Abstract:
Off-chip distributed drain biasing increases output power and efficiency for high power distributed amplifier MMICs. An off-chip bias circuit has a common input for receiving DC bias current and a plurality of parallel-connected bias chokes among which the DC bias current is divided. The chokes are connected to a like plurality of drain terminals at different FET amplifier stages to supply DC bias current at different locations along the output transmission line. Off-chip distributed drain biasing increases the level of DC bias current that can be made available to the amplifier and add inductances to selected FET amplifier stages, typically the earlier stages, to modify the load impedance seen at the drain terminal to better match the amplifier stages to improve power and efficiency.
Abstract:
Die Erfindung betrifft unter anderem eine Antennenvorrichtung (10) mit einem auf einem Substrat (11) angeordneten Hochfrequenz-Chip (12), wobei der Hochfrequenz-Chip (12) mindestens einen Antennenausgangsanschluss (13) aufweist, und der Antennenausgangsanschluss (13) als ein erster Befestigungsbereich (13) für einen elektrischen Leiter dient. Die Antennenvorrichtung (10) weist außerdem einen ersten Bonddraht (14) auf, der den ersten Befestigungsbereich (13) mit einem auf dem Substrat (11) angeordneten zweiten Befestigungsbereich (15) elektrisch leitend verbindet. Außerdem weist die Antennenvorrichtung (10) einen zweiten Bonddraht (16) auf, der den zweiten Befestigungsbereich (15) und einen auf dem Substrat (11) angeordneten dritten Befestigungsbereich (17) elektrisch leitend verbindet. Erfindungsgemäß bilden die beiden elektrisch in Reihe geschalteten ersten und zweiten Bonddrähte (14, 16) eine Antenne bilden. Dabei sind der erste und der zweite Bonddraht (14, 16) zumindest bereichsweise von dem Substrat (11) beabstandet.
Abstract:
A semiconductor device is configured to provide current and voltage isolation inside an integrated circuit package. The semiconductor device includes first and second semiconductor dies, a first isolating block positioned on the first semiconductor die, and a second isolating block positioned on the second semiconductor die. The semiconductor device also includes a first interconnect coil having a plurality of wires connecting the first semiconductor die to the second isolating block, and a second interconnect coil having a plurality of wires connecting the second semiconductor die to the first isolating block.
Abstract:
A die is described comprising at least one 3-way Doherty amplifier (100) comprising a main stage (120), a first peak stage (130) and a second peak stage(140). An input network (110) includes a first impedance connected to an input of the first peak stage (130) and providing a -90° phase shift and a second impedance connected to an input of the second peak stage (140) and providing a 90° phase shift. An output network (150) includes a third impedance connected to the output of the first peak stage (130) and providing a 180° phase shift and a fourth impedance connected to the output of the main stage (120) and providing a 90° phase shift.
Abstract:
Embodiments of semiconductor devices (100, 300, 600, 700, 800, 900, 1100) (e.g., RF devices) include a substrate (306, 606, 706, 806, 906, 1106), an isolation structure (308, 608, 708, 808, 908, 1108), an active device (120, 320, 620, 720, 820, 920, 1120), a lead (104, 304, 604, 704, 804, 904, 1104), and a circuit (149, 150, 349, 350, 649, 650, 749, 750, 849, 850, 949, 950). The isolation structure is coupled to the substrate, and includes an opening. An active device area is defined by a portion of the substrate surface that is exposed through the opening. The active device is coupled to the substrate surface within the active device area. The circuit is electrically coupled between the active device and the lead. The circuit includes one or more elements (136, 138, 144, 146, 338, 344, 638, 644, 738, 744, 838, 844, 846, 936, 938, 944, 946, 1136, 1146) positioned outside the active device area (e.g., physically coupled to the isolation structure and/or under the lead). The elements positioned outside the active device area may include elements of an envelope termination circuit (149, 349, 649, 749, 849, 949) and/or an impedance matching circuit (150, 350, 650, 750, 850, 950). Embodiments also include method (1202, 1204, 1206, 1208, 1210) of manufacturing such semiconductor devices.
Abstract:
A high frequency semiconductor amplifier includes an input circuit (20), an output circuit (30), a first semiconductor element (40), and a package. The input circuit (20) includes a first DC blocking capacitor (27), an input transmission line (22), a first input pad part (23) connected to the input transmission line (22), and a first bias circuit (26). The output circuit (30) includes a first output pad part (33), a second DC blocking capacitor (37), an output transmission line (32), and a second bias circuit (36). The first semiconductor element (40) includes a nitride-based semiconductor layer and is arranged between the input circuit (20) and the output circuit (30). The first semiconductor element (40), the input circuit (20) and the output circuit are bonded to the package. The first bias circuit (26) includes a first grounded capacitor (24) and a first transmission line (25). The second bias circuit (36) includes a second grounded capacitor (34) and a second transmission line (35).
Abstract:
The disclosure relates to a dual-interface integrated circuit (IC) card. Embodiments disclosed include a dual-interface card (100) comprising: a card body (122) containing an antenna (120), the antenna having first and second antenna connections; and a dual-interface integrated circuit card module (150) comprising: a substrate (104) having first and second opposing surfaces; a contact area (102) on the first surface of the substrate (104), the contact area (102) comprising a plurality of contact pads (108) and first and second routing connections (106) each having a first end and a second end; an integrated circuit (110) on the second surface of the substrate (104); electrical connections through the substrate (104) connecting the integrated circuit (110) to the plurality of contact pads (108) and to the first end of each of the first and second routing connections (106); and first and second antenna connectors (118) disposed in respective first and second holes (103) in the substrate (104) and in electrical contact with the second end of the respective first and second routing connections, wherein the first and second antenna connectors (118) of the card module are electrically connected to the first and second antenna connections of the card body (122).
Abstract:
A system and method for packaging a semiconductor device (20) that includes a wall to reduce electromagnetic coupling is presented. A semiconductor device has a substrate (74) on which a first circuit (22) and a second circuit (24) are formed proximate to each other. An isolation wall (50) of electrically conductive material is located between the first circuit and the second circuit, the isolation wall (50) being configured to reduce inductive coupling between the first and second circuits during an operation of the semiconductor device. The isolation wall (50) includes a plurality of holes (52) through which encapsulation material may flow during a process of making the semiconductor device (10). Several types of isolation wall (50) are presented.
Abstract:
A connector which can be made compact is provided. A package and an electronic device which can be made compact by using the connector are also provided. The connector has a first conductor and a second conductor for connecting an internal circuit formed in a frame-shaped container and an external circuit provided outside of the container, comprising: a stacked body comprising a plurality of dielectric layers and having a first top surface, a second top surface positioned at a height different from that of the first top surface and a bottom surface positioned opposite to the second top surface; a first conductor comprising a first external connecting terminal disposed on the first top surface of the stacked body and for connecting to the external circuit, and a first internal connecting terminal disposed on the first top surface of the stacked body and for connecting to the internal circuit; and a second comprising a second internal connecting terminal disposed on the second top surface and for connecting to the internal circuit, and a second external connecting terminal disposed on the bottom surface and for connecting to the external circuit.
Abstract:
Embodiments of the present invention relate to a Doherty power amplifier that includes a main power amplification circuit, an auxiliary power amplification circuit, a connection circuit, and an impedance conversion circuit, where an output end of the main power amplification circuit and an output end of the auxiliary power amplification circuit are connected to two ends of the connection circuit separately by using bonding wires, the output end of the auxiliary power amplification circuit is further connected to one end of the impedance conversion circuit by using a bonding wire, and the other end of the impedance conversion circuit is connected to an output load. In the embodiments of the present invention, an impedance conversion circuit is formed by directly connecting parasitic capacitors Cds between drains and sources of dies in two power transistors and a PCB, so that an output matching circuit in an existing Doherty power amplifier can be removed, thereby achieving an effect of reducing an area of the Doherty power amplifier.