Semiconductor device
    1.
    发明授权
    Semiconductor device 有权
    半导体器件

    公开(公告)号:US09165848B2

    公开(公告)日:2015-10-20

    申请号:US14347505

    申请日:2011-09-29

    摘要: This semiconductor device includes: a first metal plate; a plurality of semiconductor elements mounted on the first metal plate; a spacer that is connected to a surface on the opposite side to the surface where the plurality of semiconductor elements are mounted on the first metal plate; a second metal plate that is connected to a surface on the opposite side to the surface where the spacer is connected to the semiconductor elements; and an encapsulating resin between the first plate and the second plate that seals the plurality of semiconductor elements. Stress due to contraction that occurs in the encapsulating resin between the plurality of semiconductor elements is relaxed to a greater extent than stress due to contraction that occurs in the encapsulating resin in the locations other than the location between the plurality of semiconductor devices.

    摘要翻译: 该半导体装置包括:第一金属板; 安装在所述第一金属板上的多个半导体元件; 连接到与所述多个半导体元件安装在所述第一金属板上的表面相反侧的表面的间隔件; 第二金属板,其连接到与间隔件连接到半导体元件的表面相反侧的表面; 以及密封所述多个半导体元件的所述第一板和所述第二板之间的封装树脂。 由于在多个半导体元件之间的位置以外的位置处发生在封装树脂中的收缩引起的由于在多个半导体元件之间的封装树脂中发生的收缩而产生的收缩的应力被更大程度地松弛。

    SEMICONDUCTOR DEVICE
    2.
    发明申请
    SEMICONDUCTOR DEVICE 有权
    半导体器件

    公开(公告)号:US20140232016A1

    公开(公告)日:2014-08-21

    申请号:US14347505

    申请日:2011-09-29

    IPC分类号: H01L23/28

    摘要: This semiconductor device includes: a first metal plate; a plurality of semiconductor elements mounted on the first metal plate; a spacer that is connected to a surface on the opposite side to the surface where the plurality of semiconductor elements are mounted on the first metal plate; a second metal plate that is connected to a surface on the opposite side to the surface where the spacer is connected to the semiconductor elements; and an encapsulating resin between the first plate and the second plate that seals the plurality of semiconductor elements. Stress due to contraction that occurs in the encapsulating resin between the plurality of semiconductor elements is relaxed to a greater extent than stress due to contraction that occurs in the encapsulating resin in the locations other than the location between the plurality of semiconductor devices.

    摘要翻译: 该半导体装置包括:第一金属板; 安装在所述第一金属板上的多个半导体元件; 连接到与所述多个半导体元件安装在所述第一金属板上的表面相反侧的表面的间隔件; 第二金属板,其连接到与间隔件连接到半导体元件的表面相反侧的表面; 以及密封所述多个半导体元件的所述第一板和所述第二板之间的封装树脂。 由于在多个半导体元件之间的位置以外的位置处发生在封装树脂中的收缩引起的由于在多个半导体元件之间的封装树脂中发生的收缩而产生的收缩的应力被更大程度地松弛。

    SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
    7.
    发明申请
    SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF 有权
    半导体器件及其制造方法

    公开(公告)号:US20140264819A1

    公开(公告)日:2014-09-18

    申请号:US14206781

    申请日:2014-03-12

    IPC分类号: H01L23/367

    摘要: A semiconductor device includes a link portion that connects a second heat sink to a third heat sink via a solder. The solder is arranged on a connecting surface of a base portion of the link portion, which is orthogonal to a plate thickness direction of the base portion, in a direction perpendicular to first and second surfaces. The link portion has a rib that protrudes from the base portion in a direction orthogonal to the first and second surfaces, and a thickness of a portion where the rib is provided is equal to or less than the thickness of the corresponding heat sink. The rib is provided across an entire length of a first region that is sealed by a sealing resin body and that is between the second and the third heat sinks, in an alignment direction of a first heat sink and the third heat sink.

    摘要翻译: 半导体器件包括通过焊料将第二散热器连接到第三散热器的连接部分。 焊料沿与第一表面和第二表面垂直的方向布置在与基部的板厚度方向正交的连接部的基部的连接表面上。 连杆部分具有在与第一和第二表面正交的方向上从基部突出的肋,并且肋的设置部分的厚度等于或小于相应的散热器的厚度。 在第一散热器和第三散热器的排列方向上,肋被设置在由密封树脂体密封并且位于第二和第三散热器之间的第一区域的整个长度上。