Integrated circuit device with internal inspection circuitry
    4.
    发明授权
    Integrated circuit device with internal inspection circuitry 失效
    具有内部检查电路的集成电路器件

    公开(公告)号:US5453991A

    公开(公告)日:1995-09-26

    申请号:US31730

    申请日:1993-03-15

    CPC classification number: G06F11/2733

    Abstract: A highly-integrated semiconductor IC device includes a semiconductive substrate, on which an internal function circuit is arranged to have a first plurality of input terminals and a second plurality of output terminals. A logic circuit is arranged on the substrate and is connected to the internal circuit through the output terminals. The logic circuit has a third plurality of output terminals, which are less in number than the outputs of the internal circuit. These logic output terminals are coupled to the same number of inspection terminals, which are adapted to be coupled to a known electric inspection tool. The logic circuit processes the voltage signals appearing at the output terminals of the internal circuit so as to cause these signals to decrease in number. The output signals of the logic circuit are sent to the inspection terminals as monitor signals, based on which an inspection is carried out to determine whether the internal circuit operates normally.

    Abstract translation: 高度集成的半导体IC器件包括半导体衬底,内部功能电路布置成具有第一多个输入端子和第二多个输出端子。 逻辑电路布置在基板上,并通过输出端子连接到内部电路。 逻辑电路具有第三多个输出端子,其数量小于内部电路的输出。 这些逻辑输出端子被耦合到相同数量的检查端子,这些检查端子适于联接到已知的电气检查工具。 逻辑电路处理出现在内部电路的输出端子处的电压信号,从而使这些信号数量减少。 逻辑电路的输出信号作为监视信号发送到检查端子,由此执行检查以确定内部电路是否正常工作。

    Circuit board
    6.
    发明授权

    公开(公告)号:US4963701A

    公开(公告)日:1990-10-16

    申请号:US300944

    申请日:1989-01-24

    Abstract: Disclosed is an aluminum nitride thin film circuit board having an aluminum nitride substrate and a conductive thin film pattern formed on the substrate. The conductive thin film pattern has a multi-layer structure selected from the group consisting of Ti/Ni/Au, Ti/Pd/Au, Ti/Pt/Au, Ni/Au, Cr/Au, and Cr/Cu/Au, and a boundary layer of Al-N-M-O (M is Ti, Ni, or Cr) is formed between the substrate and the conductive thin film pattern. Since the boundary layer is formed, bonding properties between the substrate and the conductive thin film pattern are improved. In particular, when the boundary layer contains 0.02 to 30 atomic % of oxygen, a higher bonding strength can be obtained.

    Thick film capacitor
    8.
    发明授权
    Thick film capacitor 失效
    厚膜电容器

    公开(公告)号:US4772985A

    公开(公告)日:1988-09-20

    申请号:US98240

    申请日:1987-09-18

    CPC classification number: C04B35/499 C04B35/497 H01G4/129 H01G4/30 Y10T29/435

    Abstract: Disclosed is a thick film capacitor comprising (a) a sintered layer of a ferroelectric material mainly consisting of one or more ferroelectric inorganic compounds having a perovskite structure and an inorganic binder having a eutectic composition which experiences a liquid phase at a temperature lower than the sintering temperature of the ferroelectric inorganic compounds, and (b) at least two electrodes formed on both surfaces of the sintered layer of the ferroelectric material. In the thick film capacitor of this invention, the perovskite structure of the ferroelectric inorganic compounds is not destroyed upon sintering. Therefore, a high degree of sintering, a good dielectric characteristic and high moisture and migration resistances can be obtained.

    Abstract translation: 公开了一种厚膜电容器,其包括(a)主要由具有钙钛矿结构的一种或多种铁电无机化合物和具有在低于烧结温度的温度下经历液相的共晶组成的无机粘合剂的铁电体材料的烧结层 铁电体无机化合物的温度,(b)形成在铁电体的烧结层的两面的至少两个电极。 在本发明的厚膜电容器中,铁电体无机化合物的钙钛矿结构在烧结时不破坏。 因此,可以获得高度的烧结,良好的介电特性和高的湿度和迁移电阻。

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