公开(公告)号：US20220336417A1

公开(公告)日：2022-10-20

申请号：US17232333

申请日：2021-04-16

Applicant: Micron Technology, Inc.

Inventor： Chin Hui Chong ,  Hong Wan Ng ,  Hem P. Takiar ,  Seng Kim Ye ,  Kelvin Tan Aik Boo

IPC: H01L25/065 ,  H01L23/31 ,  H01L23/498 ,  H01L23/538 ,  H01L23/00 ,  H01L25/00

Abstract: Semiconductor devices having multiple substrates and die stacks, and associated systems and methods, are disclosed herein. In some embodiments, a semiconductor device includes a package substrate, and a first die stack mounted on the package substrate and including a plurality of first memory dies. The device can include a substrate mounted on the first die stack, the substrate including a plurality of routing elements. The device can also include a second die stack mounted on the substrate, the second die stack including a plurality of second memory dies. The device can further include a controller die mounted on the substrate. The controller die can be configured to communicate with the second die stack via the routing elements of the substrate. The device can include a mold material encapsulating the first die stack, the second die stack, the substrate, and the controller die.

公开(公告)号：US20220208744A1

公开(公告)日：2022-06-30

申请号：US17137085

申请日：2020-12-29

Applicant: Micron Technology, Inc.

Inventor： Hong Wan Ng ,  Kelvin Tan Aik Boo ,  Chin Hui Chong ,  Hem P. Takiar ,  Seng Kim Ye

IPC: H01L25/16 ,  H01L49/02 ,  H01L23/31 ,  H01L25/00 ,  H01L21/56

Abstract: Semiconductor devices and associated systems and methods are disclosed herein. In some embodiments, the semiconductor device is an assembly that includes a package substrate having a front side and a backside opposite the front side. A controller die with a first longitudinal footprint can be attached to the front side of the package substrate. A passive electrical component is also attached to the front side of the package substrate. A stack of semiconductor dies can be attached to the controller die and the passive electrical component. The stack of semiconductor dies has a second longitudinal footprint greater than the first longitudinal footprint in at least one dimension. The controller die and the passive electrical component are positioned at least partially within the second longitudinal footprint, thereby at least partially supporting the stack of semiconductor dies.

公开(公告)号：US11282811B2

公开(公告)日：2022-03-22

申请号：US15931388

申请日：2020-05-13

Applicant: Micron Technology, Inc.

Inventor： Kelvin Tan Aik Boo ,  Chin Hui Chong ,  Seng Kim Ye ,  Hong Wan Ng ,  Hem P. Takiar

IPC: H01L25/065 ,  H01L23/498 ,  H01L23/00 ,  H01L25/00

Abstract: An apparatus includes an integrated circuit and a substrate coupled to the integrated circuit. The substrate includes a primary layer having a first surface that is a first external surface of the substrate. The primary layer includes an open area that extends through the primary layer to an inner layer of the substrate. The substrate includes a secondary layer. The inner layer is located between the primary layer and the secondary layer. The inner layer includes a third surface that is orientated approximately parallel to the first surface of the primary layer. A portion of the third surface of the inner layer is exposed via the open area of the primary layer. A first plurality of wire bond pads are disposed on the portion of the third surface of the inner layer that is exposed via the open area of primary layer.

公开(公告)号：US10593607B2

公开(公告)日：2020-03-17

申请号：US15145760

申请日：2016-05-03

Applicant: Micron Technology, Inc.

Inventor： Hong Wan Ng ,  Choon Kuan Lee ,  David J. Corisis ,  Chin Hui Chong

IPC: H01L23/18 ,  H01L21/56 ,  H01L23/31 ,  H01L23/00 ,  H01L23/373 ,  H01L21/78

Abstract: A device is disclosed which includes, in one illustrative example, an integrated circuit die having an active surface and a molded body extending around a perimeter of the die, the molded body having lips that are positioned above a portion of the active surface of the die. Another illustrative example includes an integrated circuit die having an active surface, a molded body extending around a perimeter of the die and a CTE buffer material formed around at least a portion of the perimeter of the die adjacent the active surface of the die, wherein the CTE buffer material is positioned between a portion of the die and a portion of the molded body and wherein the CTE buffer material has a coefficient of thermal expansion that is intermediate a coefficient of thermal expansion for the die and a coefficient of thermal expansion for the molded body.

公开(公告)号：US10448509B2

公开(公告)日：2019-10-15

申请号：US14797721

申请日：2015-07-13

Applicant: Micron Technology, Inc.

Inventor： David J. Corisis ,  Choon Kuan Lee ,  Chin Hui Chong

IPC: H05K1/11 ,  H05K1/16 ,  H05K3/10 ,  H05K3/42 ,  H05K3/46 ,  H01L21/02 ,  H01L21/44 ,  H01L21/48 ,  H01L23/48 ,  H01L23/52 ,  G01R31/02 ,  H05K1/02 ,  H01L21/768 ,  H01L23/498 ,  H01L23/66 ,  G06F1/16 ,  H05K1/18

Abstract: Electronic devices include a substrate with first and second pairs of conductive traces extending in or on the substrate. A first conductive interconnecting member extends through a hole in the substrate and communicates electrically with a first trace of each of the first and second pairs, while a second conductive interconnecting member extends through the hole and communicates electrically with the second trace of each of the first and second pairs. The first and second interconnecting members are separated from one another by a distance substantially equal to a distance separating the conductive traces in each pair. Electronic device assemblies include a transmitting device configured to transmit a differential signal through a conductive structure to a receiving device. The conductive structure includes first and second pair of conductive traces with first and second interconnecting members providing electrical communication therebetween.

公开(公告)号：US10008468B2

公开(公告)日：2018-06-26

申请号：US15388166

申请日：2016-12-22

Applicant: Micron Technology, Inc.

Inventor： Choon Kuan Lee ,  Chin Hui Chong ,  David J. Corisis

IPC: H01L23/02 ,  H01L23/00 ,  H01L23/48

CPC classification number: H01L24/29 ,  H01L21/76898 ,  H01L23/3128 ,  H01L23/481 ,  H01L24/48 ,  H01L24/73 ,  H01L25/0657 ,  H01L25/50 ,  H01L2224/06181 ,  H01L2224/16145 ,  H01L2224/29005 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/73204 ,  H01L2224/73207 ,  H01L2224/73265 ,  H01L2225/0651 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06541 ,  H01L2225/06565 ,  H01L2225/06572 ,  H01L2924/00014 ,  H01L2924/01079 ,  H01L2924/10253 ,  H01L2924/12042 ,  H01L2924/15184 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207

Abstract: Packaged microelectronic devices and methods for manufacturing packaged microelectronic devices are disclosed herein. In one embodiment, a packaged microelectronic device can include a support member, a first die attached to the support member, and a second die attached to the first die in a stacked configuration. The device can also include an attachment feature between the first and second dies. The attachment feature can be composed of a dielectric adhesive material. The attachment feature includes (a) a single, unitary structure covering at least approximately all of the back side of the second die, and (b) a plurality of interconnect structures electrically coupled to internal active features of both the first die and the second die.

公开(公告)号：US20170271228A1

公开(公告)日：2017-09-21

申请号：US15612174

申请日：2017-06-02

Applicant: Micron Technology, Inc.

Inventor： David J. Corisis ,  Choon Kuan Lee ,  Chin Hui Chong

IPC: H01L23/31 ,  H01L21/56 ,  H01L23/00

CPC classification number: H01L23/3107 ,  H01L21/568 ,  H01L24/45 ,  H01L24/48 ,  H01L24/49 ,  H01L24/73 ,  H01L24/97 ,  H01L2224/05554 ,  H01L2224/32225 ,  H01L2224/45015 ,  H01L2224/45124 ,  H01L2224/45144 ,  H01L2224/45147 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/49171 ,  H01L2224/73265 ,  H01L2224/85001 ,  H01L2224/97 ,  H01L2924/00 ,  H01L2924/00014 ,  H01L2924/01013 ,  H01L2924/01027 ,  H01L2924/01029 ,  H01L2924/01033 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/14 ,  H01L2924/1433 ,  H01L2924/15311 ,  H01L2924/181 ,  H01L2924/18165 ,  H01L2224/85 ,  H01L2924/00012 ,  H01L2924/207

Abstract: Disclosed is a carrierless chip package for integrated circuit devices, and various methods of make same. In one illustrative embodiment, the device includes an integrated circuit chip comprising an exposed backside surface defining a plane, a plurality of wire bonds that are conductively coupled to the integrated circuit chip, each of the plurality of wire bonds being conductively coupled to a conductive exposed portion, a portion of the conductive exposed portion being positioned in the plane defined by the backside surface, and an encapsulant material positioned adjacent the integrated circuit chip and the plurality of wire bonds.

公开(公告)号：US09768121B2

公开(公告)日：2017-09-19

申请号：US15144699

申请日：2016-05-02

Applicant: Micron Technology, Inc.

Inventor： David J. Corisis ,  Chin Hui Chong ,  Choon Kuan Lee

IPC: H01L23/538 ,  H01L25/065 ,  H01L25/11 ,  H01L23/00 ,  H01L25/07 ,  H01L21/56 ,  H01L23/31 ,  H01L23/498 ,  H01L25/10 ,  H01L21/66 ,  H01L23/053

CPC classification number: H01L23/053 ,  H01L21/56 ,  H01L21/561 ,  H01L22/10 ,  H01L23/3128 ,  H01L23/3178 ,  H01L23/49805 ,  H01L23/49861 ,  H01L23/5389 ,  H01L24/14 ,  H01L24/16 ,  H01L24/17 ,  H01L24/45 ,  H01L24/46 ,  H01L24/48 ,  H01L24/49 ,  H01L24/73 ,  H01L24/97 ,  H01L25/0657 ,  H01L25/074 ,  H01L25/105 ,  H01L25/117 ,  H01L2224/05554 ,  H01L2224/16 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/45144 ,  H01L2224/48011 ,  H01L2224/48091 ,  H01L2224/48227 ,  H01L2224/4824 ,  H01L2224/484 ,  H01L2224/48599 ,  H01L2224/4911 ,  H01L2224/4912 ,  H01L2224/49171 ,  H01L2224/73265 ,  H01L2224/81 ,  H01L2224/85 ,  H01L2224/97 ,  H01L2225/06503 ,  H01L2225/06506 ,  H01L2225/0651 ,  H01L2225/06524 ,  H01L2225/06527 ,  H01L2225/06548 ,  H01L2225/06586 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2225/1064 ,  H01L2225/1088 ,  H01L2924/00014 ,  H01L2924/01005 ,  H01L2924/01006 ,  H01L2924/01015 ,  H01L2924/01033 ,  H01L2924/01046 ,  H01L2924/01047 ,  H01L2924/01078 ,  H01L2924/01079 ,  H01L2924/01082 ,  H01L2924/014 ,  H01L2924/10162 ,  H01L2924/12042 ,  H01L2924/14 ,  H01L2924/15184 ,  H01L2924/15192 ,  H01L2924/15311 ,  H01L2924/15331 ,  H01L2924/1627 ,  H01L2924/181 ,  H01L2924/1815 ,  H01L2924/19107 ,  H01L2924/30105 ,  H01L2924/30107 ,  H01L2924/00 ,  H01L2924/00012 ,  H01L2224/85399 ,  H01L2224/05599

Abstract: Stacked microelectronic devices and methods for manufacturing such devices are disclosed herein. In one embodiment, a stacked microelectronic device assembly can include a first known good packaged microelectronic device including a first interposer substrate. A first die and a first through-casing interconnects are electrically coupled to the first interposer substrate. A first casing at least partially encapsulates the first device such that a portion of each first interconnect is accessible at a top portion of the first casing. A second known good packaged microelectronic device is coupled to the first device in a stacked configuration. The second device can include a second interposer substrate having a plurality of second interposer pads and a second die electrically coupled to the second interposer substrate. The exposed portions of the first interconnects are electrically coupled to corresponding second interposer pads.

公开(公告)号：US20170141085A1

公开(公告)日：2017-05-18

申请号：US15419913

申请日：2017-01-30

Applicant: Micron Technology, Inc.

Inventor： Seng Kim Dalson Ye ,  Chin Hui Chong

IPC: H01L25/065 ,  H01L23/00 ,  H01L25/00

CPC classification number: H01L25/0657 ,  H01L21/563 ,  H01L23/13 ,  H01L23/3114 ,  H01L24/48 ,  H01L25/00 ,  H01L25/043 ,  H01L25/074 ,  H01L25/0756 ,  H01L25/10 ,  H01L25/105 ,  H01L25/117 ,  H01L25/50 ,  H01L2224/06135 ,  H01L2224/06136 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/4382 ,  H01L2224/48227 ,  H01L2224/4824 ,  H01L2224/73215 ,  H01L2224/73265 ,  H01L2225/0651 ,  H01L2225/0652 ,  H01L2225/06555 ,  H01L2225/06572 ,  H01L2225/06575 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2225/1088 ,  H01L2924/00014 ,  H01L2924/01078 ,  H01L2924/14 ,  H01L2924/15311 ,  H01L2924/1532 ,  H01L2924/15331 ,  H01L2924/181 ,  H01L2924/1815 ,  H01L2924/19107 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2224/05599 ,  H01L2224/85399

Abstract: A stackable microelectronic package includes a first microelectronic die attached to and electrically connecting with a first substrate. A second microelectronic die is attached to the first die on one side, and to a second substrate on the other side. Electrical connections are made between the first die and the first substrate, between the second die and the second substrate, and between the first and second substrates, e.g., via wire bonding. The electrical connecting elements are advantageously encased in a molding compound. Exposed contacts on the first and/or second substrates, not covered by the molding compound, provide for electrical connections between the package, and another package stacked onto the package. The package may avoid coplanarity factors, can be manufactured using existing equipment, allows for intermediate testing, and can also offer a thinner package height.

公开(公告)号：US09583476B2

公开(公告)日：2017-02-28

申请号：US15050231

申请日：2016-02-22

Applicant: Micron Technology, Inc.

Inventor： Seng Kim Dalson Ye ,  Chin Hui Chong

IPC: H01L25/04 ,  H01L25/065 ,  H01L25/07 ,  H01L25/075 ,  H01L25/11 ,  H01L25/00 ,  H01L23/13 ,  H01L23/31 ,  H01L23/00 ,  H01L21/56 ,  H01L25/10

CPC classification number: H01L25/0657 ,  H01L21/563 ,  H01L23/13 ,  H01L23/3114 ,  H01L24/48 ,  H01L25/00 ,  H01L25/043 ,  H01L25/074 ,  H01L25/0756 ,  H01L25/10 ,  H01L25/105 ,  H01L25/117 ,  H01L25/50 ,  H01L2224/06135 ,  H01L2224/06136 ,  H01L2224/32145 ,  H01L2224/32225 ,  H01L2224/4382 ,  H01L2224/48227 ,  H01L2224/4824 ,  H01L2224/73215 ,  H01L2224/73265 ,  H01L2225/0651 ,  H01L2225/0652 ,  H01L2225/06555 ,  H01L2225/06572 ,  H01L2225/06575 ,  H01L2225/1023 ,  H01L2225/1058 ,  H01L2225/1088 ,  H01L2924/00014 ,  H01L2924/01078 ,  H01L2924/14 ,  H01L2924/15311 ,  H01L2924/1532 ,  H01L2924/15331 ,  H01L2924/181 ,  H01L2924/1815 ,  H01L2924/19107 ,  H01L2924/00012 ,  H01L2924/00 ,  H01L2224/45099 ,  H01L2224/45015 ,  H01L2924/207 ,  H01L2224/05599 ,  H01L2224/85399

Abstract: A stackable microelectronic package includes a first microelectronic die attached to and electrically connecting with a first substrate. A second microelectronic die is attached to the first die on one side, and to a second substrate on the other side. Electrical connections are made between the first die and the first substrate, between the second die and the second substrate, and between the first and second substrates, e.g., via wire bonding. The electrical connecting elements are advantageously encased in a molding compound. Exposed contacts on the first and/or second substrates, not covered by the molding compound, provide for electrical connections between the package, and another package stacked onto the package. The package may avoid coplanarity factors, can be manufactured using existing equipment, allows for intermediate testing, and can also offer a thinner package height.

Abstract translation: 可堆叠微电子封装包括附接到第一衬底并与第一衬底电连接的第一微电子管芯。 第二微电子管芯在一侧连接到第一管芯，另一侧连接到第二基板。 在第一管芯和第一基板之间，第二管芯和第二基板之间以及第一和第二基板之间，例如经由引线接合，形成电连接。 电连接元件有利地被封装在模塑料中。 未被模塑料覆盖的第一和/或第二基底上的暴露接触提供了包装和堆叠在包装上的另一包装之间的电连接。 包装可以避免共面因素，可以使用现有设备制造，允许中间测试，并且还可以提供更薄的包装高度。