Abstract:
An apparatus, program product and method facilitate the design of a multi-layer circuit arrangement incorporating a universal, standardized inter-layer interconnect in a multi-layer semiconductor stack to facilitate interconnection and communication between functional units disposed on a stack of semiconductor dies. Each circuit layer in the multi-layer semiconductor stack is required to include an inter-layer interface region that is disposed at substantially the same topographic location such that when the semiconductor dies upon which such circuit layers are disposed are arranged together in a stack, electrical conductors disposed within each semiconductor die are aligned with one another to provide an inter-layer bus that is oriented vertically, or transversely, with respect to the individual circuit layers.
Abstract:
A die stack package is provided and includes a substrate, a stack of computing components, at least one thermal plate, which is thermally communicative with the stack and a lid supported on the substrate to surround the stack and the at least one thermal plate to thereby define a first heat transfer path extending from one of the computing components to the lid via the at least one thermal plate and a fin coupled to a surface of the lid and the at least one thermal plate, and a second heat transfer path extending from the one of the computing components to the lid surface without passing through the at least one thermal plate.
Abstract:
A design structure is provided for a memory module containing an interface for receiving memory access commands from an external source, in which a first portion of the interface receives memory access data at a first bus frequency and a second portion of the interface receives memory access data at a second different bus frequency. Preferably, the memory module contains a second interface for re-transmitting memory access data, also operating at dual frequency. The memory module is preferably used in a high-capacity memory subsystem organized in a tree configuration in which data accesses are interleaved. Preferably, the memory module has multiple-mode operation, one of which supports dual-speed buses for receiving and re-transmitting different parts of data access commands, and another of which supports conventional daisy-chaining.
Abstract:
Method and apparatus for optimally placing memory devices within a computer system. A memory controller may include circuitry configured to retrieve or one or more performance metrics a plurality of memory devices connected thereto. Based on the performance metrics and one or more predefined rules for placing memory devices, the circuitry may determine an optimal placement of the memory devices in the system.
Abstract:
An integrated circuit assembly and associated method of detecting microchip tampering may include multiple connections in electrical communication with a conductive layer. Defensive circuitry may inhibit analysis of the microchip where a connection no longer connects to the conductive layer. The defensive circuitry may similarly be initiated where a connection unintended to be in electrical communication with the conductive layer is nonetheless connected.
Abstract:
A circuit assembly includes a functional chip and a first capacitor. The functional chip includes a first logic island and a second logic island. The first capacitor is configured to be selectively coupled (e.g., at different times) to a first power supply terminal of the first logic island and a second power supply terminal of the second logic island.
Abstract:
A circuit assembly includes a functional chip and a first capacitor. The functional chip includes a first logic island and a second logic island. The first capacitor is configured to be selectively coupled (e.g., at different times) to a first power supply terminal of the first logic island and a second power supply terminal of the second logic island.
Abstract:
A method of making an integrated circuit package includes forming a through hole in an integrated circuit and assembling a die containing the integrated circuit on a carrier so that the die is mechanically and electrically connected to the carrier. Thereafter, an underfill material is dispensed between the die and the carrier via the through hole.
Abstract:
An apparatus for testing electrical continuity of a surface mounted (SMT) electrical board includes: a printed wiring board having a first surface and an opposite second surface; a conductive signal line disposed on each of the first and second surfaces of the printed wiring board; an electrical component disposed on and electrically connected to the conductive signal line on the first surface; and a through hole extending through the printed wiring board and the conductive signal line on the second surface of the printed wiring board exposing a surface side of the conductive signal line facing the first surface of the printed wiring board. The through hole is unplated in an inside bore defining the through hole and the through hole allows direct access to the conductive signal line on the first surface to test continuity of the conductive signal line on the first surface connected to the electrical component from the second surface of the printed wiring board.
Abstract:
A random access memory device includes an array of individual memory cells arranged into rows and columns, each memory cell having an access device associated therewith. Each row of the array further includes a plurality of N word lines associated therewith, with a wherein N corresponds to a number of independently accessible partitions of the array, wherein each access device in a given row is coupled to only one of the N word lines of the row. Address decoder logic in signal communication with the array is configured to receive a plurality of row address bits and determine, for a requested row identified by the row address bits, which of the N partitions within the requested row are to be accessed, such that access devices within a selected row, but not within a partition to be accessed, are not activated.