Method and apparatus for checking parts to be measured using a belt-like
connection member
    5.
    发明授权
    Method and apparatus for checking parts to be measured using a belt-like connection member 失效
    使用带状连接部件检查待测部件的方法和装置

    公开(公告)号:US5521520A

    公开(公告)日:1996-05-28

    申请号:US378933

    申请日:1995-01-26

    IPC分类号: H01L21/66 G01R1/04 G01R1/02

    摘要: A method for checking a part to be measured, by using an electric connection member having a holder made of electrically insulative material and a plurality of electrically conductive members embedded within the holder with being insulated from each other, both ends of the electrically conductive members being exposed on both surfaces of the holder in such a manner that the both ends are flush with or protruded from the both surfaces of the holder; an electric circuit member having connection portions; and a measured part having connection portions. At least one of the ends of the electrically conductive members exposed on one surface of the holder is electrically connected to one of the connection portions of the electric circuit member and at least one of the ends of the electrically conductive members exposed on the other surface of the holder is electrically connected to one of the connection portions of the measured part. The electric feature and/or system feature of the measured part are measured by using the electric circuit member. The measurements are effected by repeatedly using the same electrically conductive member contributing to the electrical connection for the electric connection member, by plural times.

    摘要翻译: 一种用于通过使用具有由电绝缘材料制成的保持器的电连接构件和嵌入在保持器内的多个导电构件彼此绝缘来检查待测量部件的方法,所述导电构件的两端为 暴露在保持器的两个表面上,使得两端与保持器的两个表面齐平或突出; 具有连接部分的电路部件; 以及具有连接部的被测量部。 暴露在保持器的一个表面上的导电构件的至少一个端部电连接到电路构件的一个连接部分,并且导电构件的端部中的至少一个暴露在另一个表面上 保持器电连接到测量部分的一个连接部分。 测量部件的电气特征和/或系统特征通过使用电路部件来测量。 通过重复使用有助于电连接构件的电连接的相同导电构件多次来实现测量。

    Probe method for measuring part to be measured by use thereof and
electrical circuit member
    7.
    发明授权
    Probe method for measuring part to be measured by use thereof and electrical circuit member 失效
    用于测量使用的部件和电路部件的探针方法

    公开(公告)号:US5606263A

    公开(公告)日:1997-02-25

    申请号:US620393

    申请日:1996-03-22

    IPC分类号: G01R1/073

    CPC分类号: G01R1/07307

    摘要: An electrical circuit member comprises an electrical connecting member, said electrical connecting member having a holding member comprising an electrically insulating material and a plurality of electroconductive members embedded at predetermined intervals within said holding member, each of said plurality of electroconductive members being insulated with said electrically insulating material and also having the ends of said electroconductive member exposed on both surfaces of said holding member; and an electrical circuit part, said electrical circuit part having connecting portions to be connected to said electroconductive member or said wiring pattern exposed on both surfaces of said holding member, and being connected to at least one surface of said holding member.

    摘要翻译: 电路构件包括电连接构件,所述电连接构件具有保持构件,所述保持构件包括电绝缘材料和在所述保持构件内以预定间隔嵌入的多个导电构件,所述多个导电构件中的每一个与所述电气绝缘材料绝缘 绝缘材料,并且还使所述导电构件的端部暴露在所述保持构件的两个表面上; 和电路部分,所述电路部分具有连接到所述导电部件或暴露在所述保持部件的两个表面上的所述布线图形的连接部分,并连接到所述保持部件的至少一个表面。

    Method and apparatus for detecting position of a mark
    9.
    发明授权
    Method and apparatus for detecting position of a mark 失效
    用于检测标记位置的方法和装置

    公开(公告)号:US5392361A

    公开(公告)日:1995-02-21

    申请号:US137804

    申请日:1993-10-19

    摘要: A mark position detecting method and apparatus, suitably usable in a semiconductor device manufacturing exposure apparatus, called a stepper, prints images of a pattern of a reticle upon different shot areas on a semiconductor wafer, and aligns the reticle and the wafer. In this method, fuzzy reasoning is made by using, for example, a membership function which empirically represents the relationship between a mark signal and an alignment result. By using a conclusion of the fuzzy reasoning, the position of the mark is detected. Thus, the alignment accuracy can be improved significantly.

    摘要翻译: 称为步进机的适用于半导体装置制造曝光装置的标记位置检测方法和装置在半导体晶片上的不同拍摄区域上印刷标线图案,并对准标线片和晶片。 在该方法中,通过使用例如经验地表示标记信号和对准结果之间的关系的隶属函数来进行模糊推理。 通过使用模糊推理的结论,检测到标记的位置。 因此,可以显着提高对准精度。