Microstructured sensor
    1.
    发明授权
    Microstructured sensor 失效
    微结构传感器

    公开(公告)号:US07564033B2

    公开(公告)日:2009-07-21

    申请号:US10563993

    申请日:2005-01-14

    Abstract: The invention relates to a microstructured sensor, having at least one measurement chip in which there is formed a first measurement area having a first measurement structure and a second measurement area having a second measurement structure, the measurement areas being offset to one another in a lateral direction, one cap chip that is fastened in vacuum-tight fashion to the measurement chip in a connecting area, one intermediate space, formed between the measurement chip and the cap chip, that is sealed outwardly by the connecting area and in which the measurement areas are situated, and at least one contact area, formed on the measurement chip, and left exposed by the cap chip, for the contacting of the measurement chip. The sensor can be in particular a gas sensor for measuring a gas concentration, or an acceleration sensor.

    Abstract translation: 本发明涉及一种微结构传感器,其具有至少一个测量芯片,其中形成具有第一测量结构的第一测量区域和具有第二测量结构的第二测量区域,测量区域在侧向相互偏移 方向,一个在与测量芯片和盖芯片之间形成的连接区域中的测量芯片以真空密封方式固定的一个盖芯片,其由连接区域向外密封,并且测量区域 并且至少一个接触区域形成在测量芯片上,并且被盖芯片暴露以使测量芯片接触。 传感器可以特别地用于测量气体浓度的气体传感器或加速度传感器。

    Microstructured Infrared Sensor
    2.
    发明申请
    Microstructured Infrared Sensor 审中-公开
    微结构红外传感器

    公开(公告)号:US20080061237A1

    公开(公告)日:2008-03-13

    申请号:US11631249

    申请日:2005-05-11

    Abstract: An infrared sensor having at least one measuring structure, which has, for example, a sensor chip having a measuring structure and a cap chip which is attached to the sensor chip and, together with the sensor chip, defines a sensor space; a screen having an internal screen area and an external screen area surrounding the internal screen area being formed on the top side of the cap chip; the internal screen area which is transparent to the infrared radiation to be detected being formed above the measuring structure, and the external screen area being at least partly non-transparent for the incident infrared radiation. The external screen area may be designed in particular as a reflective coating of metal or a dielectric layer, as reflective structuring formed by trenches having oblique surfaces, or as absorbing structuring.

    Abstract translation: 具有至少一个测量结构的红外传感器,其具有例如具有测量结构的传感器芯片和附接到传感器芯片的帽芯片,并且与传感器芯片一起限定传感器空间; 具有内部屏幕区域的屏幕和围绕内部屏幕区域的外部屏幕区域形成在盖芯片的顶侧上; 在测量结构上方形成对要检测的红外线辐射透明的内部屏幕区域,并且外部屏幕区域对于入射的红外辐射至少部分不透明。 外部屏幕区域可以特别设计为金属或电介质层的反射涂层,作为由具有倾斜表面的沟槽形成的反射结构,或者作为吸收结构。

    Microstructured Sensor
    3.
    发明申请
    Microstructured Sensor 失效
    微结构传感器

    公开(公告)号:US20080053254A1

    公开(公告)日:2008-03-06

    申请号:US10563993

    申请日:2005-01-14

    Abstract: The invention relates to a microstructured sensor, having at least one measurement chip in which there is formed a first measurement area having a first measurement structure and a second measurement area having a second measurement structure, the measurement areas being offset to one another in a lateral direction, one cap chip that is fastened in vacuum-tight fashion to the measurement chip in a connecting area, one intermediate space, formed between the measurement chip and the cap chip, that is sealed outwardly by the connecting area and in which the measurement areas are situated, and at least one contact area, formed on the measurement chip, and left exposed by the cap chip, for the contacting of the measurement chip. The sensor can be in particular a gas sensor for measuring a gas concentration, or an acceleration sensor.

    Abstract translation: 本发明涉及一种微结构传感器,其具有至少一个测量芯片,其中形成具有第一测量结构的第一测量区域和具有第二测量结构的第二测量区域,测量区域在侧向相互偏移 方向,一个在与测量芯片和盖芯片之间形成的连接区域中的测量芯片以真空密封方式固定的一个盖芯片,其由连接区域向外密封,并且测量区域 并且至少一个接触区域形成在测量芯片上,并且被盖芯片暴露以使测量芯片接触。 传感器可以特别地用于测量气体浓度的气体传感器或加速度传感器。

    Sensor system
    4.
    发明申请
    Sensor system 有权
    传感器系统

    公开(公告)号:US20110203369A1

    公开(公告)日:2011-08-25

    申请号:US12931011

    申请日:2011-01-21

    Abstract: A sensor system includes a supporting element and a sensor element attached to the supporting element and having a main plane of extension. The supporting element has (i) at least one contact element for electrical contacting of the sensor system and (ii) at least one relief structure for stress decoupling, the at least one relief structure being situated in a plane parallel to the main plane of extension essentially between the at least one contact element and the sensor element.

    Abstract translation: 传感器系统包括支撑元件和附接到支撑元件并具有主平面延伸的传感器元件。 所述支撑元件具有(i)至少一个用于所述传感器系统的电接触的接触元件和(ii)用于应力解耦的至少一个浮雕结构,所述至少一个浮雕结构位于平行于所述主延伸平面的平面中 基本上在所述至少一个接触元件和所述传感器元件之间。

    MICROMECHANICAL STRUCTURE HAVING A SUBSTRATE AND A THERMOELEMENT, TEMPERATURE SENSOR AND/OR RADIATION SENSOR, AND METHOD FOR MANUFACTURING A MICROMECHANICAL STRUCTURE
    9.
    发明申请
    MICROMECHANICAL STRUCTURE HAVING A SUBSTRATE AND A THERMOELEMENT, TEMPERATURE SENSOR AND/OR RADIATION SENSOR, AND METHOD FOR MANUFACTURING A MICROMECHANICAL STRUCTURE 审中-公开
    具有基板和热敏元件的温度结构,温度传感器和/或辐射传感器以及用于制造微机械结构的方法

    公开(公告)号:US20090168836A1

    公开(公告)日:2009-07-02

    申请号:US12097891

    申请日:2006-11-24

    CPC classification number: G01J5/12

    Abstract: A micromechanical structure, a temperature and/or radiation sensor, and a method for manufacturing a micromechanical structure are suggested, the micromechanical structure including a substrate and a thermoelement having a reference contact and a measuring contact, the substrate having a main substrate plane), the thermoelement having a first material between the reference contact and the measuring contact and a second material between the measuring contact and a further reference contact, either the first material being situated over the second material or the second material being situated over the first material between the reference contact and the measuring contact in a direction perpendicular to the main substrate plane.

    Abstract translation: 提出了一种微机械结构,温度和/或辐射传感器以及微机械结构的制造方法,该微机械结构包括具有基准接触和测量接触的基片和热电偶,该基片具有主基片平面), 所述热电元件在所述参考接触件和所述测量接触件之间具有第一材料,以及在所述测量接触件和另一参考接触件之间的第二材料,所述第一材料位于所述第二材料上方或所述第二材料位于所述第一材料之间, 参考接触和测量接触在垂直于主基板平面的方向上。

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