Semiconductor element sealed with an epoxy resin compound
    1.
    发明授权
    Semiconductor element sealed with an epoxy resin compound 失效
    用环氧树脂化合物密封的半导体元件

    公开(公告)号:US5985455A

    公开(公告)日:1999-11-16

    申请号:US95632

    申请日:1998-06-11

    摘要: Disclosed herein is an epoxy resin compound including an epoxy resin (A), a hardener (B), and an inorganic filler, characterized in that said inorganic filler contains silica (C) as an essential component, said hardener (B) is one which contains at least two phenolic hydroxyl groups and/or naphtholic hydroxyl groups in the molecule, and said silica (C) contains 1-99 wt % of synthetic silica and 99-1 wt % of natural fused silica. Disclosed also herein is a semiconductor device having a semiconductor element sealed therein with said epoxy resin compound. The epoxy resin compound does not cause such troubles as short shot, resin peeling, wire breakage, stage shift, and vent clogging at the time of molding. In addition, when used as a sealing material, it yields semiconductor devices which have good reliability at high temperature and high humidity and good resistance to soldering heat.

    摘要翻译: 本文公开了包含环氧树脂(A),固化剂(B)和无机填料的环氧树脂化合物,其特征在于,所述无机填料含有二氧化硅(C)作为必要成分,所述固化剂(B)是 在分子中含有至少两个酚羟基和/或萘酚羟基,所述二氧化硅(C)含有1-99重量%的合成二氧化硅和99-1重量%的天然熔融二氧化硅。 此处还公开了一种其中密封有所述环氧树脂化合物的半导体元件的半导体器件。 环氧树脂化合物在成型时不会引起诸如短丸,树脂剥离,断线,阶段偏移和排气堵塞等问题。 此外,当用作密封材料时,它产生在高温和高湿度下具有良好的可靠性以及良好的耐焊接热的半导体器件。

    Epoxy resin compound
    2.
    发明授权
    Epoxy resin compound 失效
    环氧树脂化合物

    公开(公告)号:US5798400A

    公开(公告)日:1998-08-25

    申请号:US696916

    申请日:1996-08-22

    摘要: Disclosed herein is an epoxy resin compound including an epoxy resin (A), a hardener (B), and an inorganic filler, characterized in that said inorganic filler contains silica (C) as an essential component, said hardener (B) is one which contains at least two phenolic hydroxyl groups and/or naphtholic hydroxyl groups in the molecule, and said silica (C) contains 1-99 wt % of synthetic silica and 99-1 wt % of natural fused silica. Disclosed also herein is a semiconductor device having a semiconductor element sealed therein with said epoxy resin compound. The epoxy resin compound does not cause such troubles as short shot, resin peeling, wire breakage, stage shift, and vent clogging at the time of molding. In addition, when used as a sealing material, it yields semiconductor devices which have good reliability at high temperature and high humidity and good resistance to soldering heat.

    摘要翻译: PCT No.PCT / JP95 / 02742 Sec。 371日期:1996年8月22日 102(e)日期1996年8月22日PCT 1995年12月27日PCT PCT。 第WO96 / 20969号公报 日期1996年7月11日公开的是包含环氧树脂(A),固化剂(B)和无机填料的环氧树脂化合物,其特征在于,所述无机填料含有二氧化硅(C)作为必要成分,所述固化剂( B)是分子中含有至少两个酚羟基和/或萘酚羟基的化合物,所述二氧化硅(C)含有1-99重量%的合成二氧化硅和99-1重量%的天然熔融二氧化硅。 此处还公开了一种其中密封有所述环氧树脂化合物的半导体元件的半导体器件。 环氧树脂化合物在成型时不会引起诸如短丸,树脂剥离,断线,阶段偏移和排气堵塞等问题。 此外,当用作密封材料时,它产生在高温和高湿度下具有良好的可靠性以及良好的耐焊接热的半导体器件。

    Epoxy resin composition
    3.
    发明授权
    Epoxy resin composition 失效
    环氧树脂组合物

    公开(公告)号:US5854316A

    公开(公告)日:1998-12-29

    申请号:US793460

    申请日:1997-02-26

    IPC分类号: C08K3/22 H01L23/29 C08L63/00

    摘要: An epoxy resin composition composed of an epoxy resin (A), a hardener (B), and an inorganic filler (C), characterized in that the content of the inorganic filler (C) is 70-97 wt % and the inorganic filler (C) contains 0.1-50 wt % of alumina. When used to seal semiconductor devices, it exhibits good moldability and imparts to the sealed semiconductors good flame retardance, solder heat resistance, and reliability at high temperatures.

    摘要翻译: PCT No.PCT / JP96 / 01919 Sec。 371日期1996年2月26日 102(e)1996年2月26日PCT 1996年7月10日PCT公布。 公开号WO97 / 03129 日本1997年1月30日由环氧树脂(A),固化剂(B)和无机填料(C)组成的环氧树脂组合物,其特征在于,无机填料(C)的含量为70-97重量% 无机填料(C)含有0.1-50重量%的氧化铝。 当用于密封半导体器件时,其表现出良好的成型性,并赋予密封半导体良好的阻燃性,焊料耐热性和高温下的可靠性。