Abstract:
A method for fabricating semiconductor device is disclosed. The method includes the steps of: providing a substrate having a transistor region and a resistor region; forming a shallow trench isolation (STI) on the substrate of the resistor region; forming a tank in the STI of the resistor region; and forming a resistor in the tank and on the surface of the STI adjacent to two sides of the tank.
Abstract:
A light emitting diodes (LEDs) is presented. The LED includes a stress-alleviation layer on a substrate. Open regions and stress-alleviation layer regions are formed on the substrate. Epitaxial layers are disposed on the substrate, at least in the open regions therein, thereby forming an LED structure. The substrate is diced through at least a first portion of the stress-alleviation regions, thereby forming the plurality of LEDs.
Abstract:
Voice processing methods and systems are provided. An utterance is received. The utterance is compared with teaching materials according to at least one matching algorithm to obtain a plurality of matching values corresponding to a plurality of voice units of the utterance. Respective voice units are scored in at least one first scoring item according to the matching values and a personified voice scoring algorithm. The personified voice scoring algorithm is generated according to training utterances corresponding to at least one training sentence in a phonetic-balanced sentence set of a plurality of learners and at least one real teacher, and scores corresponding to the respective voice units of the training utterances of the learners in the first scoring item provided by the real teacher.
Abstract:
A semiconductor structure includes a substrate and a conductive carrier-tunneling layer over and contacting the substrate. The conductive carrier-tunneling layer includes first group-III nitride (III-nitride) layers having a first bandgap, wherein the first III-nitride layers have a thickness less than about 5 nm; and second III-nitride layers having a second bandgap lower than the first bandgap, wherein the first III-nitride layers and the second III-nitride layers are stacked in an alternating pattern. The semiconductor structure is free from a III-nitride layer between the substrate and the conductive carrier-tunneling layer. The semiconductor structure further includes an active layer over the conductive carrier-tunneling layer.
Abstract:
A poly opening polish process includes the following steps. A semi-finished semiconductor component is provided. The semi-finished semiconductor component includes a substrate, a gate disposed on the substrate, and a dielectric layer disposed on the substrate and covering the gate. A first polishing process is applied onto the dielectric layer. A second polishing process is applied to the gate. The second polishing process utilizes a wetting solution including a water soluble polymer surfactant, an alkaline compound and water. The poly opening polish process can effectively remove an oxide residue formed in the chemical mechanical polish, thereby improving the performance of the integrated circuit and reducing the production cost of the integrated circuit.
Abstract:
The package substrates with through silicon plugs (or vias) described above provide lateral and vertical heat dissipation pathways for semiconductor chips that require thermal management. Designs of through silicon plugs (TSPs) with high duty ratios can most effectively provide heat dissipation. TSP designs with patterns of double-sided combs can provide high duty ratios, such as equal to or greater than 50%. Package substrates with high duty ratios are useful for semiconductor chips that generate large amount of heat. An example of such semiconductor chip is a light-emitting diode (LED) chip.
Abstract:
A method of forming a semiconductor structure includes providing a substrate; forming a buffer/nucleation layer over the substrate; forming a group-III nitride (III-nitride) layer over the buffer/nucleation layer; and subjecting the III-nitride layer to a nitridation. The step of forming the III-nitride layer comprises metal organic chemical vapor deposition.
Abstract:
An RFID-based book return apparatus has dual touch screen and operation interface that conforms to a standard for barrier-free design. It has the following features: automatically detecting RFID tags attached on the identification cards of borrowers and attached to books to be returned, and enabling a panel covering a book-return gate to open; adopting a high-density optical sensor array to prevent the borrower's hand from being clamped accidentally by the cover panel of the book-return gate; enabling an access panel of the book return apparatus to open/close automatically according to the RFID tag detection book return apparatus, facilitating the maintenance and repair of the book return apparatus; preventing any components, papers and books in the book return apparatus from wet damage due to rainfall or moisture by installing a waterproof device on the RFID-based book return apparatus.
Abstract:
A heat dissipating device is used in an electronic apparatus. The electronic apparatus includes a standby unit and a power supply. The heat dissipating device includes a delay unit connected to the standby unit, a switch connected to the delay unit and the power supply, and a heat sink connected to the switch. The delay unit turns on the switch when the electronic apparatus operates in a working mode, and the delay unit turns off the switch after a predetermined delay time when the electronic apparatus enters a standby mode.