Adjustable magnetic probe for efficient near field scanning
    12.
    发明授权
    Adjustable magnetic probe for efficient near field scanning 有权
    可调磁探头,用于高效近场扫描

    公开(公告)号:US09335384B2

    公开(公告)日:2016-05-10

    申请号:US14037142

    申请日:2013-09-25

    CPC classification number: G01R33/02 G01R29/0814

    Abstract: A method and apparatus for testing near field magnetic fields of electronic devices. The method comprises measuring a magnetic field using a loop antenna that is oriented in a first direction. The loop antenna is swept through a desired range of azimuth angles while measuring the magnetic field. Once the first direction testing is completed, the loop antenna is changed to a second orientation direction. The magnetic field is then measured in the second orientation direction and is swept through a desired range of orientation angles in the second direction. The apparatus provides a loop antenna connected to a coaxial probe, with the coaxial cable serving as the center conductor, and two outer conductors. An axle is mounted to the loop antenna and connected to a step motor. A servo motor is also provided for moving the arm assembly.

    Abstract translation: 一种用于测试电子设备的近场磁场的方法和装置。 该方法包括使用在第一方向上定向的环形天线来测量磁场。 在测量磁场的同时,将环形天线扫过所需的方位角范围。 一旦第一方向测试完成,环形天线就变成第二定位方向。 然后在第二取向方向上测量磁场,并且扫过第二方向上所需的取向角范围。 该装置提供连接到同轴探针的环形天线,同轴电缆用作中心导体和两个外部导体。 轴安装在环形天线上,并连接到步进电机。 还提供用于移动臂组件的伺服电动机。

    INTEGRATED DEVICE COMPRISING COAXIAL INTERCONNECT
    13.
    发明申请
    INTEGRATED DEVICE COMPRISING COAXIAL INTERCONNECT 有权
    包含同轴互连的集成设备

    公开(公告)号:US20160013125A1

    公开(公告)日:2016-01-14

    申请号:US14329646

    申请日:2014-07-11

    Abstract: Some novel features pertain to an integrated device that includes a substrate, a first interconnect coupled to the substrate, and a second interconnect surrounding the first interconnect. The second interconnect may be configured to provide an electrical connection to ground. In some implementations, the second interconnect includes a plate. In some implementations, the integrated device also includes a dielectric material between the first interconnect and the second interconnect. In some implementations, the integrated device also includes a mold surrounding the second interconnect. In some implementations, the first interconnect is configured to conduct a power signal in a first direction. In some implementations, the second interconnect is configured to conduct a grounding signal in a second direction. In some implementations, the second direction is different from the first direction. In some implementations, the integrated device may be a package-on-package (PoP) device.

    Abstract translation: 一些新颖的特征涉及包括衬底,耦合到衬底的第一互连和围绕第一互连的第二互连的集成器件。 第二互连可以被配置为提供到地的电连接。 在一些实现中,第二互连包括板。 在一些实施方案中,集成器件还包括在第一互连和第二互连之间的介电材料。 在一些实施方案中,集成装置还包括围绕第二互连的模具。 在一些实现中,第一互连被配置为在第一方向上传导功率信号。 在一些实现中,第二互连被配置为在第二方向上传导接地信号。 在一些实施方式中,第二方向与第一方向不同。 在一些实施方式中,集成器件可以是封装封装(PoP)器件。

    Reconfigurable electric field probe
    15.
    发明授权
    Reconfigurable electric field probe 有权
    可重构电场探头

    公开(公告)号:US09151779B2

    公开(公告)日:2015-10-06

    申请号:US13675673

    申请日:2012-11-13

    CPC classification number: G01R1/07 G01R31/002

    Abstract: Systems and methods for EMC, EMI and ESD testing are described. A probe comprises a center conductor extending along an axis of the probe, a probe tip, and a shield coaxially aligned with the center conductor and configured to provide electromagnetic screening for the probe tip. One or more actuators may change the relative positions of the probe tip and shield with respect to a device under test, thereby enabling control of sensitivity and resolution of the probe.

    Abstract translation: 描述了用于EMC,EMI和ESD测试的系统和方法。 探针包括沿着探针的轴线延伸的中心导体,探针尖端和与中心导体同轴对准的屏蔽并且被配置为为探针尖端提供电磁屏蔽。 一个或多个致动器可以相对于被测器件改变探头尖端和屏蔽件的相对位置,从而能够控制探头的灵敏度和分辨率。

    CURRENT SOURCE DRIVEN MEASUREMENT AND MODELING
    16.
    发明申请
    CURRENT SOURCE DRIVEN MEASUREMENT AND MODELING 审中-公开
    当前来源驱动测量和建模

    公开(公告)号:US20150084653A1

    公开(公告)日:2015-03-26

    申请号:US14038608

    申请日:2013-09-26

    CPC classification number: G01R27/02

    Abstract: A method and apparatus for testing integrated circuit resistors includes applying a variable source current to a resistive device under test (DUT), measuring the resistance of the resistive DUT as a function of the source current, and fitting the measured resistance to parameters of a polynomial parametric equation, wherein the parametric equation comprises a constant resistance at zero current bias plus a second order current coefficient of resistance multiplied by the square of the current.

    Abstract translation: 用于测试集成电路电阻的方法和装置包括将可变源电流施加到被测电阻器件(DUT),测量作为源电流的函数的电阻DUT的电阻,并将测得的电阻拟合到多项式的参数 参数方程式,其中参数方程包括零电流偏置处的恒定电阻加上电阻乘以电流平方的二阶电流电流系数。

    Integrated device package and/or system comprising configurable directional optical transmitter

    公开(公告)号:US09621281B2

    公开(公告)日:2017-04-11

    申请号:US14546924

    申请日:2014-11-18

    Inventor: Kyu-Pyung Hwang

    Abstract: Some novel features pertain to a device that includes a first integrated device package and a second integrated device package. The first integrated device package includes a first package substrate, a first integrated device, and a first configurable optical transmitter. The first configurable optical transmitter is configured to be in communication with the first integrated device. The first configurable optical transmitter is configured to transmit an optical beam at a configurable angle. The first configurable optical transmitter includes an optical beam source, an optical beam splitter, and a set of phase shifters coupled to the optical beam splitter. The set of phase shifters is configured to enable the angle at which the optical beam is transmitted. The second integrated device package includes a second package substrate, a second integrated device, and a first optical receiver configured to receive the optical beam from the first configurable optical transmitter.

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