Semiconductor device and data reading method using the same

    公开(公告)号:US11410724B2

    公开(公告)日:2022-08-09

    申请号:US16987618

    申请日:2020-08-07

    Abstract: A semiconductor device is provided. The device includes a memory that stores data in a non-volatile and volatile manner and a memory controller configured to control the memory. The memory includes a word line pair including a first and second word line, a first bit line pair orthogonal to the first and the second word line and including a first bit line and a first complementary bit line, and a memory cell pair including first and second memory cells adjacent to the first memory cell in a word line direction. A left node of the first memory cell, and a right node of the first memory cell and a left node of the second memory cell, are all connected to the first word line, and a value of the data stored in the memory cell pair in the non-volatile manner is determined according to the selected first word line.

    MEMORY CONTROLLERS AND MEMORY SYSTEMS INCLUDING THE SAME

    公开(公告)号:US20240178861A1

    公开(公告)日:2024-05-30

    申请号:US18339490

    申请日:2023-06-22

    CPC classification number: H03M13/1111 H03M13/611

    Abstract: A memory controller to control a memory module including a plurality of data chips, a first parity chip and a second parity chip, includes a system error correction code (ECC) engine and a processor to control the system ECC engine. The system ECC engine includes an ECC decoder and a memory to store a parity check matrix. The ECC decoder selects one of a plurality of ECC decoding schemes based on decoding status flags and corrects a plurality of symbol errors in a read codeword set from the memory module by performing an ECC decoding on the read codeword set based on the selected decoding scheme and the parity check matrix. The decoding status flags are provided from the plurality of data chips and each of the decoding status flags indicates whether at least one error bit is detected in respective one of the plurality of data chips.

    VOLTAGE TRIMMING CIRCUIT
    27.
    发明公开

    公开(公告)号:US20230410925A1

    公开(公告)日:2023-12-21

    申请号:US18239548

    申请日:2023-08-29

    CPC classification number: G11C17/18 G11C17/16 G11C29/08

    Abstract: A voltage trimming circuit including: a first resistance circuit having a first resistance value determined by up codes and down codes; a second resistance circuit having a second resistance value determined by the up codes and the down codes; and a comparator to output a voltage detection signal by comparing a voltage level of a reference voltage trimming node to that of a feedback node, wherein the voltage detection signal adjusts the up and down codes, which increase the first resistance value and decrease the second resistance value when the voltage level of the reference voltage trimming node is higher than that of the feedback node, and adjusts the up and down codes, which decrease the first resistance value and increase the second resistance value when the voltage level of the reference voltage trimming node is lower than that of the feedback node.

    Battery including battery sub packs for increasing battery capacity

    公开(公告)号:US11515712B2

    公开(公告)日:2022-11-29

    申请号:US16796134

    申请日:2020-02-20

    Abstract: A battery module including a plurality of battery sub packs and an electronic device including the battery module is provided. The battery module comprises a battery pack including a plurality of battery sub packs, a power delivery circuit connectable to the plurality of battery sub packs, a plurality of switches connected between the plurality of battery sub packs and the power delivery circuit, and at least one processor configured to control the plurality of switches to transmit power stored in a first battery sub pack to the power delivery circuit during a first time interval and transmit power stored in the power delivery circuit to a second battery sub pack during a second time interval. Other various embodiments are also provided herein.

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