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公开(公告)号：US20230274456A1
公开(公告)日：2023-08-31
申请号：US18143389
申请日：2023-05-04
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Kwangdon KIM , Seihan PARK , Jaehee KWAK , Chanyul KIM , Dubok PARK , Cheolseong PARK , Sangwook BAEK
CPC classification number: G06T7/60 , G06T7/90 , G01J3/465 , G01J1/42 , G06T2207/20081 , G06T2207/10024 , G06T2207/20084 , G01J2001/4252
Abstract: Disclosed are an apparatus, a system, and a control method for measuring an LED panel. The method for measuring an LED panel comprises the steps of: capturing an image of an LED panel displayed in a preset color; classifying each pixel of the LED panel from the captured image of the LED panel into pixel regions having different sizes according to a predetermined threshold brightness value; obtaining a tristimulus value of each pixel by using the data of the classified pixel regions and a trained artificial intelligence model; and obtaining the luminance and chrominance of each pixel on the basis of the obtained tristimulus value.
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42.发明申请公开(公告)号：US20180345683A1
公开(公告)日：2018-12-06
申请号：US16037312
申请日：2018-07-17
Applicant: Xerox Corporation
Inventor： Anthony S. Condello , Jack T. LeStrange , Xin Yang , Mandakini Kanungo , Peter J. Knausdorf
IPC: B41J11/00
CPC classification number: B41J11/002 , G01J1/06 , G01J1/429 , G01J2001/4252
Abstract: A printer includes an ultraviolet (UV) curing device having UV light emitting diodes (LEDs) to cure UV curable inks ejected onto a surface after the surface travels past a plurality of printheads in the printer. A UV detector having UV sensors is positioned opposite the UV curing device so the UV sensors and UV LEDs are opposite one another in a one-to-one correspondence. A controller operates the UV curing device to direct UV light into the UV detector and receives electrical signals generated by the UV sensors. The controller compares these electrical signals to a predetermined threshold to identify defective LEDs in the UV curing device. The controller then determines how to move the UV curing device across the path of the surface to irradiate areas of the surface previously opposite the defective UV LEDs.
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公开(公告)号：US20180164223A1
公开(公告)日：2018-06-14
申请号：US15835380
申请日：2017-12-07
Applicant: FormFactor, Inc.
Inventor： Nobuhiro Kawamata , Toshihiro Kasai , Hiromitsu Sasanami , Shigeki Mori
CPC classification number: G01N21/8806 , G01J1/0418 , G01J1/08 , G01J1/32 , G01J1/42 , G01J2001/4252 , G01R31/2831 , G01R31/2889 , G01R31/311 , G02B27/0955 , H04N1/028 , H04N1/0288 , H04N1/02885
Abstract: Improved wafer-scale testing of optoelectronic devices, such as CMOS image scan devices, is provided. A probe card includes an LED light source corresponding to each device under test in the wafer. The LED light sources provide light from a phosphor illuminated by the LED. A pinhole and lens arrangement is used to collimate the light provided to the devices under test. Uniformity of illumination can be provided by closed loop control of the LED light sources using internal optical signals as feedback signals, in combination with calibration data relating the optical signal values to emitted optical intensity. Uniformity of illumination can be further improved by providing a neutral density filter for each LED light source to improve uniformity from one source to another and/or to improve uniformity of the radiation pattern from each LED light source.
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公开(公告)号：US20170227207A1
公开(公告)日：2017-08-10
申请号：US15181065
申请日：2016-06-13
Applicant: Cree, Inc.
Inventor： Andrew BENDTSEN , Kurt Wilcox , Boris Karpichev , John Roberts , David Goelz , Douglas E. Keiter , Randy Bernard
CPC classification number: F21V29/74 , F21S8/026 , F21V5/045 , F21V7/00 , F21V15/01 , F21V23/003 , F21V23/007 , F21V23/0457 , F21V23/0464 , F21V23/0478 , F21V29/10 , F21V29/15 , F21V29/508 , F21V31/005 , F21Y2103/33 , F21Y2115/10 , G01J1/0214 , G01J1/0271 , G01J1/32 , G01J1/4204 , G01J1/4228 , G01J2001/4247 , G01J2001/4252 , H05B33/0857
Abstract: In one aspect, luminaires are described herein having sensor modules integrated therein. In one aspect, a luminaire described herein comprises a light emitting face including a LED assembly. A sensor module is integrated into the luminaire at a position at least partially overlapping the light emitting face. In another aspect, a luminaire described herein comprises a LED assembly and a driver assembly. A sensor module is integrated into the luminaire along or more convective air current pathways cooling the LED assembly or driver assembly.
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公开(公告)号：US20170188431A1
公开(公告)日：2017-06-29
申请号：US15460432
申请日：2017-03-16
Applicant: iLumisys, Inc.
Inventor： James R. Scapa , David L. Simon , John Ivey
CPC classification number: H05B33/0848 , F21K9/27 , F21K9/272 , F21K9/278 , F21S2/00 , F21S8/031 , F21S8/04 , F21V23/005 , F21V23/0457 , F21V23/0464 , F21Y2101/00 , F21Y2103/10 , F21Y2115/10 , G01J1/32 , G01J2001/4252 , H05B33/08 , H05B33/0803 , H05B33/0851 , H05B33/0854 , H05B33/0884 , H05B33/089 , H05B37/0218 , Y02B20/383 , Y02B20/386
Abstract: An LED-based light includes one or more LEDs, a sensor arranged to detect a brightness level in an area resulting from the combination of light emitted by the LEDs with light from at least one ambient light source other than the LEDs, and operable to output a signal corresponding to the detected brightness level, a controller operable to regulate an amount of power provided to the LEDs in response to the signal, a light transmitting housing for the LEDs, the sensor and the controller and a connector shaped for connection with a light socket disposed at an end of the housing.
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Patent Agency Ranking
46.发明授权Method of inspecting a light source module for defects, method of manufacturing a light source module, and apparatus for inspecting a light source module 有权检查缺陷的光源模块的方法，制造光源模块的方法，以及用于检查光源模块的装置公开(公告)号：US09546926B2
公开(公告)日：2017-01-17
申请号：US14581147
申请日：2014-12-23
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Won Soo Ji , Oh Seok Kwon , Dae Seo Park , Ka Ram Lee
CPC classification number: G01M11/0278 , G01J1/42 , G01J2001/4252 , G01M11/0257
Abstract: A method for inspecting a light source module for defects includes preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device. The lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from the center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred. Various other methods and apparatuses for inspecting light source modules are additionally provided.
Abstract translation: 用于检查光源模块的缺陷的方法包括：准备安装有发光装置和覆盖发光装置的透镜的基板。 向发光器件施加电流以使发光器件导通。 透镜在开启发光器件时成像。 基于获得的图像计算表示来自透镜中心的发光分布的对称性的中心对称，并将计算出的中心对称性与参考值进行比较，以确定是否发生不对称发光分布。 另外提供用于检查光源模块的各种其它方法和装置。
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公开(公告)号：US09419172B2
公开(公告)日：2016-08-16
申请号：US14606954
申请日：2015-01-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Min Ki Kim , Jung Jin Kim , Yong Min Kwon
CPC classification number: H01L33/005 , G01J2001/4252 , G01J2003/466 , G01R31/2635 , H01L24/97 , H01L33/0095 , H01L33/486 , H01L33/62 , H01L2224/14 , H01L2224/16225 , H01L2933/0033 , H01L2933/0041
Abstract: A method of manufacturing a light emitting device package includes forming a plurality of light emitting devices by growing a plurality of semiconductor layers on a wafer, and measuring color characteristics of light emitted from each of the plurality of light emitting devices. For each of the plurality of light emitting devices, a type and an amount of wavelength conversion material is determined for color compensating the light emitting device based on a difference between the measured color characteristics and target color characteristics. A wavelength conversion layer is formed on at least two light emitting devices among the plurality of light emitting devices, the wavelength conversion layer having the type and the amount of wavelength conversion material determined for the at least two light emitting devices. The plurality of light emitting devices is then divided into individual light emitting device packages.
Abstract translation: 制造发光器件封装的方法包括通过在晶片上生长多个半导体层来形成多个发光器件，并测量从多个发光器件中的每个发射的光的颜色特性。 对于多个发光器件中的每一个，基于测量的颜色特性和目标颜色特性之间的差异，确定波长转换材料的类型和量用于对发光器件进行颜色补偿。 波长转换层形成在多个发光器件中的至少两个发光器件上，波长转换层具有为至少两个发光器件确定的类型和波长转换材料的量。 然后将多个发光器件分成单独的发光器件封装。
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48.发明授权Standard light source having restriction portion for diffuse reflection and measurement method 有权具有用于漫反射和测量方法的限制部分的标准光源公开(公告)号：US09377352B2
公开(公告)日：2016-06-28
申请号：US14161690
申请日：2014-01-23
Applicant: Otsuka Electronics Co., Ltd.
Inventor： Kazuaki Ohkubo
CPC classification number: G01J1/08 , G01J1/42 , G01J2001/061 , G01J2001/4252
Abstract: A novel standard light source with a more simplified construction, which is suitable for measurement of total luminous flux of a light source different in luminous intensity distribution characteristics from a conventional standard light source, and a measurement method with the use of that standard light source are provided. A standard light source includes a light emitting portion, a power feed portion electrically connected to the light emitting portion, and a restriction portion provided between the light emitting portion and the power feed portion, for restricting propagation of light radiated from the light emitting portion toward the power feed portion. A surface of the restriction portion on which light from the light emitting portion is incident is constructed for diffuse reflection.
Abstract translation: 具有更简化结构的新型标准光源，其适合于测量与常规标准光源不同的发光强度分布特性的光源的总光通量，以及使用该标准光源的测量方法 提供。 标准光源包括发光部分，电连接到发光部分的供电部分和设置在发光部分和供电部分之间的限制部分，用于限制从发光部分辐射的光的传播朝向 供电部。 限制部分的来自发光部分的光入射的表面被构造用于漫反射。
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公开(公告)号：US20150355100A1
公开(公告)日：2015-12-10
申请号：US14722746
申请日：2015-05-27
Applicant: Keiji TSUDA
Inventor： Keiji TSUDA
IPC: G01N21/88
CPC classification number: G01R31/2635 , G01J1/0271 , G01J1/42 , G01J2001/4252
Abstract: An inspection device is provided including a light emitting element configured to emit light, a light receiving element arranged so as to face the light emitting element and configured to receive the light, where one of the light emitting element and the light receiving element is used as a to-be-inspected element, and the other one of the light emitting element and the light receiving element is used as an inspection element that inspects the to-be-inspected element, a housing configured to accommodate the inspection element, and a lid configured to be detachable from the housing. In the inspection device, one of the housing and the lid is provided with an arrangement unit to which the to-be-inspected element is set in a detachable manner, and the lid includes a contact unit that electrically contacts the to-be-inspected element by touching and detaching from the to-be-inspected element.
Abstract translation: 提供了一种检查装置，包括被配置为发光的发光元件，被配置为面对发光元件并被配置为接收光的光接收元件，其中发光元件和光接收元件中的一个被用作 待检查元件，另一个发光元件和光接收元件用作检查待检查元件的检查元件，被构造成容纳检查元件的外壳，以及盖 被配置为可从壳体拆卸。 在检查装置中，壳体和盖中的一个设置有可拆卸的待检查元件的布置单元，并且盖包括与待检查的电接触的接触单元 通过触摸和分离来自被检查元件的元件。
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50.发明申请METHOD OF INSPECTING A LIGHT SOURCE MODULE FOR DEFECTS, METHOD OF MANUFACTURING A LIGHT SOURCE MODULE, AND APPARATUS FOR INSPECTING A LIGHT SOURCE MODULE 有权用于检测缺陷的光源模块的方法，制造光源模块的方法和用于检查光源模块的装置公开(公告)号：US20150355053A1
公开(公告)日：2015-12-10
申请号：US14581147
申请日：2014-12-23
Applicant: Won Soo JI , Oh Seok KWON , Dae Seo PARK , Ka Ram LEE
Inventor： Won Soo JI , Oh Seok KWON , Dae Seo PARK , Ka Ram LEE
IPC: G01M11/02
CPC classification number: G01M11/0278 , G01J1/42 , G01J2001/4252 , G01M11/0257
Abstract: A method for inspecting a light source module for defects includes preparing a board on which a light emitting device and a lens covering the light emitting device are installed. A current is applied to the light emitting device to turn on the light emitting device. The lens is imaged with the light emitting device turned on. A central symmetry denoting a symmetry of light emission distribution from the center of the lens is calculated based on the obtained image, and the calculated central symmetry is compared with a reference value to determine whether unsymmetrical light emission distribution has occurred. Various other methods and apparatuses for inspecting light source modules are additionally provided.
Abstract translation: 用于检查光源模块的缺陷的方法包括：准备安装有发光装置和覆盖发光装置的透镜的基板。 向发光器件施加电流以使发光器件导通。 透镜在开启发光器件时成像。 基于获得的图像计算表示来自透镜中心的发光分布的对称性的中心对称，并将计算出的中心对称性与参考值进行比较，以确定是否发生不对称发光分布。 另外提供用于检查光源模块的各种其它方法和装置。
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