Methods for producing polybenzoxazol precursors and corresponding resist
solutions
    62.
    发明授权
    Methods for producing polybenzoxazol precursors and corresponding resist solutions 失效
    聚苯并恶唑前体和相应抗蚀剂溶液的制备方法

    公开(公告)号:US5688631A

    公开(公告)日:1997-11-18

    申请号:US618488

    申请日:1996-03-19

    CPC分类号: C08G73/22 G03F7/0233

    摘要: Methods for producing solutions of polybenzoxazol precursors that are soluble in alkali and resist solutions based on such precursors. A dicarboxylic acid halogenide is reacted with a bis-(o-aminophenol) in an organic solvent and in the presence of a polymer with a tertiary N atom, which is insoluble in the solvent. Excess polymer and hydrohalogenide are separated from the reaction solution. The reaction solution is optionally mixed with a photoactive component.

    摘要翻译: 用于生产溶于碱的聚苯并恶唑前体溶液的方法和基于这些前体的抗溶液。 二羧酸卤化物与双 - (邻氨基苯酚)在有机溶剂中和在不溶于溶剂的叔N原子的存在下反应。 从反应溶液中分离出过量的聚合物和氢卤化物。 反应溶液任选地与光活性组分混合。

    Photostructuring process
    63.
    发明授权
    Photostructuring process 失效
    照片制作过程

    公开(公告)号:US5250375A

    公开(公告)日:1993-10-05

    申请号:US812585

    申请日:1991-12-20

    CPC分类号: G03F7/40 G03F7/039 G03F7/405

    摘要: A process for producing structures in the submicron range is characterized by the following steps:a photoresist layer comprising a polymer constituent with functional groups, which are capable of reacting with primary or secondary amines, and N-blocked imide groups, a photoinitiator which releases an acid when irradiated and a suitable solvent is deposited on to a substrate;the photoresist layer is dried;the photoresist layer is exposed in an imagewise manner;the exposed photoresist layer is subjected to a temperature treatment;the photoresist layer treated in this manner is developed with an aqueous-alkaline or organic developing agent into a photoresist structure; andthe photoresist structure is treated with a chemical agent containing a primary or secondary amine; a defined dark field loss, is adjusted thereby during development in the range of between 20 and 100 nm.

    摘要翻译: 在亚微米范围内制造结构的方法的特征在于以下步骤:包含能与伯胺或仲胺反应的官能团的聚合物组分和N-封端的酰亚胺基的光致抗蚀剂层, 酸,并将合适的溶剂沉积在基材上; 干燥光致抗蚀剂层; 光致抗蚀剂层以成像方式曝光; 曝光的光刻胶层进行温度处理; 以这种方式处理的光致抗蚀剂层用含水碱性或有机显影剂显影成光致抗蚀剂结构; 并且用含有伯胺或仲胺的化学试剂处理光刻胶结构; 在20至100nm的范围内,在显影期间调节限定的暗场损耗。