over other profile data of the dataset for caching.
摘要:
A semiconductor device has a semiconductor die. An encapsulant is deposited around the semiconductor die. An interconnect structure having a conductive bump is formed over the encapsulant and semiconductor die. A mechanical support layer is formed over the interconnect structure and around the conductive bump. The mechanical support layer is formed over a corner of the semiconductor die and over a corner of the interconnect structure. An opening is formed through the encapsulant that extends to the interconnect structure. A conductive material is deposited within the opening to form a conductive through encapsulant via (TEV) that is electrically connected to the interconnect structure. A semiconductor device is mounted to the TEV and over the semiconductor die to form a package-on-package (PoP) device. A warpage balance layer is formed over the encapsulant opposite the interconnect structure.
摘要:
A semiconductor device has a carrier with a die attach area. A semiconductor die is mounted to the die attach area with a back surface opposite the carrier. A modular interconnect unit is mounted over the carrier and around or in a peripheral region around the semiconductor die such that the modular interconnect unit is offset from the back surface of the semiconductor die. An encapsulant is deposited over the carrier, semiconductor die, and modular interconnect unit. A first portion of the encapsulant is removed to expose the semiconductor die and a second portion is removed to expose the modular interconnect unit. The carrier is removed. An interconnect structure is formed over the semiconductor die and modular interconnect unit. The modular interconnect unit includes a vertical interconnect structures or bumps through the semiconductor device. The modular interconnect unit forms part of an interlocking pattern around the semiconductor die.
摘要:
A semiconductor device has a semiconductor die and encapsulant deposited over the semiconductor die. A first insulating layer is formed over the die and encapsulant. The first insulating layer is cured with multiple dwell cycles to enhance adhesion to the die and encapsulant. A first conductive layer is formed over the first insulating layer. A second insulating layer is formed over the first insulating layer and first conductive layer. The second insulating layer is cured with multiple dwell cycles to enhance adhesion to the first insulating layer and first conductive layer. A second conductive layer is formed over the second insulating layer and first conductive layer. A third insulating layer is formed over the second insulating layer and second conductive layer. The first, second, and third insulating layers have different CTE. The second insulating layer or third insulating layer is cured to a dense state to block moisture.
摘要:
A semiconductor device has a semiconductor die and conductive layer formed over a surface of the semiconductor die. A first channel can be formed in the semiconductor die. An encapsulant is deposited over the semiconductor die. A second channel can be formed in the encapsulant. A first insulating layer is formed over the semiconductor die and first conductive layer and into the first channel. The first insulating layer extends into the second channel. The first insulating layer has characteristics of tensile strength greater than 150 MPa, elongation between 35-150%, and thickness of 2-30 micrometers. A second insulating layer can be formed over the semiconductor die prior to forming the first insulating layer. An interconnect structure is formed over the semiconductor die and encapsulant. The interconnect structure is electrically connected to the first conductive layer. The first insulating layer provides stress relief during formation of the interconnect structure.
摘要:
A packet loss estimation technique is disclosed that utilizes the sampled flow level statistics that are routinely collected in operational networks, thereby obviating the need for any new router features or measurement infrastructure. The technique is specifically designed to handle the challenges of sampled flow-level aggregation such as information loss resulting from packet sampling, and generally comprises: receiving a first record of sampled packets for a flow from a first network element; receiving a second record of sampled packets for the flow from a second network element communicating with the first network element; correlating sampled packets from the flow at the first network element and the second network element to a measurement interval; and estimating the packet loss using a count of the sampled packets correlated to the measurement interval.
摘要:
Systems and methods are disclosed to probe a network includes generating a set of probing pairs from a network topology for unicast network delay tomography; probing the network using monitoring hosts in the network; and determining network performance from the probing results.
摘要:
A method and apparatus for providing performance measurements on network tunnels in packet networks are disclosed. For example, the method establishes two tunnels between a first measurement host and a first router, and establishes a tunnel between the first router and a second measurement host. The method also establishes a multicast group having a plurality of members, and sends one or more packets addressed to the multicast group from the first measurement host. The method measures the frequencies of directly and/or indirectly received responses from the plurality of members of the multicast group, and provides a plurality of estimated values for a plurality of packet transmission rates from measurement of the frequencies for one or more of said tunnels.
摘要:
A document editing support device includes: an object obtaining unit that obtains at least one object as data representing at least one of a text and an image included in a document as a target to be edited; a split ratio storage unit that stores a predetermined split ratio; a reference line setting unit that extracts two lines from at least one of a circumscribed polygon and a boundary and sets the extracted lines as reference lines, the circumscribed polygon being of an object other than a target object, a location of which is to be determined relative to at least one object obtained by the object obtaining unit, and the boundary being of a layout area where objects are to be located in the document; a virtual line generation unit that generates a virtual line that splits an interval between the two reference lines set by the reference line setting unit, at a split ratio stored in the split ratio storage unit; and a location unit that determines a location of the target object, the location of which is to be determined, along the virtual line generated by the virtual line generation unit, within the layout area.
摘要:
Aspects of the invention can relate to an image layout device and an image layout method. The image layout device of the invention can be a device that automatically arranges a plurality of images within a particular area, and can include a layout angle determining device that determines the layout angle for each of the images based on an angle that is an integer multiple of a golden angle, and a layout position determining device that determines the layout position for each of the images depending on the overlap between each of the images due to the angle determined by the layout angle determining device.