公开(公告)号：US3500042A

公开(公告)日：1970-03-10

申请号：US3500042D

申请日：1966-02-07

Applicant: CSF

Inventor： CASTAING RAYMOND ,  SLODZIAN GEORGES

IPC: G01N27/62 ,  G01Q30/02 ,  H01J29/60 ,  H01J29/84 ,  H01J37/05 ,  H01J37/252 ,  H01J49/26 ,  H01J49/28 ,  H01J37/26

CPC classification number: H01J29/60 ,  H01J29/845 ,  H01J37/05 ,  H01J37/252 ,  H01J49/286

公开(公告)号：US2916621A

公开(公告)日：1959-12-08

申请号：US73065158

申请日：1958-04-24

Applicant: CALIFORNIA INST RES FOUND

Inventor： WITTRY DAVID B

IPC: H01J37/252

CPC classification number: H01J37/252

公开(公告)号：US20160172157A1

公开(公告)日：2016-06-16

申请号：US14906254

申请日：2013-09-10

Applicant: SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY, CHINESE ACADEMY OF SCIENCES

Inventor： SHAN QIAO ,  WEISHI WAN ,  FUHAO JI

IPC: H01J37/29 ,  H01J37/147 ,  H01J37/244

CPC classification number: H01J37/29 ,  H01J37/147 ,  H01J37/244 ,  H01J37/252 ,  H01J2237/24557 ,  H01J2237/2544

Abstract: Provided is an image type electron spin polarimeter. It at least comprises a scattering target, a two-dimensional electron detector and an electron bending unit, wherein the electron bending unit is used for bending the orbit of the incident (scattered) electrons to a first (second) angle to arrive the scattering target (two-dimensional electron detector) with an optimal incident angle, and to transfer the image of the electron intensities from the entrance plane (scattering target) to the scattering target (two-dimensional electron detector) with small aberrations, and to separate the orbits of incident and scattered electrons to increase the degree of freedom of the geometric configuration of each component of the spin polarimeter. At least one of the first and second angles is not 0°, thereby achieving the first transfer of the two-dimensional image of electron intensities on the entrance plane to the scattering target and the second transfer from scattering target to the two-dimensional electron detector respectively with small aberrations, and then achieving multichannel measurements of the electron spin.

Abstract translation: 提供了一种图像型电子自旋旋光计。 它至少包括散射目标，二维电子检测器和电子弯曲单元，其中电子弯曲单元用于将入射（散射）电子的轨道弯曲到第一（第二）角度以到达散射目标 （二维电子检测器），并将电子强度的图像从入射面（散射靶）转移到具有小像差的散射目标（二维电子检测器），并将轨道分离 的入射和散射电子，以增加旋转偏振计的每个分量的几何构型的自由度。 第一角度和第二角度中的至少一个角度不是0°，从而实现了入射面上的电子强度的二维图像向散射目标的第一次传输，并且从散射靶子到二维电子检测器的第二次传输 分别具有小的像差，然后实现电子自旋的多通道测量。

公开(公告)号：US20160141162A1

公开(公告)日：2016-05-19

申请号：US14901672

申请日：2015-02-26

Applicant: CANON KABUSHIKI KAISHA

Inventor： Kota Iwasaki

IPC: H01J49/00 ,  H01J49/40 ,  H01J49/10

CPC classification number: H01J49/164 ,  H01J37/252 ,  H01J49/0004 ,  H01J49/067 ,  H01J49/10 ,  H01J49/40

Abstract: Provided is a projection-type charged particle optical system in which a projection magnification can be changed while a decrease in the accuracy in measuring a mass-to-charge ratio is being suppressed. A projection-type charged particle optical system according to the present invention includes a first electrode disposed so as to face a sample and having an opening formed therein for allowing a charged particle to pass, a second electrode disposed on a side of the first electrode opposite to where the sample is disposed and having an opening formed therein for allowing the charged particle to pass, and a flight-tube electrode disposed such that the charged particle that has been emitted from the sample and has passed through the second electrode enters the flight-tube electrode and being configured to form a substantially equipotential space thereinside. A principal plane is formed at at least two positions in a travel path of the charged particle.

Abstract translation: 提供一种投影型带电粒子光学系统，其中可以在抑制质荷比的测量精度降低的同时改变投影倍率。 根据本发明的投影型带电粒子光学系统包括：第一电极，其设置成面对样品并且具有形成在其中的开口，用于允许带电粒子通过;第二电极，设置在第一电极的相反侧 到样品被设置并且具有形成在其中的开口以允许带电粒子通过的位置;以及飞行管电极，其被设置为使得已经从样品发射并且已经通过第二电极的带电粒子进入飞行 - 管电极并且被配置为在其内部形成基本上等电位的空间。 在带电粒子的行进路径中的至少两个位置处形成主平面。

公开(公告)号：US20150308967A1

公开(公告)日：2015-10-29

申请号：US14651187

申请日：2013-12-12

Applicant: CANON KABUSHIKI KAISHA

Inventor： Kentaro Nagai

IPC: G01N23/04 ,  G01N23/20 ,  H01J37/252

CPC classification number: G01N23/04 ,  G01N23/20 ,  G21K1/06 ,  H01J37/252 ,  H01J2237/221

Abstract: The present invention relates to an object information obtaining apparatus that obtains information about a phase image of an object using information about an interference pattern produced by a shearing interferometer, the interference pattern being formed by an electromagnetic wave or electron beam passed through or reflected by the object. The apparatus includes a first obtaining unit configured to obtain information about a differential phase image of the object using the information about the interference pattern, a second obtaining unit configured to obtain information about contrast in each region of the interference pattern, a third obtaining unit configured to weight the information about the differential phase image using the information about the contrast to obtain information about a weighted differential phase image, and a fourth obtaining unit configured to integrate the information about the weighted differential phase image to obtain the information about the phase image of the object.

Abstract translation: 本发明涉及一种使用关于由剪切干涉仪产生的干涉图案的信息获取关于对象的相位图像的信息的对象信息获取装置，所述干涉图案由通过或反射的电磁波或电子束形成 目的。 该装置包括：第一获取单元，被配置为使用关于干扰图案的信息来获得关于对象的差分相位图像的信息;第二获取单元，被配置为获得关于干涉图案的每个区域中的对比度的信息;第三获取单元， 使用关于对比度的信息来加权关于差分相位图像的信息，以获得关于加权差分相位图像的信息;以及第四获取单元，被配置为将关于加权微分相位图像的信息进行积分，以获得关于加权微分相位图像的相关图像的信息 物体。

公开(公告)号：US20150213997A1

公开(公告)日：2015-07-30

申请号：US14684607

申请日：2015-04-13

Applicant: Carl Zeiss Microscopy, LLC

Inventor： Billy W. Ward ,  John A. Notte, IV ,  Louis S. Farkas, III ,  Randall G. Percival ,  Raymond Hill ,  Klaus Edinger ,  Lars Markwort ,  Dirk Aderhold ,  Ulrich Mantz

IPC: H01J37/08 ,  H01J37/304 ,  H01J37/305 ,  H01J37/256 ,  H01J37/317

CPC classification number: H01J37/3174 ,  B82Y10/00 ,  B82Y40/00 ,  H01J27/26 ,  H01J37/08 ,  H01J37/20 ,  H01J37/252 ,  H01J37/256 ,  H01J37/28 ,  H01J37/304 ,  H01J37/3053 ,  H01J37/3056 ,  H01J2237/08 ,  H01J2237/0807 ,  H01J2237/202 ,  H01J2237/20228 ,  H01J2237/2566 ,  H01J2237/2623 ,  H01J2237/2812 ,  H01J2237/30438 ,  H01J2237/31701 ,  H01J2237/3174 ,  H01J2237/3175 ,  H01J2237/31755

Abstract: Ion sources, systems and methods are disclosed.

公开(公告)号：US09053902B2

公开(公告)日：2015-06-09

申请号：US14356191

申请日：2012-11-12

Applicant: Hitachi High-Technologies Corporation ,  TOTO LTD.

Inventor： Yuta Ebine ,  Shinichi Tomita ,  Sukehiro Ito ,  Toshihiro Aoshima

IPC: H01J37/26 ,  G21K5/00 ,  H01J37/252 ,  H01J37/244

CPC classification number: H01J37/244 ,  H01J37/023 ,  H01J37/252 ,  H01J37/261 ,  H01J37/28 ,  H01J2237/221 ,  H01J2237/24415 ,  H01J2237/24475

Abstract: In order to provide a charged-particle radiation apparatus capable of evaluating and distinguishing the analysis position in a sample subjected to X-ray analysis in the stage before performing X-ray elemental analysis, and also making it possible for an analyst to perform, in a short period of time and without reworking, analysis for which high reliability is ensured, the present invention provides a charged-particle radiation apparatus provided with an X-ray detector, wherein a first back scattered electron detector (15) on the same axis as the X-ray detection surface of the X-ray detector (12 (25-30)) is disposed integrally with or independently from the X-ray detector (12), an X-ray signal being detected by the X-ray detector (12) simultaneously with or separately from detection of a back scattered electron signal by the first back scattered electron detector (15).

Abstract translation: 为了提供一种能够在执行X射线元素分析之前的阶段中对经过X射线分析的样本中的分析位置进行评估和区分的带电粒子辐射装置，并且使分析人员能够 本发明提供了一种具有X射线检测器的带电粒子辐射装置，其中第一背散射电子检测器（15）在同一轴线上 X射线检测器（12（25-30））的X射线检测面与X射线检测器（12）一体地或独立地设置，X射线检测器（X射线检测器 12）与第一后向散射电子检测器（15）的背散射电子信号的检测同时或分开。

公开(公告)号：US09035236B2

公开(公告)日：2015-05-19

申请号：US14124504

申请日：2012-06-07

Applicant: Vinicius Anghel ,  Guy Jonkmans ,  Cybele Jewett ,  Martin Thompson

Inventor： Vinicius Anghel ,  Guy Jonkmans ,  Cybele Jewett ,  Martin Thompson

IPC: G01T1/00 ,  G01T1/29 ,  G01N23/083 ,  H01J3/14 ,  G01V5/00 ,  G01N23/04 ,  G01N23/20 ,  H01J37/252

CPC classification number: G01V5/0025 ,  G01N23/046 ,  G01N23/20 ,  G01N2223/419 ,  G01N2223/626 ,  G01V5/005 ,  G01V5/0066 ,  G01V5/0091 ,  H01J37/252

Abstract: A method is proposed herein to detect high atomic number materials, such as Special Nuclear Materials, within a container based on muon tomography. The container is modeled as a plurality of volume elements. Information related to an initial trajectory and a final trajectory of each muon passing through the container is received. Additionally, a set of initial outer prong vectors and a set of final outer prong vectors are created. Then, a plurality of vector combinations are created from a selected initial vector and a selected final vector. A metric is determined and associated with each vector combination. A subset of the plurality of vector combinations is associated with each volume element and an estimated scattering density is determined and assigned to the volume element. Based on the estimated scattering density assigned to the volume elements, a three dimensional image of the container may be generated.

Abstract translation: 本文提出了一种在基于μ子层析成像的容器内检测高原子序列材料（如特殊核材料）的方法。 容器被建模为多个体积元件。 接收与通过容器的每个μ子的初始轨迹和最终轨迹相关的信息。 另外，创建一组初始的外侧叉子向量和一组最终的外部叉形矢量。 然后，从所选择的初始向量和所选择的最终向量创建多个向量组合。 确定度量并与每个向量组合相关联。 多个向量组合的子集与每个体积元素相关联，并且确定估计的散射密度并将其分配给体积元素。 基于分配给体积元素的估计散射密度，可以产生容器的三维图像。

公开(公告)号：US20140117229A1

公开(公告)日：2014-05-01

申请号：US13661830

申请日：2012-10-26

Applicant: FEI COMPANY

Inventor： Michael James Owen

IPC: H01J37/252

CPC classification number: H01J37/252 ,  G01N23/2252 ,  H01J2237/221 ,  H01J2237/24585 ,  H01J2237/2561

Abstract: Mineral definitions each include a list of elements, each of the elements having a corresponding standard spectrum. To determine the composition of an unknown mineral sample, the acquired spectrum of the sample is sequentially decomposed into the standard spectra of the elements from the element list of each of the mineral definitions, and a similarity metric computed for each mineral definition. The unknown mineral is identified as the mineral having the best similarity metric.

Abstract translation: 矿物定义各自包括元素列表，每个元素具有相应的标准光谱。 为了确定未知矿物样品的组成，将样品的获取光谱从每个矿物定义的元素列表顺序分解成元素的标准光谱，以及为每种矿物定义计算的相似性度量。 未知矿物被鉴定为具有最佳相似性度量的矿物。

公开(公告)号：US08648313B2

公开(公告)日：2014-02-11

申请号：US12646496

申请日：2009-12-23

Applicant: Toshiyoshi Watanabe ,  Kouji Miyatake

Inventor： Toshiyoshi Watanabe ,  Kouji Miyatake

IPC: G01T1/24

CPC classification number: H01J37/244 ,  G01T1/2928 ,  H01J37/252 ,  H01J2237/24415 ,  H01L31/115

Abstract: A silicon drift detector has an X-ray detection device, an electrode terminal subassembly for electrical connection, a Peltier device, and first and second shields formed between the electrode terminal subassembly and the Peltier device. The first shield is made of a material consisting chiefly of an element having an atomic number smaller than the average atomic numbers of the elements included in the material of the Peltier device. The second shield is made of a material consisting chiefly of an element having an atomic number greater than the atomic numbers of the elements included in the material of the Peltier device.

Abstract translation: 硅漂移检测器具有X射线检测装置，用于电连接的电极端子子组件，珀耳帖装置以及形成在电极端子组件和珀耳帖装置之间的第一和第二屏蔽。 第一屏蔽由主要由原子序数小于包含在珀耳帖装置的材料中的元素的平均原子序数的元素组成的材料制成。 第二屏蔽由主要由原子序数大于包含在珀耳帖装置的材料中的元素的原子序数的元素组成的材料制成。