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公开(公告)号:US10031868B2
公开(公告)日:2018-07-24
申请号:US15608846
申请日:2017-05-30
Applicant: Intel Corporation
Inventor: Christopher P. Mozak , James A. McCall , Bryan K. Casper
CPC classification number: G06F13/1657 , G06F11/10 , G06F13/4004 , G06F13/4022 , G06F13/4072 , G06F13/4217 , G06F13/4221 , G06F13/4234 , H04L25/4915 , Y02D10/14 , Y02D10/151
Abstract: Dynamic bus inversion (DBI) for programmable levels of a ratio of ones and zeros. A transmitting device identifies a number and/or ratio of ones and zeros in a noninverted version of a signal to be transmitted (“noninverted signal”) and a number and/or ratio of ones and zeros in an inverted version of the signal (“inverted signal”). The transmitting device can calculate whether a difference of ones and zeros in the noninverted signal or a difference of ones and zeros in the inverted signal provides a calculated average ratio of ones to zeros closer to a target ratio. The transmitting device sends the signal that achieves provides the calculated average ratio closer to the target ratio.
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公开(公告)号:US09865326B2
公开(公告)日:2018-01-09
申请号:US15363399
申请日:2016-11-29
Applicant: Intel Corporation
Inventor: Kuljit S. Bains , John B. Halbert , Christopher P. Mozak , Theodore Z. Schoenborn , Zvika Greenfield
IPC: G06F13/10 , G11C11/4091 , G11C11/406 , G06F3/06
CPC classification number: G11C11/4091 , G06F3/0619 , G06F3/0659 , G06F3/0673 , G06F2212/7211 , G11C11/406 , G11C11/40611 , G11C11/40618 , G11C11/40622
Abstract: A memory controller issues a targeted refresh command. A specific row of a memory device can be the target of repeated accesses. When the row is accessed repeatedly within a time threshold (also referred to as “hammered” or a “row hammer event”), physically adjacent row (a “victim” row) may experience data corruption. The memory controller receives an indication of a row hammer event, identifies the row associated with the row hammer event, and sends one or more commands to the memory device to cause the memory device to perform a targeted refresh that will refresh the victim row.
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公开(公告)号:US09658642B2
公开(公告)日:2017-05-23
申请号:US14038537
申请日:2013-09-26
Applicant: Intel Corporation
Inventor: Christopher P. Mozak
CPC classification number: G06F1/04 , G06F13/4291 , G11C7/222 , G11C27/02 , H03L7/00 , H04L7/0008
Abstract: A device with an I/O interface includes a replica clock distribution path matched to a clock distribution path of an unmatched receiver circuit. The device can monitor changes in delay in the replica path, and adjust delay in the real clock distribution path in response to the delay changes detected in the replica path. The receiver circuit includes a data path and a clock distribution network in an unmatched configuration. A ring oscillator circuit includes a replica clock distribution network matched to the real clock distribution network. Thus, delay changes detected for the replica clock distribution network indicates a change in delay in the real clock distribution network, which can be compensated accordingly.
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公开(公告)号:US09583176B1
公开(公告)日:2017-02-28
申请号:US14864435
申请日:2015-09-24
Applicant: Intel Corporation
Inventor: Christopher P. Mozak
IPC: G11C7/00 , G11C11/4096 , G11C11/4076 , G11C7/22
CPC classification number: G11C11/4096 , G11C7/1078 , G11C7/1084 , G11C7/1093 , G11C7/222 , G11C11/4076
Abstract: Systems, apparatuses and methods may provide for determining a status of an enable signal and selecting a leaker resistance from a plurality of leaker resistances based at least in part on the status of the enable signal. Additionally, the selected leaker resistance may be applied to a data strobe line of a memory bus. In one example, the selected leaker resistance reduces ringback noise on the data strobe line.
Abstract translation: 系统,装置和方法可以至少部分地基于使能信号的状态来提供确定使能信号的状态并从多个漏电阻中选择一个漏电阻。 另外,所选择的漏电阻可以应用于存储器总线的数据选通线。 在一个示例中,所选择的漏电阻降低了数据选通线上的环背噪声。
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公开(公告)号:US09507408B2
公开(公告)日:2016-11-29
申请号:US13629008
申请日:2012-09-27
Applicant: Intel Corporation
Inventor: Xiuting C. Man , Christopher P. Mozak , Shaun M. Conrad , Jeffery L. Krieger , Philip R. Lehwalder , Inder M. Sodhi
CPC classification number: G06F1/3296 , G06F1/3275 , G06F1/3287 , Y02D10/14 , Y02D10/171 , Y02D50/20
Abstract: Power gating control architectures. A memory device having at least a memory array and input/output (I/O) lines terminated on the memory device with termination circuitry coupled to receive a termination supply voltage (Vtt) with power gating circuitry to selectively gate the termination supply voltage in response to a power gating control signal (VttControl) is coupled with a processing core coupled with the memory device, the processing core to selectively assert and deassert the VttControl signal.
Abstract translation: 电力门控控制架构。 存储器件具有至少存储器阵列和终端于存储器件上的输入/输出(I / O)线,其中终端电路被耦合以用电源门控电路接收终端电源电压(Vtt),以响应于选择性地对终端电源电压进行选通 电力门控控制信号(VttControl)与与存储器件耦合的处理核心耦合,处理核心选择性地断言和解除VttControl信号。
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36.
公开(公告)号:US09373365B2
公开(公告)日:2016-06-21
申请号:US14150334
申请日:2014-01-08
Applicant: Intel Corporation
Inventor: Christopher P. Mozak , Kevin B. Moore , John V. Lovelace , Theodore Z. Schoenborn , Bryan L. Spry , Christopher E. Yunker
IPC: G11C5/14 , G11C11/4074
CPC classification number: G11C11/4091 , G11C5/147 , G11C11/4074 , G11C11/4093 , G11C11/4099
Abstract: Described herein is an apparatus for dynamically adjusting a voltage reference level for optimizing an I/O system to achieve a certain performance metric. The apparatus comprises: a voltage reference generator to generate a voltage reference; and a dynamic voltage reference control unit, coupled with the voltage reference generator, to dynamically adjust a level of the voltage reference in response to an event. The apparatus is used to perform the method comprising: generating a voltage reference for an input/output (I/O) system; determining a worst case voltage level of the voltage reference; dynamically adjusting, via a dynamic voltage reference control unit, the voltage reference level based on determining the worst case voltage level; and computing a center of an asymmetrical eye based on the dynamically adjusted voltage reference level.
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公开(公告)号:US09218575B2
公开(公告)日:2015-12-22
申请号:US14018217
申请日:2013-09-04
Applicant: Intel Corporation
Inventor: Christopher P. Mozak , James A. McCall
CPC classification number: G06N99/005 , G05B13/02 , G11C7/1093 , G11C29/022 , G11C29/028 , G11C2029/0409 , G11C2207/2254
Abstract: I/O parameters are adjusted based on a number of errors detected in a received training signal. A controller device sends the training signal while a memory device is in a training mode. The memory device samples the training signal and the system causes an adjustment to at least one I/O parameter based on a detected number of errors. Either the controller or the memory device can perform the error detection, depending on the configuration of the system. Either an I/O parameter of the controller or an I/O parameter of the memory device can be adjusted, depending on the configuration of the system.
Abstract translation: 基于在接收到的训练信号中检测到的错误的数量来调整I / O参数。 控制器设备在存储设备处于训练模式时发送训练信号。 存储器件采样训练信号,并且系统基于检测到的错误数量对至少一个I / O参数进行调整。 控制器或存储设备可以根据系统的配置执行错误检测。 根据系统的配置,可以调整控制器的I / O参数或存储设备的I / O参数。
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38.
公开(公告)号:US08996934B2
公开(公告)日:2015-03-31
申请号:US13631961
申请日:2012-09-29
Applicant: Intel Corporation
Inventor: Christopher P. Mozak , Theodore Z. Schoenborn , James M. Shehadi
CPC classification number: G11C29/08 , G11C29/56 , G11C2029/5602
Abstract: A memory subsystem includes a test engine coupled to a memory controller that can provide memory access transactions to the memory controller, bypassing a memory address decoder. The test engine receives a command to cause it to generate transactions to implement a memory test. The command identifies the test to implement, and the test engine generates one or more memory access transactions to implement the test on the memory device. The test engine passes the transactions to the memory controller, which can schedule the commands with its scheduler. Thus, the transactions cause deterministic behavior in the memory device because the transactions are executed as provided, while at the same time testing the actual operation of the device.
Abstract translation: 存储器子系统包括耦合到存储器控制器的测试引擎,其可以绕过存储器地址解码器来向存储器控制器提供存储器访问事务。 测试引擎接收到一个命令,使其生成事务以实现内存测试。 该命令标识要实现的测试,并且测试引擎生成一个或多个存储器访问事务以在存储器设备上实现测试。 测试引擎将事务传递到内存控制器,可以使用其调度程序来调度命令。 因此,交易在存储设备中引起确定性行为,因为交易按照提供的方式执行,同时测试设备的实际操作。
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公开(公告)号:US11675716B2
公开(公告)日:2023-06-13
申请号:US16709798
申请日:2019-12-10
Applicant: Intel Corporation
Inventor: Christopher P. Mozak , Steven T. Taylor , Alvin Shing Chye Goh
CPC classification number: G06F13/1689 , G06F9/30029 , G06F13/4243 , G06F18/214 , G11C7/1045 , G11C7/1048 , G11C7/222 , H03M13/09
Abstract: Techniques for command bus training to a memory device includes triggering a memory device to enter a first or a second command bus training mode, outputting a command/address (CA) pattern via a command bus and compressing a sampled CA pattern returned from the memory device based on whether the memory device was triggered to be in the first or the second command bus training mode.
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公开(公告)号:US11159154B2
公开(公告)日:2021-10-26
申请号:US15466688
申请日:2017-03-22
Applicant: Intel Corporation
Inventor: Eliyah W. Kilada , Christopher P. Mozak
IPC: H03B1/00 , H03K3/00 , H03K17/14 , H03K19/0175 , G11C5/14 , H03K17/16 , H03K19/00 , H03K17/10 , G06F1/3287
Abstract: An apparatus is provided which comprises: a power gate device coupled to a gated power supply node and an ungated power supply node; and a control circuitry coupled to the power gate device, wherein the control circuitry is to turn on the power gate device by providing at least two bias voltages separated in time to gradually turn on the power gate device.
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