Address line wiring structure and printed wiring board having same
    11.
    发明授权
    Address line wiring structure and printed wiring board having same 有权
    地址线路布线结构和具有该布线结构的印刷布线板

    公开(公告)号:US08134239B2

    公开(公告)日:2012-03-13

    申请号:US12239900

    申请日:2008-09-29

    IPC分类号: H01L23/48 H01L23/52 H01L29/40

    摘要: An address signal line having a stub structure connects between at least three memory elements and a data transferring element and transmits address signals for the memory elements. An address terminal of the data transferring element has an impedance lower than a characteristic impedance of the address signal line. A wiring length TL0 from the data transferring element to a first branch point S1 where a branch line is branched at a shortest distance from the data transferring element is configured to become equal to or greater than a wiring length TL1 from the first branch point S1 to a second branch point S2 where a second branch line is branched. A wiring length TL3 from the second branch point S2 to a third branch point S3 where a third branch line is branched is configured to become greater than the wiring lengths TL0 and TL1.

    摘要翻译: 具有短截线结构的地址信号线连接在至少三个存储器元件和数据传输元件之间,并传送存储器元件的地址信号。 数据传送元件的地址端子的阻抗低于地址信号线的特性阻抗。 从数据传送元件到分支线从数据传送元件到最短距离分支的第一分支点S1的布线长度TL0被配置成等于或大于从第一分支点S1到布线长度TL1 第二分支点S2,其中第二支线被分支。 从第二分支点S2到分支第三分支线的第三分支点S3的布线长度TL3被配置为变得大于布线长度TL0和TL1。

    Memory module, method for using same and memory system
    12.
    发明授权
    Memory module, method for using same and memory system 有权
    内存模块,使用方法和内存系统

    公开(公告)号:US08064236B2

    公开(公告)日:2011-11-22

    申请号:US12477501

    申请日:2009-06-03

    IPC分类号: G11C5/02

    摘要: In a multi-rank memory module having a terminal resistance of a data input/output pad 13 and a terminal resistance control pad 14 that inputs a signal that controls on/off of the terminal resistance, a high-speed operation is enabled with the aid of an enclosed terminal resistance, even in cases where the number of ranks is greater than that of terminal resistance control terminals (ODT terminals) provided on the memory module. To this end, a terminal resistance control pad 14 of a memory chip 12, having a longer length of an interconnect between a data bus 19 on a module substrate 8 and a data input/output pad 13, is connected to a terminal resistance control interconnect 18 or 21 to control the on/off of the terminal resistance from the ODT terminal. A terminal resistance control pad on a memory chip 11, having a shorter length of an interconnect between the data bus 19 on the module substrate and the data input/output pad 13, is connected to a fixed potential 20 to turn on the terminal resistance.

    摘要翻译: 在具有数据输入/输出焊盘13的终端电阻的多级存储器模块和输入控制端子电阻的接通/断开的信号的端子电阻控制焊盘14的情况下,可以借助于高速操作 即使在排列数大于设置在存储器模块上的端子电阻控制端子(ODT端子)的数量的情况下,也可以是封闭的端子电阻。 为此,在模块基板8上的数据总线19与数据输入/输出焊盘13之间具有较长互连长度的存储芯片12的端子电阻控制焊盘14连接到终端电阻控制互连 18或21以控制来自ODT端子的端子电阻的开/关。 在模块基板上的数据总线19与数据输入/输出焊盘13之间的互连的较短长度的存储芯片11上的端子电阻控制焊盘连接到固定电位20以接通端子电阻。

    Semiconductor integrated circuit device and process for fabricating the
same
    18.
    发明授权
    Semiconductor integrated circuit device and process for fabricating the same 失效
    半导体集成电路器件及其制造方法

    公开(公告)号:US5652457A

    公开(公告)日:1997-07-29

    申请号:US351173

    申请日:1994-11-30

    IPC分类号: H01L27/11 H01L29/76

    摘要: Herein disclosed is a semiconductor integrated circuit device comprising a SRAM having its memory cell composed of transfer MISFETs to be controlled through word lines and drive MISFETs. The gate electrodes of the drive MISFETs and the gate electrodes of the transfer MISFETs of the memory cell, and the word lines are individually formed of different conductive layers. The drive MISFETs and the transfer MISFETs are individually arranged to cross each other in the gate length direction. The word lines are extended in the gate length direction of the gate electrodes of the drive MISFETs and caused to cross the gate electrodes of the drive MISFETs partially.The two transfer MISFETs of the memory cell have their individual gate electrodes connected with two respective word lines spaced from each other and extended in an identical direction. The region defined by the two word lines is arranged therein with the two drive MISFETs and the source lines.The source line is formed of a conductive layer identical to that of the word line. The individual data lines of the complementary data line are formed of an identical conductive layer which is different from that of the word line and the source line. The identical conductive layer between the word line and source line and the complementary data line is formed with two word lines: a main word line extended in the first direction identical to that of the word line and source line and used by adopting the divided word line system: and a sub-word line used by adopting the double word line system.

    摘要翻译: 这里公开了一种半导体集成电路器件,其包括具有其存储单元的SRAM,SRAM由通过字线控制的转移MISFET和驱动MISFET构成。 驱动MISFET的栅电极和存储单元的转移MISFET的栅电极和字线分别由不同的导电层形成。 驱动MISFET和转移MISFET分别布置成在栅极长度方向上彼此交叉。 字线在驱动MISFET的栅电极的栅极长度方向上延伸,并且部分地与驱动MISFET的栅电极交叉。 存储器单元的两个转移MISFET的各自的栅极电极与彼此间隔开并沿相同方向延伸的两个相应字线连接。 由两个字线限定的区域配置有两个驱动MISFET和源极线。 源极线由与字线的导电层相同的导电层形成。 互补数据线的各个数据线由与字线和源极线不同的导电层形成。 字线和源极线与互补数据线之间的相同的导电层由两条字线形成:主字线在第一方向上延伸,与字线和源极线相同,并通过采用分割字线 系统:采用双字线系统使用的子字线。