公开(公告)号：US20170012081A1

公开(公告)日：2017-01-12

申请号：US15181288

申请日：2016-06-13

Applicant: XINTEC INC.

Inventor： Chia-Lun SHEN ,  Yi-Ming CHANG ,  Hsiao-Lan YEH ,  Yen-Shih HO

IPC: H01L27/146 ,  H01L21/78 ,  H01L25/065 ,  H01L23/00

CPC classification number: H01L27/14687 ,  H01L21/78 ,  H01L24/03 ,  H01L24/06 ,  H01L24/13 ,  H01L24/14 ,  H01L24/16 ,  H01L24/17 ,  H01L24/81 ,  H01L24/94 ,  H01L25/0657 ,  H01L27/14636 ,  H01L2224/0331 ,  H01L2224/0332 ,  H01L2224/0401 ,  H01L2224/0603 ,  H01L2224/06131 ,  H01L2224/06132 ,  H01L2224/06135 ,  H01L2224/11005 ,  H01L2224/1132 ,  H01L2224/11334 ,  H01L2224/1181 ,  H01L2224/11849 ,  H01L2224/13016 ,  H01L2224/13023 ,  H01L2224/13111 ,  H01L2224/1403 ,  H01L2224/14132 ,  H01L2224/14179 ,  H01L2224/16057 ,  H01L2224/16225 ,  H01L2224/1703 ,  H01L2224/17135 ,  H01L2224/81011 ,  H01L2224/81191 ,  H01L2224/818 ,  H01L2224/81801 ,  H01L2224/94 ,  H01L2225/06513 ,  H01L2225/06517 ,  H01L2225/06524 ,  H01L2225/06568 ,  H01L2924/3511 ,  H01L2224/11 ,  H01L2924/00014 ,  H01L2924/014

Abstract: A manufacturing method of a chip package includes the following steps. A patterned solder paste layer is printed on a patterned conductive layer of a wafer. Plural solder balls are disposed on the solder paste layer that is on a first portion of the conductive layer. A reflow process is performed on the solder balls and the solder paste layer. A flux layer converted from a surface of the solder paste layer is cleaned.

Abstract translation: 芯片封装的制造方法包括以下步骤。 将图案化的焊膏层印刷在晶片的图案化导电层上。 多个焊球设置在导电层的第一部分上的焊膏层上。 在焊球和焊膏层上进行回流处理。 从焊膏层的表面转换的焊剂层被清洁。

公开(公告)号：US20170148844A1

公开(公告)日：2017-05-25

申请号：US15358852

申请日：2016-11-22

Applicant: XINTEC INC.

Inventor： Yen-Shih HO ,  Hsiao-Lan YEH ,  Chia-Sheng LIN ,  Yi-Ming CHANG ,  Po-Han LEE ,  Hui-Hsien WU ,  Jyun-Liang WU ,  Shu-Ming CHANG ,  Yu-Lung HUANG ,  Chien-Min LIN

IPC: H01L27/146 ,  H01L21/48 ,  H01L21/67 ,  H01L23/18

CPC classification number: H01L27/14698 ,  H01L21/4803 ,  H01L21/67017 ,  H01L21/67132 ,  H01L23/18 ,  H01L27/14618 ,  H01L27/14634 ,  H01L27/14636 ,  H01L27/14687

Abstract: A chip package includes a chip, an adhesive layer, and a dam element. The chip has a sensing area, a first surface, and a second surface that is opposite to the first surface. The sensing area is located on the first surface. The adhesive layer covers the first surface of the chip. The dam element is located on the adhesive layer and surrounds the sensing area. The thickness of the dam element is in a range from 20 μm to 750 μm, and the wall surface of the dam element surrounding the sensing area is a rough surface.

公开(公告)号：US20160307779A1

公开(公告)日：2016-10-20

申请号：US15098278

申请日：2016-04-13

Applicant: XINTEC INC.

Inventor： Yu-Tung CHEN ,  Quan-Qun SU ,  Chuan-Jin SHIU ,  Chien-Hui CHEN ,  Hsiao-Lan YEH ,  Yen-Shih HO

IPC: H01L21/56 ,  H01L21/67 ,  B05B1/24 ,  H01L21/78 ,  H01L23/29 ,  H01L23/00 ,  H01L21/687 ,  H01L21/768

CPC classification number: H01L21/561 ,  H01L21/02118 ,  H01L21/02282 ,  H01L21/6715 ,  H01L21/68742 ,  H01L21/68764 ,  H01L21/76831 ,  H01L21/76898 ,  H01L23/3192 ,  H01L24/03 ,  H01L24/11 ,  H01L24/94 ,  H01L2224/02313 ,  H01L2224/0346 ,  H01L2224/0391 ,  H01L2224/0401 ,  H01L2224/05022 ,  H01L2224/05548 ,  H01L2224/05573 ,  H01L2224/05624 ,  H01L2224/05647 ,  H01L2224/05655 ,  H01L2224/13022 ,  H01L2224/13024 ,  H01L2224/131 ,  H01L2224/94 ,  H01L2924/00014 ,  H01L2224/03 ,  H01L2224/11 ,  H01L2924/014

Abstract: A wafer coating system includes a wafer chuck, a flowing insulating material sprayer and a wafer tilting lifting pin. The wafer chuck has a carrier part and a rotating part, which the carrier part is mounted on the rotating part to carry a wafer, and the rotating part is configured to rotate with a predetermined axis. The flowing insulating material sprayer is above the wafer chuck and configured to spray a flowing insulating material to the wafer, and the wafer tilting lifting pin is configured to form a first acute angle between the wafer and direction of gravity.

Abstract translation: 晶片涂布系统包括晶片卡盘，流动绝缘材料喷雾器和晶片倾斜提升销。 晶片卡盘具有托架部和旋转部，托架部安装在旋转部上以承载晶片，旋转部构造成以预定轴旋转。 流动的绝缘材料喷雾器位于晶片卡盘之上，并配置成将流动的绝缘材料喷射到晶片上，并且晶片倾斜提升销构造成在晶片和重心之间形成第一锐角。

公开(公告)号：US20230369151A1

公开(公告)日：2023-11-16

申请号：US18310488

申请日：2023-05-01

Applicant: XINTEC INC.

Inventor： Hsiao-Lan YEH ,  Chin-Kang CHEN ,  Kung-Hua CHENG ,  Szu-Hui MA LEE ,  Chi-Jia TONG

IPC: H01L23/14 ,  H01L21/683 ,  H01L21/56 ,  H01L21/02

CPC classification number: H01L23/142 ,  H01L21/6835 ,  H01L21/56 ,  H01L21/02348 ,  H01L2221/68318 ,  H01L2221/68345

Abstract: A semiconductor device structure is provided. The semiconductor device structure includes a first transparent substrate, a conductive layer, an insulating protective layer, a second transparent substrate, a device substrate, and a bonding layer. The first transparent substrate has a first surface and an opposite second surface. The conductive layer is disposed on the second surface of the first transparent substrate. The insulating protective layer covers the conductive layer and the first transparent substrate. The second transparent substrate is disposed above the first transparent substrate, and has a first surface facing the first transparent substrate and an opposite second surface. The device substrate is disposed on the second surface of the second transparent substrate. The bonding layer is bonded to the insulating protective layer and the first surface of the second transparent substrate.

公开(公告)号：US20170148694A1

公开(公告)日：2017-05-25

申请号：US15358098

申请日：2016-11-21

Applicant: XINTEC INC.

Inventor： Yen-Shih HO ,  Hsiao-Lan YEH ,  Chia-Sheng LIN ,  Yi-Ming CHANG ,  Po-Han LEE ,  Hui-Hsien WU ,  Jyun-Liang WU

IPC: H01L23/053 ,  H01L21/56 ,  H01L21/683 ,  H01L21/78 ,  H01L23/31 ,  H01L23/48

CPC classification number: H01L21/561 ,  G06K9/0004 ,  H01L21/6836 ,  H01L21/78 ,  H01L23/3114 ,  H01L23/481 ,  H01L2224/16225

Abstract: A chip package includes a chip, a first adhesive layer, a second adhesive layer, and a protection cap. The chip has a sensing area, a first surface, a second surface that is opposite to the first surface, and a side surface adjacent to the first and second surfaces. The sensing area is located on the first surface. The first adhesive layer covers the first surface of the chip. The second adhesive layer is located on the first adhesive layer, such that the first adhesive layer is between the first surface and the second adhesive layer. The protection cap has a bottom board and a sidewall that surrounds the bottom board. The bottom board covers the second adhesive layer, and the sidewall covers the side surface of the chip.