摘要:
A power module (21) includes an insulating body (30) having a first main face (30a) and a second main face (30b); a first contact plate (27) and a second contact plate (28), respectively protruding through the first main face (30a) and through the second main face (30b) of the insulating body (30) and accessible from the outside of the power module (21); a first power plate (31) and a second power plate (33), at least partially embedded in the insulating body (30), facing each other and having plane faces perpendicular to a first direction (Z). Power devices (22) of a first group (21a) are accommodated on the first power plate (31) and coupled to the first contact plate (27). Power devices (22) of a second group (21b) are accommodated on the second power plate (33) and coupled to the second contact plate (28). The first contact plate (27), the second contact plate (28), the first power plate (31) and the second power plate (33), are stacked along the first direction (Z) .
摘要:
Consistent with an example embodiment, there is an integrated circuit (IC) device in a packaging having electrically insulated connections. The IC device comprises a semiconductor device (100) mounted onto a die attachment area (10); the semiconductor device has a plurality of bonding pads (20a, 25a, 30a, 35a). A lead frame having a plurality of bonding fingers (20b, 25b, 30b, 35b) surrounds the die attachment area. A plurality of mutually isolated connection conductors (25d, 30d, 40, 50) having respective first ends are attached to respective bonding pads on the semiconductor device and the plurality of mutually isolated connection conductors having respective second respective second ends are attached to respective bonding fingers of the lead frame. An insulating material (45) coats at least a portion of the plurality of mutually isolated connection conductors. The mutually isolated connection conductors may include a bond wire (40, 50) for the signal connection and a conductive strap (25d, 30d) for the voltage reference connection. The insulating material (45) coating the bond wires reduces the likelihood of short circuits during encapsulation.
摘要:
A power semiconductor package is disclosed. The power semiconductor package includes a leadframe having partially etched segments and at least one non-etched segment, a first semiconductor die having a first power transistor and a driver integrated circuit (IC) monolithically formed thereon, a second semiconductor die having a second power transistor, wherein the first semiconductor die and the second semiconductor die are configured for attachment to the partially etched segments, and wherein the partially etched segments and the at least one non-etched segment enable the first semiconductor die to be coupled to the second semiconductor die by a legless conductive clip.
摘要:
There are disclosed herein various implementations of a compact high-voltage semiconductor package. In one exemplary implementation, such a semiconductor package includes a power transistor, as well as a drain contact, a source contact, and a gate contact to provide external connections to the power transistor. The semiconductor package also includes a contour element formed between the drain contact and the source contact in the semiconductor package. The contour element increases a creepage distance between the drain contact and the source contact in the semiconductor package so as to increase a breakdown voltage of the semiconductor package.
摘要:
An integrated circuit arrangement (200) comprising a substrate and a flange (206) disposed on top of the substrate. The flange (206) comprises a cantilever portion (208) configured to project over the substrate. A die (210) disposed on top of the flange (206). A first output terminal (218) disposed on the substrate. A first lead (216) configured to provide for an electrical connection between the die (210) and the first output terminal (218). A first electrically conducting member (290) configured to provide at least part of a current return path between the substrate and the die (210) and arranged to bridge a gap between the cantilever portion (208) and the substrate. The first electrically conducting member (290) is disposed between the die (210) and the first output terminal (218) and is configured to enable electrical current to flow from the substrate to the cantilever portion (208) of the flange (206).
摘要:
A cavity package is provided. The package can include a metal leadframe and a substrate attached to an interposer formed as part of the leadframe. The substrate typically has a coefficient of thermal expansion matched to the coefficient of thermal expansion of a semiconductor device to be affixed to the substrate. The semiconductor device is typically attached to an exposed top surface of the substrate. The cavity package also includes a plastic portion molded to the leadframe forming a substrate cavity. The substrate cavity allows access to the exposed top surface of the substrate for affixing the semiconductor device. The cavity package also include a connective element for grounding a lid through an electrical path from the lid to the interposer.
摘要:
A microelectronic package can include wire bonds having bases bonded to respective ones of conductive elements exposed at a surface of a substrate. The wire bonds may have exterior edge surfaces disposed at an angle between 25° and 90° relative to the bases, and ends remote, e.g., opposite, from the bases, and remote from the ends which are connected to the bases. A dielectric encapsulation layer extends from the substrate and covers portions of the wire bonds such that covered portions of the wire bonds are separated from one another by the encapsulation layer, wherein unencapsulated portions of the wire bonds are defined by portions of the wire bonds that are uncovered by the encapsulation layer, the unencapsulated portions including the ends of the wire bonds.
摘要:
A semiconductor package (10) includes a die pad (14), at least one semiconductor die (12a) mounted on the die pad (14), a plurality of leads (16) disposed along peripheral edges of the die pad (14), at least one connecting bar (142) for supporting the die pad (14), a first power bar (160a) disposed on one side of the connecting bar (142), a second power bar (160b) disposed on the other side of the connecting bar (142), and a connection member (28) traversing the connecting bar (142) and electrically connecting the first power bar (160a) with the second power bar (160b).