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    Method for specimen measurement
    4.
    发明授权
    Method for specimen measurement 失效
    样本测量方法

    公开(公告)号：US5601983A

    公开(公告)日：1997-02-11

    申请号：US395631

    申请日：1995-02-28

    申请人： Hidehito Takayama ,  Matsuomi Nishimura ,  Kazumi Tanaka ,  Toshikazu Ohnishi ,  Takeshi Miyazaki

    发明人： Hidehito Takayama ,  Matsuomi Nishimura ,  Kazumi Tanaka ,  Toshikazu Ohnishi ,  Takeshi Miyazaki

    IPC分类号： G01N33/543 ,  G01N33/58 ,  C12Q1/68

    CPC分类号： G01N33/582 ,  G01N33/585 ,  Y10S435/961 ,  Y10S435/968 ,  Y10S436/80 ,  Y10S436/804 ,  Y10S436/805 ,  Y10S436/823

    摘要： In a method for measuring a specified component in a specimen by reacting the specimen with a first reagent formed by binding a substance active to the specified component, with carrier particles and a second reagent formed by labelling a substance active to the specified component with a first label, and measuring the substances in the complexes obtained in the reaction, there is disclosed a method featured by labelling the carrier particles with a second label different from the first label, and detecting the second label and then the first label utilizing the detection of the second label as a trigger.This method enables a highly precise measurement without the influence of noise components in the detection of specified trace components in the specimen, utilizing an antigen-antibody reaction or a nucleic acid hybridization.

    摘要翻译： 在通过使样本与通过结合对特定成分有活性的物质结合而形成的第一试剂与载体颗粒和通过将具有活性的物质标记在特定成分上而形成的第二试剂的方法中， 标记和测量在反应中获得的络合物中的物质，公开了一种特征在于用不同于第一标记的第二标记标记载体颗粒的方法，并且利用第二标记的检测来检测第二标记 第二个标签作为触发器。 该方法利用抗原抗体反应或核酸杂交，能够在不受噪声成分影响的情况下进行高精度测定。

    Apparatus for measuring a test specimen
    6.
    发明授权
    Apparatus for measuring a test specimen 失效
    用于测量试样的装置

    公开(公告)号：US5380490A

    公开(公告)日：1995-01-10

    申请号：US821049

    申请日：1992-01-16

    申请人： Hiroaki Hoshi ,  Matsuomi Nishimura ,  Kazumi Tanaka ,  Takeshi Miyazaki ,  Toshikazu Ohnishi ,  Hidehito Takayama

    发明人： Hiroaki Hoshi ,  Matsuomi Nishimura ,  Kazumi Tanaka ,  Takeshi Miyazaki ,  Toshikazu Ohnishi ,  Hidehito Takayama

    IPC分类号： G01N21/59 ,  G01N21/82 ,  G01N33/53 ,  G01N33/543

    CPC分类号： G01N33/5438 ,  G01N21/82 ,  G01N33/5304 ,  G01N33/54313 ,  G01N2021/5953 ,  G01N2021/5957

    摘要： An apparatus is so constructed as to measure a specific substance in a test specimen by the degree of the aggregation of carrier particles in a reaction solution in which the test specimen is mixed with the carrier particles which carry a substance specifically binding to the specific substance. The apparatus includes a substrate having comb-shaped electrodes mounting the reaction solution and amplifier and alternating oscillator for displaying a variable voltage to the comb-shaped electrodes. The test specimen measuring apparatus having the structure accelerates the aggregation of the reaction solution by applying an alternating voltate to the comb-shaped electrodes in a state that the reaction solution is being mounted on the substrate, and detects the spatial spectrum of the comb-shaped electrodes on which the reaction solution is mounted, thus performing the qualitative or quantitative detection of the presence of the substance in the test specimen.

    摘要翻译： 一种装置被构造成通过载体颗粒在其中将试样与携带特异性结合物质的物质的载体颗粒混合的反应溶液中聚集的程度来测量试样中的特定物质。 该装置包括具有安装反应溶液的梳形电极的基板和用于向梳状电极显示可变电压的放大器和交替振荡器。 具有这种结构的试样测量装置在将反应溶液安装在基板上的状态下通过向梳状电极施加交流电压来加速反应溶液的聚集，并且检测梳形电极的空间光谱 在其上安装反应溶液的电极，从而进行定性或定量检测试样中物质的存在。

    Method for driving liquid, and method and apparatus for mixing and agitation employing the method
    7.
    发明授权
    Method for driving liquid, and method and apparatus for mixing and agitation employing the method 失效
    用于驱动液体的方法，以及使用该方法进行混合和搅拌的方法和装置

    公开(公告)号：US5788819A

    公开(公告)日：1998-08-04

    申请号：US926009

    申请日：1997-09-09

    申请人： Toshikazu Onishi ,  Matsuomi Nishimura ,  Kazuo Isaka ,  Kazumi Tanaka ,  Takeshi Miyazaki

    发明人： Toshikazu Onishi ,  Matsuomi Nishimura ,  Kazuo Isaka ,  Kazumi Tanaka ,  Takeshi Miyazaki

    IPC分类号： B01F13/00 ,  H02K44/04 ,  H02K44/02 ,  G01N35/08

    CPC分类号： B01F13/0001 ,  H02K44/04

    摘要： A method for driving an ionic conductive liquid comprises placing a pair of electrodes in the ionic conductive liquid, and exerting an electromagnetic force to the liquid by application of a voltage between the pair of the electrodes to drive the liquid. A method for mixing and agitating a medium comprises feeding the medium to an ionic conductive liquid, placing a pair of electrodes in the ionic conductive liquid, and exerting an electromagnetic force to the liquid by application of a voltage to drive the liquid and to mix and agitate the medium. An apparatus for delivering a liquid comprises a container for housing an ionic conductive liquid, at least one pair of electrodes in the container, and a power source for applying an voltage between the pair of electrodes, the apparatus delivering the liquid from the container by driving the liquid according to the method for driving.

    摘要翻译： 用于驱动离子导电液体的方法包括将一对电极放置在离子导电液体中，并且通过在一对电极之间施加电压来驱动液体，向液体施加电磁力。 用于混合和搅拌介质的方法包括将介质馈送到离子导电液体，将一对电极放置在离子导电液体中，并通过施加电压以驱动液体并混合和施加电磁力给液体， 搅动介质。 用于输送液体的装置包括用于容纳离子导电液体的容器，容器中的至少一对电极和用于在一对电极之间施加电压的电源，该装置通过驱动从容器输送液体 液体按照驾驶方法。

    Polishing apparatus with slurry screening
    8.
    发明授权
    Polishing apparatus with slurry screening 失效
    抛光设备用浆料筛选

    公开(公告)号：US06352469B1

    公开(公告)日：2002-03-05

    申请号：US09433067

    申请日：1999-11-03

    申请人： Kyoichi Miyazaki ,  Matsuomi Nishimura ,  Kazuo Takahashi

    发明人： Kyoichi Miyazaki ,  Matsuomi Nishimura ,  Kazuo Takahashi

    IPC分类号： B24B700

    CPC分类号： B24B37/04 ,  B24B57/02 ,  Y10S451/91

    摘要： A polishing apparatus and a polishing method can effectively prevent large diameter particles from being fed with slurry to an object to be polished. A large-diameter particle screener blocks or disperses large diameter particles from entering the slurry. Then, slurry free from large diameter particles is taken up from a slurry container by an intake pipe and fed to the object to be polished.

    摘要翻译： 抛光装置和抛光方法可以有效地防止大直径颗粒向被抛光物体供给浆料。 大直径颗粒筛选器阻挡或分散大直径颗粒进入浆料。 然后，通过进气管从浆料容器中吸收没有大直径颗粒的浆料并供给到待抛光对象物。

    Polishing apparatus and method
    9.
    发明授权
    Polishing apparatus and method 失效
    抛光设备和方法

    公开(公告)号：US06183345B2

    公开(公告)日：2001-02-06

    申请号：US09045651

    申请日：1998-03-20

    申请人： Takashi Kamono ,  Matsuomi Nishimura ,  Kazuo Takahashi ,  Osamu Ikeda ,  Satoshi Ohta

    发明人： Takashi Kamono ,  Matsuomi Nishimura ,  Kazuo Takahashi ,  Osamu Ikeda ,  Satoshi Ohta

    IPC分类号： B24B2900

    CPC分类号： B24B37/013 ,  B24B27/0023 ,  B24B27/0076 ,  B24B37/042

    摘要： In order to efficiently polish a large-area member to be polished to a desired shape, a polishing apparatus includes a first polishing station including a first holding unit for holding a member to be polished in a state in which a surface to be polished thereof is upwardly placed, and a first polishing head for holding and rotating a polishing pad whose polishing surface is larger than the surface to be polished in a state of contacting the surface to be polished, a detection station for detecting a polished state of the surface to be polished in a state in which the surface to be polished is upwardly placed, and a second polishing station including a second holding unit for holding the member to be polished in a state in which the surface to be polished thereof is upwardly placed, and a second polishing head for holding and rotating a polishing pad whose polishing surface is smaller than the surface to be polished in a state of contacting the surface to be polished.

    摘要翻译： 为了将要抛光的大面积构件有效地研磨成所需的形状，抛光装置包括：第一抛光站，包括：第一保持单元，用于在要抛光的表面被抛光的状态下保持要抛光的构件 向上放置的第一抛光头，以及用于保持和旋转抛光表面的抛光表面大于待抛光表面的抛光表面的第一抛光头，用于检测表面抛光状态的检测站 在抛光表面被向上放置的状态下被抛光;以及第二抛光台，其包括第二保持单元，用于在待抛光表面向上放置的状态下保持待抛光元件， 抛光头，用于在与要抛光的表面接触的状态下保持和旋转其研磨表面小于待抛光表面的抛光垫。

    Polishing/cleaning method as well as method of making a wiring section using a polishing apparatus
    10.
    发明授权
    Polishing/cleaning method as well as method of making a wiring section using a polishing apparatus 失效
    抛光/清洁方法以及使用抛光装置制造布线部分的方法

    公开(公告)号：US06776691B2

    公开(公告)日：2004-08-17

    申请号：US09971692

    申请日：2001-10-09

    申请人： Matsuomi Nishimura ,  Mikichi Ban ,  Kazuo Takahashi ,  Osamu Ikeda

    发明人： Matsuomi Nishimura ,  Mikichi Ban ,  Kazuo Takahashi ,  Osamu Ikeda

    IPC分类号： B24B100

    CPC分类号： H01L21/67028 ,  B08B3/00 ,  B08B3/04 ,  B08B2203/005 ,  B24B37/04 ,  B24B57/02 ,  Y10T29/49165

    摘要： A polishing apparatus that can effectively and efficiently remove potassium and other alkaline metals comprises integrally a polishing unit for polishing an object by means of a polishing agent and a cleaning unit for cleaning the polished object. The polishing unit and the cleaning unit have means for isolating the internal atmosphere from the external atmosphere and the cleaning unit has a means for cleaning the polished object by bringing hot pure water or steam of pure water into contact with the polished object. With a cleaning method hot pure water is brought into contact with the polished object without drying it after having been polished by such a polishing apparatus.

    摘要翻译： 能够有效且高效地除去钾等碱金属的研磨装置，通过研磨剂和用于清洗抛光物的清洗单元，一体地研磨用于研磨物体的研磨单元。 抛光单元和清洁单元具有用于将内部空气与外部空气隔离的装置，并且清洁单元具有通过使热纯水或纯水蒸汽与抛光对象接触来清洁抛光对象的装置。 通过清洗方法，在通过这种抛光装置抛光之后，使热纯水与抛光物体接触而不干燥。